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SNJ54BCT价格
参考价格：￥188.4263
型号：SNJ54BCT2244J 品牌：TEXAS INSTRUMENTS 备注：这里有SNJ54BCT多少钱，2025年最近7天走势，今日出价，今日竞价，SNJ54BCT批发/采购报价，SNJ54BCT行情走势销售排行榜，SNJ54BCT报价。| 型号 | 功能描述 | 生产厂家&企业 | LOGO | 操作 |
|---|---|---|---|---|
OCTAL BUFFERS AND LINE/MOS DRIVERS WITH 3-STATE OUTPUTS OperatingVoltageRangeof4.5Vto5.5V State-of-the-ArtBiCMOSDesign SignificantlyReducesICCZ OutputPortsHaveEquivalent33-ΩSeries Resistors,SoNoExternalResistorsAre Required 3-StateOutputsDriveBusLinesorBuffer MemoryAddressRegisters description/orderinginformatio | TI2Texas Instruments 德州仪器美国德州仪器公司 |  |   | |
OCTAL BUFFERS AND LINE/MOS DRIVERS WITH 3-STATE OUTPUTS OperatingVoltageRangeof4.5Vto5.5V State-of-the-ArtBiCMOSDesign SignificantlyReducesICCZ OutputPortsHaveEquivalent33-ΩSeries Resistors,SoNoExternalResistorsAre Required 3-StateOutputsDriveBusLinesorBuffer MemoryAddressRegisters description/orderinginformatio | TI2Texas Instruments 德州仪器美国德州仪器公司 | | | |
OCTAL BUFFERS AND LINE/MOS DRIVERS WITH 3-STATE OUTPUTS OperatingVoltageRangeof4.5Vto5.5V State-of-the-ArtBiCMOSDesign SignificantlyReducesICCZ OutputPortsHaveEquivalent33-ΩSeries Resistors,SoNoExternalResistorsAre Required 3-StateOutputsDriveBusLinesorBuffer MemoryAddressRegisters description/orderinginformatio | TI2Texas Instruments 德州仪器美国德州仪器公司 | | | |
OCTAL BUFFERS AND LINE/MOS DRIVERS WITH 3-STATE OUTPUTS OperatingVoltageRangeof4.5Vto5.5V State-of-the-ArtBiCMOSDesign SignificantlyReducesICCZ OutputPortsHaveEquivalent33-ΩSeries Resistors,SoNoExternalResistorsAre Required 3-StateOutputsDriveBusLinesorBuffer MemoryAddressRegisters description/orderinginformatio | TI2Texas Instruments 德州仪器美国德州仪器公司 | | | |
OCTAL BUFFERS AND LINE/MOS DRIVERS WITH 3-STATE OUTPUTS OperatingVoltageRangeof4.5Vto5.5V State-of-the-ArtBiCMOSDesign SignificantlyReducesICCZ OutputPortsHaveEquivalent33-ΩSeries Resistors,SoNoExternalResistorsAre Required 3-StateOutputsDriveBusLinesorBuffer MemoryAddressRegisters description/orderinginformatio | TI2Texas Instruments 德州仪器美国德州仪器公司 | | | |
OCTAL TRANSPARENT D-TYPE LATCHES WITH 3-STATE OUTPUTS OperatingVoltageRangeof4.5Vto5.5V State-of-the-ArtBiCMOSDesign SignificantlyReducesICCZ FullParallelAccessforLoading 3-StateOutputsDriveBusLinesorBuffer MemoryAddressRegisters ESDProtectionExceedsJESD22 –2000-VHuman-BodyModel(A114-A) description/orderingi | TI2Texas Instruments 德州仪器美国德州仪器公司 | | | |
OCTAL TRANSPARENT D-TYPE LATCHES WITH 3-STATE OUTPUTS OperatingVoltageRangeof4.5Vto5.5V State-of-the-ArtBiCMOSDesign SignificantlyReducesICCZ FullParallelAccessforLoading 3-StateOutputsDriveBusLinesorBuffer MemoryAddressRegisters ESDProtectionExceedsJESD22 –2000-VHuman-BodyModel(A114-A) description/orderingi | TI2Texas Instruments 德州仪器美国德州仪器公司 | | | |
OCTAL TRANSPARENT D-TYPE LATCHES WITH 3-STATE OUTPUTS OperatingVoltageRangeof4.5Vto5.5V State-of-the-ArtBiCMOSDesign SignificantlyReducesICCZ FullParallelAccessforLoading 3-StateOutputsDriveBusLinesorBuffer MemoryAddressRegisters ESDProtectionExceedsJESD22 –2000-VHuman-BodyModel(A114-A) description/orderingi | TI2Texas Instruments 德州仪器美国德州仪器公司 | | | |
OCTAL TRANSPARENT D-TYPE LATCHES WITH 3-STATE OUTPUTS OperatingVoltageRangeof4.5Vto5.5V State-of-the-ArtBiCMOSDesign SignificantlyReducesICCZ FullParallelAccessforLoading 3-StateOutputsDriveBusLinesorBuffer MemoryAddressRegisters ESDProtectionExceedsJESD22 –2000-VHuman-BodyModel(A114-A) description/orderingi | TI2Texas Instruments 德州仪器美国德州仪器公司 | | | |
OCTAL TRANSPARENT D-TYPE LATCHES WITH 3-STATE OUTPUTS OperatingVoltageRangeof4.5Vto5.5V State-of-the-ArtBiCMOSDesign SignificantlyReducesICCZ FullParallelAccessforLoading 3-StateOutputsDriveBusLinesorBuffer MemoryAddressRegisters ESDProtectionExceedsJESD22 –2000-VHuman-BodyModel(A114-A) description/orderingi | TI2Texas Instruments 德州仪器美国德州仪器公司 | | | |
OCTAL BUFFERS/DRIVERS WITH 3-STATE OUTPUTS OperatingVoltageRangeof4.5Vto5.5V State-of-the-ArtBiCMOSDesign SignificantlyReducesICCZ 3-StateOutputsDriveBusLinesorBuffer MemoryAddressRegisters P-N-PInputsReduceDCLoading DataFlow-ThroughPinout(AllInputson OppositeSideFromOutputs) ESDProtectionExceedsJ | TI2Texas Instruments 德州仪器美国德州仪器公司 | | | |
OCTAL BUFFERS/DRIVERS WITH 3-STATE OUTPUTS OperatingVoltageRangeof4.5Vto5.5V State-of-the-ArtBiCMOSDesign SignificantlyReducesICCZ 3-StateOutputsDriveBusLinesorBuffer MemoryAddressRegisters P-N-PInputsReduceDCLoading DataFlow-ThroughPinout(AllInputson OppositeSideFromOutputs) ESDProtectionExceedsJ | TI2Texas Instruments 德州仪器美国德州仪器公司 | | | |
OCTAL BUFFERS/DRIVERS WITH 3-STATE OUTPUTS OperatingVoltageRangeof4.5Vto5.5V State-of-the-ArtBiCMOSDesign SignificantlyReducesICCZ 3-StateOutputsDriveBusLinesorBuffer MemoryAddressRegisters P-N-PInputsReduceDCLoading DataFlow-ThroughPinout(AllInputson OppositeSideFromOutputs) ESDProtectionExceedsJ | TI2Texas Instruments 德州仪器美国德州仪器公司 | | | |
OCTAL BUFFERS/DRIVERS WITH 3-STATE OUTPUTS OperatingVoltageRangeof4.5Vto5.5V State-of-the-ArtBiCMOSDesign SignificantlyReducesICCZ 3-StateOutputsDriveBusLinesorBuffer MemoryAddressRegisters P-N-PInputsReduceDCLoading DataFlow-ThroughPinout(AllInputson OppositeSideFromOutputs) ESDProtectionExceedsJ | TI2Texas Instruments 德州仪器美国德州仪器公司 | | | |
OCTAL BUFFERS/DRIVERS WITH 3-STATE OUTPUTS OperatingVoltageRangeof4.5Vto5.5V State-of-the-ArtBiCMOSDesign SignificantlyReducesICCZ 3-StateOutputsDriveBusLinesorBuffer MemoryAddressRegisters P-N-PInputsReduceDCLoading DataFlow-ThroughPinout(AllInputson OppositeSideFromOutputs) ESDProtectionExceedsJ | TI2Texas Instruments 德州仪器美国德州仪器公司 | | | |
OCTAL REGISTERED TRANSCEIVERS WITH 3-STATE OUTPUTS State-of-the-ArtBiCMOSDesign SignificantlyReducesICCZ 3-StateTrueOutputs Back-to-BackRegistersforStorage ESDProtectionExceeds2000V PerMIL-STD-883C,Method3015 PackageOptionsIncludePlastic Small-OutlinePackages(DW),Ceramic ChipCarriers(FK)andFlatpacks(W),and Plas | TI2Texas Instruments 德州仪器美国德州仪器公司 | | | |
OCTAL REGISTERED TRANSCEIVERS WITH 3-STATE OUTPUTS State-of-the-ArtBiCMOSDesign SignificantlyReducesICCZ 3-StateTrueOutputs Back-to-BackRegistersforStorage ESDProtectionExceeds2000V PerMIL-STD-883C,Method3015 PackageOptionsIncludePlastic Small-OutlinePackages(DW),Ceramic ChipCarriers(FK)andFlatpacks(W),and Plas | TI2Texas Instruments 德州仪器美国德州仪器公司 | | | |
OCTAL REGISTERED TRANSCEIVERS WITH 3-STATE OUTPUTS State-of-the-ArtBiCMOSDesign SignificantlyReducesICCZ 3-StateTrueOutputs Back-to-BackRegistersforStorage ESDProtectionExceeds2000V PerMIL-STD-883C,Method3015 PackageOptionsIncludePlastic Small-OutlinePackages(DW),Ceramic ChipCarriers(FK)andFlatpacks(W),and Plas | TI2Texas Instruments 德州仪器美国德州仪器公司 | | | |
OCTAL REGISTERED TRANSCEIVERS WITH 3-STATE OUTPUTS State-of-the-ArtBiCMOSDesign SignificantlyReducesICCZ 3-StateTrueOutputs Back-to-BackRegistersforStorage ESDProtectionExceeds2000V PerMIL-STD-883C,Method3015 PackageOptionsIncludePlastic Small-OutlinePackages(DW),Ceramic ChipCarriers(FK)andFlatpacks(W),and Plas | TI2Texas Instruments 德州仪器美国德州仪器公司 | | | |
OCTAL TRANSPARENT D-TYPE FLIP-FLOPS WITH 3-STATE OUTPUTS OperatingVoltageRangeof4.5Vto5.5V State-of-the-ArtBiCMOSDesign SignificantlyReducesICCZ FullParallelAccessforLoading ESDProtectionExceedsJESD22 −2000-VHuman-BodyModel(A114-A) −200-VMachineModel(A115-A) −1000-VCharged-DeviceModel(C101) description/ordering | TI2Texas Instruments 德州仪器美国德州仪器公司 | | | |
OCTAL TRANSPARENT D-TYPE FLIP-FLOPS WITH 3-STATE OUTPUTS OperatingVoltageRangeof4.5Vto5.5V State-of-the-ArtBiCMOSDesign SignificantlyReducesICCZ FullParallelAccessforLoading ESDProtectionExceedsJESD22 −2000-VHuman-BodyModel(A114-A) −200-VMachineModel(A115-A) −1000-VCharged-DeviceModel(C101) description/ordering | TI2Texas Instruments 德州仪器美国德州仪器公司 | | | |
OCTAL BUS TRANSCEIVERS WITH 3-STATE OUTPUTS State-of-the-ArtBiCMOSDesign SignificantlyReducesICCZ ESDProtectionExceeds2000V PerMIL-STD-883C,Method3015 PackageOptionsIncludePlastic Small-Outline(DW)Packages,Ceramic ChipCarriers(FK)andFlatpacks(W),and PlasticandCeramic300-milDIPs(J,N) description The′B | TI2Texas Instruments 德州仪器美国德州仪器公司 | | | |
OCTAL BUS TRANSCEIVERS WITH 3-STATE OUTPUTS State-of-the-ArtBiCMOSDesign SignificantlyReducesICCZ ESDProtectionExceeds2000V PerMIL-STD-883C,Method3015 PackageOptionsIncludePlastic Small-Outline(DW)Packages,Ceramic ChipCarriers(FK)andFlatpacks(W),and PlasticandCeramic300-milDIPs(J,N) description The′B | TI2Texas Instruments 德州仪器美国德州仪器公司 | | | |
OCTAL BUS TRANSCEIVERS AND REGISTERS WITH 3-STATE OUTPUTS State-of-the-ArtBiCMOSDesign SignificantlyReducesICCZ BusTransceivers/Registers IndependentRegistersandEnablesfor AandBBuses MultiplexedReal-TimeandStoredData ESDProtectionExceedsJESD22 −2000-VHuman-BodyModel(A114-A) −200-VMachineModel(A115-A) description/ord | TI2Texas Instruments 德州仪器美国德州仪器公司 | | | |
OCTAL BUS TRANSCEIVERS AND REGISTERS WITH 3-STATE OUTPUTS State-of-the-ArtBiCMOSDesign SignificantlyReducesICCZ BusTransceivers/Registers IndependentRegistersandEnablesfor AandBBuses MultiplexedReal-TimeandStoredData ESDProtectionExceedsJESD22 −2000-VHuman-BodyModel(A114-A) −200-VMachineModel(A115-A) description/ord | TI2Texas Instruments 德州仪器美国德州仪器公司 | | | |
OCTAL BUS TRANSCEIVERS AND REGISTERS WITH 3-STATE OUTPUTS State-of-the-ArtBiCMOSDesign SignificantlyReducesICCZ BusTransceivers/Registers IndependentRegistersandEnablesfor AandBBuses MultiplexedReal-TimeandStoredData ESDProtectionExceedsJESD22 −2000-VHuman-BodyModel(A114-A) −200-VMachineModel(A115-A) description/ord | TI2Texas Instruments 德州仪器美国德州仪器公司 | | | |
OCTAL BUS TRANSCEIVERS AND REGISTERS WITH 3-STATE OUTPUTS State-of-the-ArtBiCMOSDesign SignificantlyReducesICCZ BusTransceivers/Registers IndependentRegistersandEnablesfor AandBBuses MultiplexedReal-TimeandStoredData ESDProtectionExceedsJESD22 −2000-VHuman-BodyModel(A114-A) −200-VMachineModel(A115-A) description/ord | TI2Texas Instruments 德州仪器美国德州仪器公司 | | | |
OCTAL BUS TRANSCEIVERS AND REGISTERS WITH 3-STATE OUTPUTS State-of-the-ArtBiCMOSDesign SignificantlyReducesICCZ BusTransceivers/Registers IndependentRegistersandEnablesfor AandBBuses MultiplexedReal-TimeandStoredData ESDProtectionExceedsJESD22 −2000-VHuman-BodyModel(A114-A) −200-VMachineModel(A115-A) description/ord | TI2Texas Instruments 德州仪器美国德州仪器公司 | | | |
SCAN TEST DEVICES WITH OCTAL INVERTING BUFFERS MembersoftheTexasInstruments SCOPEEFamilyofTestabilityProducts OctalTest-IntegratedCircuits FunctionallyEquivalentto’F240and ’BCT240intheNormal-FunctionMode CompatibleWiththeIEEEStandard 1149.1-1990(JTAG)TestAccessPortand Boundary-ScanArchitecture TestOperatio | TI2Texas Instruments 德州仪器美国德州仪器公司 | | | |
SCAN TEST DEVICES WITH OCTAL INVERTING BUFFERS MembersoftheTexasInstruments SCOPEEFamilyofTestabilityProducts OctalTest-IntegratedCircuits FunctionallyEquivalentto’F240and ’BCT240intheNormal-FunctionMode CompatibleWiththeIEEEStandard 1149.1-1990(JTAG)TestAccessPortand Boundary-ScanArchitecture TestOperatio | TI2Texas Instruments 德州仪器美国德州仪器公司 | | | |
SCAN TEST DEVICES WITH OCTAL INVERTING BUFFERS MembersoftheTexasInstruments SCOPEEFamilyofTestabilityProducts OctalTest-IntegratedCircuits FunctionallyEquivalentto’F240and ’BCT240intheNormal-FunctionMode CompatibleWiththeIEEEStandard 1149.1-1990(JTAG)TestAccessPortand Boundary-ScanArchitecture TestOperatio | TI2Texas Instruments 德州仪器美国德州仪器公司 | | | |
SCAN TEST DEVICES WITH OCTAL INVERTING BUFFERS MembersoftheTexasInstruments SCOPEEFamilyofTestabilityProducts OctalTest-IntegratedCircuits FunctionallyEquivalentto’F240and ’BCT240intheNormal-FunctionMode CompatibleWiththeIEEEStandard 1149.1-1990(JTAG)TestAccessPortand Boundary-ScanArchitecture TestOperatio | TI2Texas Instruments 德州仪器美国德州仪器公司 | | | |
SCAN TEST DEVICES WITH OCTAL BUFFERS MembersoftheTexasInstruments SCOPE™FamilyofTestabilityProducts OctalTest-IntegratedCircuits FunctionallyEquivalentto’F244and ’BCT244intheNormal-FunctionMode CompatibleWiththeIEEEStandard 1149.1-1990(JTAG)TestAccessPortand Boundary-ScanArchitecture TestOperation | TI2Texas Instruments 德州仪器美国德州仪器公司 | | | |
SCAN TEST DEVICES WITH OCTAL BUFFERS MembersoftheTexasInstruments SCOPE™FamilyofTestabilityProducts OctalTest-IntegratedCircuits FunctionallyEquivalentto’F244and ’BCT244intheNormal-FunctionMode CompatibleWiththeIEEEStandard 1149.1-1990(JTAG)TestAccessPortand Boundary-ScanArchitecture TestOperation | TI2Texas Instruments 德州仪器美国德州仪器公司 | | | |
SCAN TEST DEVICES WITH OCTAL BUFFERS MembersoftheTexasInstruments SCOPE™FamilyofTestabilityProducts OctalTest-IntegratedCircuits FunctionallyEquivalentto’F244and ’BCT244intheNormal-FunctionMode CompatibleWiththeIEEEStandard 1149.1-1990(JTAG)TestAccessPortand Boundary-ScanArchitecture TestOperation | TI2Texas Instruments 德州仪器美国德州仪器公司 | | | |
SCAN TEST DEVICES WITH OCTAL BUFFERS MembersoftheTexasInstruments SCOPE™FamilyofTestabilityProducts OctalTest-IntegratedCircuits FunctionallyEquivalentto’F244and ’BCT244intheNormal-FunctionMode CompatibleWiththeIEEEStandard 1149.1-1990(JTAG)TestAccessPortand Boundary-ScanArchitecture TestOperation | TI2Texas Instruments 德州仪器美国德州仪器公司 | | | |
SCAN TEST DEVICES WITH OCTAL BUS TRANSCEIVERS MembersoftheTexasInstruments SCOPE™FamilyofTestabilityProducts OctalTest-IntegratedCircuits FunctionallyEquivalentto’F245and BCT245intheNormal-FunctionMode CompatibleWiththeIEEEStandard 1149.1-1990(JTAG)TestAccessPortand Boundary-ScanArchitecture TestOperatio | TI2Texas Instruments 德州仪器美国德州仪器公司 | | | |
SCAN TEST DEVICES WITH OCTAL BUS TRANSCEIVERS MembersoftheTexasInstruments SCOPE™FamilyofTestabilityProducts OctalTest-IntegratedCircuits FunctionallyEquivalentto’F245and BCT245intheNormal-FunctionMode CompatibleWiththeIEEEStandard 1149.1-1990(JTAG)TestAccessPortand Boundary-ScanArchitecture TestOperatio | TI2Texas Instruments 德州仪器美国德州仪器公司 | | | |
SCAN TEST DEVICES WITH OCTAL BUS TRANSCEIVERS MembersoftheTexasInstruments SCOPE™FamilyofTestabilityProducts OctalTest-IntegratedCircuits FunctionallyEquivalentto’F245and BCT245intheNormal-FunctionMode CompatibleWiththeIEEEStandard 1149.1-1990(JTAG)TestAccessPortand Boundary-ScanArchitecture TestOperatio | TI2Texas Instruments 德州仪器美国德州仪器公司 | | | |
SCAN TEST DEVICES WITH OCTAL BUS TRANSCEIVERS MembersoftheTexasInstruments SCOPE™FamilyofTestabilityProducts OctalTest-IntegratedCircuits FunctionallyEquivalentto’F245and BCT245intheNormal-FunctionMode CompatibleWiththeIEEEStandard 1149.1-1990(JTAG)TestAccessPortand Boundary-ScanArchitecture TestOperatio | TI2Texas Instruments 德州仪器美国德州仪器公司 | | | |
SCAN TEST DEVICES WITH OCTAL D-TYPE LATCHES MembersoftheTexasInstruments SCOPEEFamilyofTestabilityProducts OctalTest-IntegratedCircuits FunctionallyEquivalentto’F373and BCT373intheNormal-FunctionMode CompatibleWiththeIEEEStandard 1149.1-1990(JTAG)TestAccessPortand Boundary-ScanArchitecture TestOperation | TI2Texas Instruments 德州仪器美国德州仪器公司 | | | |
SCAN TEST DEVICES WITH OCTAL D-TYPE LATCHES MembersoftheTexasInstruments SCOPEEFamilyofTestabilityProducts OctalTest-IntegratedCircuits FunctionallyEquivalentto’F373and BCT373intheNormal-FunctionMode CompatibleWiththeIEEEStandard 1149.1-1990(JTAG)TestAccessPortand Boundary-ScanArchitecture TestOperation | TI2Texas Instruments 德州仪器美国德州仪器公司 | | | |
SCAN TEST DEVICES WITH OCTAL D-TYPE LATCHES MembersoftheTexasInstruments SCOPEEFamilyofTestabilityProducts OctalTest-IntegratedCircuits FunctionallyEquivalentto’F373and BCT373intheNormal-FunctionMode CompatibleWiththeIEEEStandard 1149.1-1990(JTAG)TestAccessPortand Boundary-ScanArchitecture TestOperation | TI2Texas Instruments 德州仪器美国德州仪器公司 | | | |
SCAN TEST DEVICES WITH OCTAL D-TYPE LATCHES MembersoftheTexasInstruments SCOPEEFamilyofTestabilityProducts OctalTest-IntegratedCircuits FunctionallyEquivalentto’F373and BCT373intheNormal-FunctionMode CompatibleWiththeIEEEStandard 1149.1-1990(JTAG)TestAccessPortand Boundary-ScanArchitecture TestOperation | TI2Texas Instruments 德州仪器美国德州仪器公司 | | | |
SCAN TEST DEVICES WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS MembersoftheTexasInstruments SCOPEFamilyofTestabilityProducts OctalTest-IntegratedCircuits FunctionallyEquivalentto’F374and ’BCT374intheNormal-FunctionMode CompatibleWiththeIEEEStandard 1149.1-1990(JTAG)TestAccessPortand Boundary-ScanArchitecture TestOperatio | TI2Texas Instruments 德州仪器美国德州仪器公司 | | | |
SCAN TEST DEVICES WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS MembersoftheTexasInstruments SCOPEFamilyofTestabilityProducts OctalTest-IntegratedCircuits FunctionallyEquivalentto’F374and ’BCT374intheNormal-FunctionMode CompatibleWiththeIEEEStandard 1149.1-1990(JTAG)TestAccessPortand Boundary-ScanArchitecture TestOperatio | TI2Texas Instruments 德州仪器美国德州仪器公司 | | | |
SCAN TEST DEVICES WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS MembersoftheTexasInstruments SCOPEFamilyofTestabilityProducts OctalTest-IntegratedCircuits FunctionallyEquivalentto’F374and ’BCT374intheNormal-FunctionMode CompatibleWiththeIEEEStandard 1149.1-1990(JTAG)TestAccessPortand Boundary-ScanArchitecture TestOperatio | TI2Texas Instruments 德州仪器美国德州仪器公司 | | | |
SCAN TEST DEVICES WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS MembersoftheTexasInstruments SCOPEFamilyofTestabilityProducts OctalTest-IntegratedCircuits FunctionallyEquivalentto’F374and ’BCT374intheNormal-FunctionMode CompatibleWiththeIEEEStandard 1149.1-1990(JTAG)TestAccessPortand Boundary-ScanArchitecture TestOperatio | TI2Texas Instruments 德州仪器美国德州仪器公司 | | | |
QUADRUPLE BUS BUFFER GATES WITH 3-STATE OUTPUTS 文件：491.65 Kbytes Page：14 Pages | TITexas Instruments 德州仪器美国德州仪器公司 |  | | |
QUADRUPLE BUS BUFFER GATES WITH 3-STATE OUTPUTS 文件：1.02454 Mbytes Page：18 Pages | TI1Texas Instruments 德州仪器美国德州仪器公司 |  | | |
QUADRUPLE BUS BUFFER GATES WITH 3-STATE OUTPUTS 文件：491.65 Kbytes Page：14 Pages | TITexas Instruments 德州仪器美国德州仪器公司 | | | |
QUADRUPLE BUS BUFFER GATES WITH 3-STATE OUTPUTS 文件：1.02454 Mbytes Page：18 Pages | TI1Texas Instruments 德州仪器美国德州仪器公司 | | | |
QUADRUPLE BUS BUFFER GATES WITH 3-STATE OUTPUTS 文件：491.65 Kbytes Page：14 Pages | TITexas Instruments 德州仪器美国德州仪器公司 | | | |
QUADRUPLE BUS BUFFER GATES WITH 3-STATE OUTPUTS 文件：1.02454 Mbytes Page：18 Pages | TI1Texas Instruments 德州仪器美国德州仪器公司 | | | |
QUADRUPLE BUS BUFFER GATES WITH 3-STATE OUTPUTS 文件：237.26 Kbytes Page：10 Pages | TI1Texas Instruments 德州仪器美国德州仪器公司 | | | |
QUADRUPLE BUS BUFFER GATES WITH 3-STATE OUTPUTS 文件：237.26 Kbytes Page：10 Pages | TI1Texas Instruments 德州仪器美国德州仪器公司 | | | |
QUADRUPLE BUS BUFFER GATES WITH 3-STATE OUTPUTS 文件：237.26 Kbytes Page：10 Pages | TI1Texas Instruments 德州仪器美国德州仪器公司 | | | |
OCTAL BUFFERS AND LINE/MOS DRIVERS WITH 3-STATE OUTPUTS 文件：252.3 Kbytes Page：11 Pages | TI1Texas Instruments 德州仪器美国德州仪器公司 | | | |
OCTAL BUFFERS AND LINE/MOS DRIVERS WITH 3-STATE OUTPUTS 文件：252.3 Kbytes Page：11 Pages | TI1Texas Instruments 德州仪器美国德州仪器公司 | | | |
OCTAL BUFFERS AND LINE/MOS DRIVERS WITH 3-STATE OUTPUTS 文件：252.3 Kbytes Page：11 Pages | TI1Texas Instruments 德州仪器美国德州仪器公司 | | |
SNJ54BCT产品属性
- 类型
描述
- 型号
SNJ54BCT
- 制造商
Texas Instruments
- 功能描述
Buffer/Line Driver 4-CH Non-Inverting 3-ST BiCMOS 14-Pin CDIP Tube
| IC供应商 | 芯片型号 | 品牌 | 批号 | 封装 | 库存 | 备注 | 价格 |
|---|---|---|---|---|---|---|---|
TI(德州仪器) |
24+ |
CDIP20 |
1476 |
原装现货,免费供样,技术支持,原厂对接 |
|||
TI |
三年内 |
1983 |
只做原装正品 |
||||
TI/德州仪器 |
23+ |
LCCC-20 |
9990 |
正规渠道,只有原装! |
|||
TI |
18+ |
N/A |
6000 |
主营军工偏门料,国内外都有渠道 |
|||
TI/德州仪器 |
23+ |
LCCC-20 |
9990 |
只有原装 |
|||
TI/德州仪器 |
25+ |
LCCC |
13000 |
公司只有原装 |
|||
TI |
22+ |
CLCC |
5000 |
只做原装,假一赔十 |
|||
TI/德州仪器 |
21+ |
LCCC-20 |
9990 |
只有原装 |
|||
Texas Instruments(德州仪器) |
24+ |
CDIP |
690000 |
代理渠道/支持实单/只做原装 |
|||
TI |
16+ |
LCCC |
10000 |
原装正品 |
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- SNJ54ALS38BJ
- SNJ54ALS32J
- SNJ54ALS251J
- SNJ54ALS244CJ
- SNJ54ALS163BJ
- SNJ54ALS161BJ
- SNJ54ALS157AJ
- SNJ54ALS133J
- SNJ54ALS09FK
- SNJ54ALS08J
- SNJ54ALS04BW
- SNJ54ALS02AFK
- SNJ54AHCT574J
- SNJ54AHCT573J
- SNJ54AHCT32W
- SNJ54AHCT240W
- SNJ5433
- SNF431
- SN-D24B
- SN-D12B
- SNC759
- SNC749
- SNC745
- SNC739
- SNC735
- SNC729
- SNC725
- SNC710
- SNC698
- SNC688
- SNC678
- SNC668
- SNC658
- SNC5B9
- SNC5B8
- SNC5A8
SNJ54BCT数据表相关新闻
SNJ54HC00FK
SNJ54HC00FK
2021-10-28SNJ54AHC125J
SNJ54AHC125J
2021-10-28SNJ54AHC245FK 总线收发器 Octal 总线收发器
SNJ54AHC245FK总线收发器Octal总线收发器
2020-11-27SNJ54HCT2245FK 贸泽微原装正品优势
SNJ54HCT2245FK贸泽微原装正品优势
2020-11-6SNJ54AHCT86FK，SNJ54ALS02AJ，SNJ54ALS02J，SNJ54ALS03BJ，SNJ54ALS04AJ，SNJ54ALS1005FK，SNJ54ALS1005J，SNJ54ALS1010AJ，SNJ54ALS112AJ，SNJ54ALS114AJ，SNJ54ALS11AFK，SNJ54ALS1245AFK
SNJ54AHCT86FK，SNJ54ALS02AJ，SNJ54ALS02J，SNJ54ALS03BJ，SNJ54ALS04AJ，SNJ54ALS1005FK，SNJ54ALS1005J，SNJ54ALS1010AJ，SNJ54ALS112AJ，SNJ54ALS114AJ，SNJ54ALS11AFK，SNJ54ALS1245AFK
2019-12-31SNJ54HC114J，SNJ54HC11FK，SNJ54HC11W，SNJ54HC132FK，SNJ54HC133FK，SNJ54HC138FK，SNJ54HC14FK，SNJ54HC153FK，SNJ54HC157W，SNJ54HC161W，SNJ54HC173FK，SNJ54HC174FK，SNJ54HC180J，SNJ54HC190FK
SNJ54HC114J，SNJ54HC11FK，SNJ54HC11W，SNJ54HC132FK，SNJ54HC133FK，SNJ54HC138FK，SNJ54HC14FK，SNJ54HC153FK，SNJ54HC157W，SNJ54HC161W，SNJ54HC173FK，SNJ54HC174FK，SNJ54HC180J，SNJ54HC190FK
2019-12-31
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