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SNJ54BCT价格
参考价格：￥188.4263
型号：SNJ54BCT2244J 品牌：TEXAS INSTRUMENTS 备注：这里有SNJ54BCT多少钱，2025年最近7天走势，今日出价，今日竞价，SNJ54BCT批发/采购报价，SNJ54BCT行情走势销售排行榜，SNJ54BCT报价。| 型号 | 功能描述 | 生产厂家 企业 | LOGO | 操作 |
|---|---|---|---|---|
QUADRUPLE BUS BUFFER GATES WITH 3-STATE OUTPUTS State-of-the-Art BiCMOS Design Significantly Reduces ICCZ ESD Protection Exceeds 2000 V Per MIL-STD-883C, Method 3015 3-State Outputs Drive Bus Lines or Buffer Memory Address Registers Package Options Include Plastic Small-Outline (D) Packages, Ceramic Chip Carriers (FK) and Flatpacks (W), | TI 德州仪器 |   | ||
QUADRUPLE BUS BUFFER GATES WITH 3-STATE OUTPUTS State-of-the-Art BiCMOS Design Significantly Reduces ICCZ ESD Protection Exceeds 2000 V Per MIL-STD-883C, Method 3015 3-State Outputs Drive Bus Lines or Buffer Memory Address Registers Package Options Include Plastic Small-Outline (D) Packages, Ceramic Chip Carriers (FK) and Flatpacks (W), | TI 德州仪器 | | ||
QUADRUPLE BUS BUFFER GATES WITH 3-STATE OUTPUTS State-of-the-Art BiCMOS Design Significantly Reduces ICCZ ESD Protection Exceeds 2000 V Per MIL-STD-883C, Method 3015 3-State Outputs Drive Bus Lines or Buffer Memory Address Registers Package Options Include Plastic Small-Outline (D) Packages, Ceramic Chip Carriers (FK) and Flatpacks (W), | TI 德州仪器 | | ||
QUADRUPLE BUS BUFFER GATES WITH 3-STATE OUTPUTS State-of-the-Art BiCMOS Design Significantly Reduces ICCZ ESD Protection Exceeds 2000 V Per MIL-STD-883C, Method 3015 3-State Outputs Drive Bus Lines or Buffer Memory Address Registers Package Options Include Plastic Small-Outline (D) Packages, Ceramic Chip Carriers (FK) and Flatpacks (W), | TI 德州仪器 | | ||
QUADRUPLE BUS BUFFER GATES WITH 3-STATE OUTPUTS State-of-the-Art BiCMOS Design Significantly Reduces ICCZ ESD Protection Exceeds 2000 V Per MIL-STD-883C, Method 3015 3-State Outputs Drive Bus Lines or Buffer Memory Address Registers Package Options Include Plastic Small-Outline (D) Packages, Ceramic Chip Carriers (FK) and Flatpacks (W), | TI 德州仪器 | | ||
QUADRUPLE BUS BUFFER GATES WITH 3-STATE OUTPUTS State-of-the-Art BiCMOS Design Significantly Reduces ICCZ ESD Protection Exceeds 2000 V Per MIL-STD-883C, Method 3015 3-State Outputs Drive Bus Lines or Buffer Memory Address Registers Package Options Include Plastic Small-Outline (D) Packages, Ceramic Chip Carriers (FK) and Flatpacks (W), | TI 德州仪器 | | ||
OCTAL BUFFERS AND LINE/MOS DRIVERS WITH 3-STATE OUTPUTS Operating Voltage Range of 4.5 V to 5.5 V State-of-the-Art BiCMOS Design Significantly Reduces ICCZ Output Ports Have Equivalent 33-Ω Series Resistors, So No External Resistors Are Required 3-State Outputs Drive Bus Lines or Buffer Memory Address Registers description/ordering informatio | TI 德州仪器 | | ||
OCTAL BUFFERS AND LINE/MOS DRIVERS WITH 3-STATE OUTPUTS Operating Voltage Range of 4.5 V to 5.5 V State-of-the-Art BiCMOS Design Significantly Reduces ICCZ Output Ports Have Equivalent 33-Ω Series Resistors, So No External Resistors Are Required 3-State Outputs Drive Bus Lines or Buffer Memory Address Registers description/ordering informatio | TI 德州仪器 | | ||
OCTAL BUFFERS AND LINE/MOS DRIVERS WITH 3-STATE OUTPUTS Operating Voltage Range of 4.5 V to 5.5 V State-of-the-Art BiCMOS Design Significantly Reduces ICCZ Output Ports Have Equivalent 33-Ω Series Resistors, So No External Resistors Are Required 3-State Outputs Drive Bus Lines or Buffer Memory Address Registers description/ordering informatio | TI 德州仪器 | | ||
OCTAL BUFFERS AND LINE/MOS DRIVERS WITH 3-STATE OUTPUTS Operating Voltage Range of 4.5 V to 5.5 V State-of-the-Art BiCMOS Design Significantly Reduces ICCZ Output Ports Have Equivalent 33-Ω Series Resistors, So No External Resistors Are Required 3-State Outputs Drive Bus Lines or Buffer Memory Address Registers description/ordering informatio | TI 德州仪器 | | ||
OCTAL BUFFERS AND LINE/MOS DRIVERS WITH 3-STATE OUTPUTS Operating Voltage Range of 4.5 V to 5.5 V State-of-the-Art BiCMOS Design Significantly Reduces ICCZ Output Ports Have Equivalent 33-Ω Series Resistors, So No External Resistors Are Required 3-State Outputs Drive Bus Lines or Buffer Memory Address Registers description/ordering informatio | TI 德州仪器 | | ||
OCTAL TRANSPARENT D-TYPE LATCHES WITH 3-STATE OUTPUTS Operating Voltage Range of 4.5 V to 5.5 V State-of-the-Art BiCMOS Design Significantly Reduces ICCZ Full Parallel Access for Loading 3-State Outputs Drive Bus Lines or Buffer Memory Address Registers ESD Protection Exceeds JESD 22 – 2000-V Human-Body Model (A114-A) description/ordering i | TI 德州仪器 | | ||
OCTAL TRANSPARENT D-TYPE LATCHES WITH 3-STATE OUTPUTS Operating Voltage Range of 4.5 V to 5.5 V State-of-the-Art BiCMOS Design Significantly Reduces ICCZ Full Parallel Access for Loading 3-State Outputs Drive Bus Lines or Buffer Memory Address Registers ESD Protection Exceeds JESD 22 – 2000-V Human-Body Model (A114-A) description/ordering i | TI 德州仪器 | | ||
OCTAL TRANSPARENT D-TYPE LATCHES WITH 3-STATE OUTPUTS Operating Voltage Range of 4.5 V to 5.5 V State-of-the-Art BiCMOS Design Significantly Reduces ICCZ Full Parallel Access for Loading 3-State Outputs Drive Bus Lines or Buffer Memory Address Registers ESD Protection Exceeds JESD 22 – 2000-V Human-Body Model (A114-A) description/ordering i | TI 德州仪器 | | ||
OCTAL TRANSPARENT D-TYPE LATCHES WITH 3-STATE OUTPUTS Operating Voltage Range of 4.5 V to 5.5 V State-of-the-Art BiCMOS Design Significantly Reduces ICCZ Full Parallel Access for Loading 3-State Outputs Drive Bus Lines or Buffer Memory Address Registers ESD Protection Exceeds JESD 22 – 2000-V Human-Body Model (A114-A) description/ordering i | TI 德州仪器 | | ||
OCTAL TRANSPARENT D-TYPE LATCHES WITH 3-STATE OUTPUTS Operating Voltage Range of 4.5 V to 5.5 V State-of-the-Art BiCMOS Design Significantly Reduces ICCZ Full Parallel Access for Loading 3-State Outputs Drive Bus Lines or Buffer Memory Address Registers ESD Protection Exceeds JESD 22 – 2000-V Human-Body Model (A114-A) description/ordering i | TI 德州仪器 | | ||
OCTAL BUFFERS/DRIVERS WITH 3-STATE OUTPUTS Operating Voltage Range of 4.5 V to 5.5 V State-of-the-Art BiCMOS Design Significantly Reduces ICCZ 3-State Outputs Drive Bus Lines or Buffer Memory Address Registers P-N-P Inputs Reduce DC Loading Data Flow-Through Pinout (All Inputs on Opposite Side From Outputs) ESD Protection Exceeds J | TI 德州仪器 | | ||
OCTAL BUFFERS/DRIVERS WITH 3-STATE OUTPUTS Operating Voltage Range of 4.5 V to 5.5 V State-of-the-Art BiCMOS Design Significantly Reduces ICCZ 3-State Outputs Drive Bus Lines or Buffer Memory Address Registers P-N-P Inputs Reduce DC Loading Data Flow-Through Pinout (All Inputs on Opposite Side From Outputs) ESD Protection Exceeds J | TI 德州仪器 | | ||
OCTAL BUFFERS/DRIVERS WITH 3-STATE OUTPUTS Operating Voltage Range of 4.5 V to 5.5 V State-of-the-Art BiCMOS Design Significantly Reduces ICCZ 3-State Outputs Drive Bus Lines or Buffer Memory Address Registers P-N-P Inputs Reduce DC Loading Data Flow-Through Pinout (All Inputs on Opposite Side From Outputs) ESD Protection Exceeds J | TI 德州仪器 | | ||
OCTAL BUFFERS/DRIVERS WITH 3-STATE OUTPUTS Operating Voltage Range of 4.5 V to 5.5 V State-of-the-Art BiCMOS Design Significantly Reduces ICCZ 3-State Outputs Drive Bus Lines or Buffer Memory Address Registers P-N-P Inputs Reduce DC Loading Data Flow-Through Pinout (All Inputs on Opposite Side From Outputs) ESD Protection Exceeds J | TI 德州仪器 | | ||
OCTAL BUFFERS/DRIVERS WITH 3-STATE OUTPUTS Operating Voltage Range of 4.5 V to 5.5 V State-of-the-Art BiCMOS Design Significantly Reduces ICCZ 3-State Outputs Drive Bus Lines or Buffer Memory Address Registers P-N-P Inputs Reduce DC Loading Data Flow-Through Pinout (All Inputs on Opposite Side From Outputs) ESD Protection Exceeds J | TI 德州仪器 | | ||
OCTAL REGISTERED TRANSCEIVERS WITH 3-STATE OUTPUTS State-of-the-Art BiCMOS Design Significantly Reduces ICCZ 3-State True Outputs Back-to-Back Registers for Storage ESD Protection Exceeds 2000 V Per MIL-STD-883C, Method 3015 Package Options Include Plastic Small-Outline Packages (DW), Ceramic Chip Carriers (FK) and Flatpacks (W), and Plas | TI 德州仪器 | | ||
OCTAL REGISTERED TRANSCEIVERS WITH 3-STATE OUTPUTS State-of-the-Art BiCMOS Design Significantly Reduces ICCZ 3-State True Outputs Back-to-Back Registers for Storage ESD Protection Exceeds 2000 V Per MIL-STD-883C, Method 3015 Package Options Include Plastic Small-Outline Packages (DW), Ceramic Chip Carriers (FK) and Flatpacks (W), and Plas | TI 德州仪器 | | ||
OCTAL REGISTERED TRANSCEIVERS WITH 3-STATE OUTPUTS State-of-the-Art BiCMOS Design Significantly Reduces ICCZ 3-State True Outputs Back-to-Back Registers for Storage ESD Protection Exceeds 2000 V Per MIL-STD-883C, Method 3015 Package Options Include Plastic Small-Outline Packages (DW), Ceramic Chip Carriers (FK) and Flatpacks (W), and Plas | TI 德州仪器 | | ||
OCTAL REGISTERED TRANSCEIVERS WITH 3-STATE OUTPUTS State-of-the-Art BiCMOS Design Significantly Reduces ICCZ 3-State True Outputs Back-to-Back Registers for Storage ESD Protection Exceeds 2000 V Per MIL-STD-883C, Method 3015 Package Options Include Plastic Small-Outline Packages (DW), Ceramic Chip Carriers (FK) and Flatpacks (W), and Plas | TI 德州仪器 | | ||
OCTAL TRANSPARENT D-TYPE LATCHES WITH 3-STATE OUTPUTS Operating Voltage Range of 4.5 V to 5.5 V State-of-the-Art BiCMOS Design Significantly Reduces ICCZ Full Parallel Access for Loading ESD Protection Exceeds JESD 22 − 2000-V Human-Body Model (A114-A) − 200-V Machine Model (A115-A) − 1000-V Charged-Device Model (C101) description/ordering | TI 德州仪器 | | ||
OCTAL TRANSPARENT D-TYPE LATCHES WITH 3-STATE OUTPUTS Operating Voltage Range of 4.5 V to 5.5 V State-of-the-Art BiCMOS Design Significantly Reduces ICCZ Full Parallel Access for Loading ESD Protection Exceeds JESD 22 − 2000-V Human-Body Model (A114-A) − 200-V Machine Model (A115-A) − 1000-V Charged-Device Model (C101) description/ordering | TI 德州仪器 | | ||
OCTAL TRANSPARENT D-TYPE LATCHES WITH 3-STATE OUTPUTS Operating Voltage Range of 4.5 V to 5.5 V State-of-the-Art BiCMOS Design Significantly Reduces ICCZ Full Parallel Access for Loading ESD Protection Exceeds JESD 22 − 2000-V Human-Body Model (A114-A) − 200-V Machine Model (A115-A) − 1000-V Charged-Device Model (C101) description/ordering | TI 德州仪器 | | ||
OCTAL TRANSPARENT D-TYPE FLIP-FLOPS WITH 3-STATE OUTPUTS Operating Voltage Range of 4.5 V to 5.5 V State-of-the-Art BiCMOS Design Significantly Reduces ICCZ Full Parallel Access for Loading ESD Protection Exceeds JESD 22 − 2000-V Human-Body Model (A114-A) − 200-V Machine Model (A115-A) − 1000-V Charged-Device Model (C101) description/ordering | TI 德州仪器 | | ||
OCTAL TRANSPARENT D-TYPE FLIP-FLOPS WITH 3-STATE OUTPUTS Operating Voltage Range of 4.5 V to 5.5 V State-of-the-Art BiCMOS Design Significantly Reduces ICCZ Full Parallel Access for Loading ESD Protection Exceeds JESD 22 − 2000-V Human-Body Model (A114-A) − 200-V Machine Model (A115-A) − 1000-V Charged-Device Model (C101) description/ordering | TI 德州仪器 | | ||
OCTAL TRANSPARENT D-TYPE FLIP-FLOPS WITH 3-STATE OUTPUTS Operating Voltage Range of 4.5 V to 5.5 V State-of-the-Art BiCMOS Design Significantly Reduces ICCZ Full Parallel Access for Loading ESD Protection Exceeds JESD 22 − 2000-V Human-Body Model (A114-A) − 200-V Machine Model (A115-A) − 1000-V Charged-Device Model (C101) description/ordering | TI 德州仪器 | | ||
OCTAL TRANSPARENT D-TYPE FLIP-FLOPS WITH 3-STATE OUTPUTS Operating Voltage Range of 4.5 V to 5.5 V State-of-the-Art BiCMOS Design Significantly Reduces ICCZ Full Parallel Access for Loading ESD Protection Exceeds JESD 22 − 2000-V Human-Body Model (A114-A) − 200-V Machine Model (A115-A) − 1000-V Charged-Device Model (C101) description/ordering | TI 德州仪器 | | ||
OCTAL BUS TRANSCEIVERS WITH 3-STATE OUTPUTS State-of-the-Art BiCMOS Design Significantly Reduces ICCZ ESD Protection Exceeds 2000 V Per MIL-STD-883C, Method 3015 Package Options Include Plastic Small-Outline (DW) Packages, Ceramic Chip Carriers (FK) and Flatpacks (W), and Plastic and Ceramic 300-mil DIPs (J, N) description The ′B | TI 德州仪器 | | ||
OCTAL BUS TRANSCEIVERS WITH 3-STATE OUTPUTS State-of-the-Art BiCMOS Design Significantly Reduces ICCZ ESD Protection Exceeds 2000 V Per MIL-STD-883C, Method 3015 Package Options Include Plastic Small-Outline (DW) Packages, Ceramic Chip Carriers (FK) and Flatpacks (W), and Plastic and Ceramic 300-mil DIPs (J, N) description The ′B | TI 德州仪器 | | ||
OCTAL BUS TRANSCEIVERS AND REGISTERS WITH 3-STATE OUTPUTS State-of-the-Art BiCMOS Design Significantly Reduces ICCZ Bus Transceivers/Registers Independent Registers and Enables for A and B Buses Multiplexed Real-Time and Stored Data ESD Protection Exceeds JESD 22 − 2000-V Human-Body Model (A114-A) − 200-V Machine Model (A115-A) description/ord | TI 德州仪器 | | ||
OCTAL BUS TRANSCEIVERS AND REGISTERS WITH 3-STATE OUTPUTS State-of-the-Art BiCMOS Design Significantly Reduces ICCZ Bus Transceivers/Registers Independent Registers and Enables for A and B Buses Multiplexed Real-Time and Stored Data ESD Protection Exceeds JESD 22 − 2000-V Human-Body Model (A114-A) − 200-V Machine Model (A115-A) description/ord | TI 德州仪器 | | ||
OCTAL BUS TRANSCEIVERS AND REGISTERS WITH 3-STATE OUTPUTS State-of-the-Art BiCMOS Design Significantly Reduces ICCZ Bus Transceivers/Registers Independent Registers and Enables for A and B Buses Multiplexed Real-Time and Stored Data ESD Protection Exceeds JESD 22 − 2000-V Human-Body Model (A114-A) − 200-V Machine Model (A115-A) description/ord | TI 德州仪器 | | ||
OCTAL BUS TRANSCEIVERS AND REGISTERS WITH 3-STATE OUTPUTS State-of-the-Art BiCMOS Design Significantly Reduces ICCZ Bus Transceivers/Registers Independent Registers and Enables for A and B Buses Multiplexed Real-Time and Stored Data ESD Protection Exceeds JESD 22 − 2000-V Human-Body Model (A114-A) − 200-V Machine Model (A115-A) description/ord | TI 德州仪器 | | ||
OCTAL BUS TRANSCEIVERS AND REGISTERS WITH 3-STATE OUTPUTS State-of-the-Art BiCMOS Design Significantly Reduces ICCZ Bus Transceivers/Registers Independent Registers and Enables for A and B Buses Multiplexed Real-Time and Stored Data ESD Protection Exceeds JESD 22 − 2000-V Human-Body Model (A114-A) − 200-V Machine Model (A115-A) description/ord | TI 德州仪器 | | ||
SCAN TEST DEVICES WITH OCTAL INVERTING BUFFERS Members of the Texas Instruments SCOPE E Family of Testability Products Octal Test-Integrated Circuits Functionally Equivalent to ’F240 and ’BCT240 in the Normal-Function Mode Compatible With the IEEE Standard 1149.1-1990 (JTAG) Test Access Port and Boundary-Scan Architecture Test Operatio | TI 德州仪器 | | ||
SCAN TEST DEVICES WITH OCTAL INVERTING BUFFERS Members of the Texas Instruments SCOPE E Family of Testability Products Octal Test-Integrated Circuits Functionally Equivalent to ’F240 and ’BCT240 in the Normal-Function Mode Compatible With the IEEE Standard 1149.1-1990 (JTAG) Test Access Port and Boundary-Scan Architecture Test Operatio | TI 德州仪器 | | ||
SCAN TEST DEVICES WITH OCTAL INVERTING BUFFERS Members of the Texas Instruments SCOPE E Family of Testability Products Octal Test-Integrated Circuits Functionally Equivalent to ’F240 and ’BCT240 in the Normal-Function Mode Compatible With the IEEE Standard 1149.1-1990 (JTAG) Test Access Port and Boundary-Scan Architecture Test Operatio | TI 德州仪器 | | ||
SCAN TEST DEVICES WITH OCTAL INVERTING BUFFERS Members of the Texas Instruments SCOPE E Family of Testability Products Octal Test-Integrated Circuits Functionally Equivalent to ’F240 and ’BCT240 in the Normal-Function Mode Compatible With the IEEE Standard 1149.1-1990 (JTAG) Test Access Port and Boundary-Scan Architecture Test Operatio | TI 德州仪器 | | ||
SCAN TEST DEVICES WITH OCTAL BUFFERS Members of the Texas Instruments SCOPE™ Family of Testability Products Octal Test-Integrated Circuits Functionally Equivalent to ’F244 and ’BCT244 in the Normal-Function Mode Compatible With the IEEE Standard 1149.1-1990 (JTAG) Test Access Port and Boundary-Scan Architecture Test Operation | TI 德州仪器 | | ||
SCAN TEST DEVICES WITH OCTAL BUFFERS Members of the Texas Instruments SCOPE™ Family of Testability Products Octal Test-Integrated Circuits Functionally Equivalent to ’F244 and ’BCT244 in the Normal-Function Mode Compatible With the IEEE Standard 1149.1-1990 (JTAG) Test Access Port and Boundary-Scan Architecture Test Operation | TI 德州仪器 | | ||
SCAN TEST DEVICES WITH OCTAL BUFFERS Members of the Texas Instruments SCOPE™ Family of Testability Products Octal Test-Integrated Circuits Functionally Equivalent to ’F244 and ’BCT244 in the Normal-Function Mode Compatible With the IEEE Standard 1149.1-1990 (JTAG) Test Access Port and Boundary-Scan Architecture Test Operation | TI 德州仪器 | | ||
SCAN TEST DEVICES WITH OCTAL BUFFERS Members of the Texas Instruments SCOPE™ Family of Testability Products Octal Test-Integrated Circuits Functionally Equivalent to ’F244 and ’BCT244 in the Normal-Function Mode Compatible With the IEEE Standard 1149.1-1990 (JTAG) Test Access Port and Boundary-Scan Architecture Test Operation | TI 德州仪器 | | ||
SCAN TEST DEVICES WITH OCTAL BUS TRANSCEIVERS Members of the Texas Instruments SCOPE ™ Family of Testability Products Octal Test-Integrated Circuits Functionally Equivalent to ’F245 and BCT245 in the Normal- Function Mode Compatible With the IEEE Standard 1149.1-1990 (JTAG) Test Access Port and Boundary-Scan Architecture Test Operatio | TI 德州仪器 | | ||
SCAN TEST DEVICES WITH OCTAL BUS TRANSCEIVERS Members of the Texas Instruments SCOPE ™ Family of Testability Products Octal Test-Integrated Circuits Functionally Equivalent to ’F245 and BCT245 in the Normal- Function Mode Compatible With the IEEE Standard 1149.1-1990 (JTAG) Test Access Port and Boundary-Scan Architecture Test Operatio | TI 德州仪器 | | ||
SCAN TEST DEVICES WITH OCTAL BUS TRANSCEIVERS Members of the Texas Instruments SCOPE ™ Family of Testability Products Octal Test-Integrated Circuits Functionally Equivalent to ’F245 and BCT245 in the Normal- Function Mode Compatible With the IEEE Standard 1149.1-1990 (JTAG) Test Access Port and Boundary-Scan Architecture Test Operatio | TI 德州仪器 | | ||
SCAN TEST DEVICES WITH OCTAL BUS TRANSCEIVERS Members of the Texas Instruments SCOPE ™ Family of Testability Products Octal Test-Integrated Circuits Functionally Equivalent to ’F245 and BCT245 in the Normal- Function Mode Compatible With the IEEE Standard 1149.1-1990 (JTAG) Test Access Port and Boundary-Scan Architecture Test Operatio | TI 德州仪器 | | ||
SCAN TEST DEVICES WITH OCTAL D-TYPE LATCHES Members of the Texas Instruments SCOPE E Family of Testability Products Octal Test-Integrated Circuits Functionally Equivalent to ’F373 and BCT373 in the Normal-Function Mode Compatible With the IEEE Standard 1149.1-1990 (JTAG) Test Access Port and Boundary-Scan Architecture Test Operation | TI 德州仪器 | | ||
SCAN TEST DEVICES WITH OCTAL D-TYPE LATCHES Members of the Texas Instruments SCOPE E Family of Testability Products Octal Test-Integrated Circuits Functionally Equivalent to ’F373 and BCT373 in the Normal-Function Mode Compatible With the IEEE Standard 1149.1-1990 (JTAG) Test Access Port and Boundary-Scan Architecture Test Operation | TI 德州仪器 | | ||
SCAN TEST DEVICES WITH OCTAL D-TYPE LATCHES Members of the Texas Instruments SCOPE E Family of Testability Products Octal Test-Integrated Circuits Functionally Equivalent to ’F373 and BCT373 in the Normal-Function Mode Compatible With the IEEE Standard 1149.1-1990 (JTAG) Test Access Port and Boundary-Scan Architecture Test Operation | TI 德州仪器 | | ||
SCAN TEST DEVICES WITH OCTAL D-TYPE LATCHES Members of the Texas Instruments SCOPE E Family of Testability Products Octal Test-Integrated Circuits Functionally Equivalent to ’F373 and BCT373 in the Normal-Function Mode Compatible With the IEEE Standard 1149.1-1990 (JTAG) Test Access Port and Boundary-Scan Architecture Test Operation | TI 德州仪器 | | ||
SCAN TEST DEVICES WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS Members of the Texas Instruments SCOPE Family of Testability Products Octal Test-Integrated Circuits Functionally Equivalent to ’F374 and ’BCT374 in the Normal-Function Mode Compatible With the IEEE Standard 1149.1-1990 (JTAG) Test Access Port and Boundary-Scan Architecture Test Operatio | TI 德州仪器 | | ||
SCAN TEST DEVICES WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS Members of the Texas Instruments SCOPE Family of Testability Products Octal Test-Integrated Circuits Functionally Equivalent to ’F374 and ’BCT374 in the Normal-Function Mode Compatible With the IEEE Standard 1149.1-1990 (JTAG) Test Access Port and Boundary-Scan Architecture Test Operatio | TI 德州仪器 | | ||
SCAN TEST DEVICES WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS Members of the Texas Instruments SCOPE Family of Testability Products Octal Test-Integrated Circuits Functionally Equivalent to ’F374 and ’BCT374 in the Normal-Function Mode Compatible With the IEEE Standard 1149.1-1990 (JTAG) Test Access Port and Boundary-Scan Architecture Test Operatio | TI 德州仪器 | | ||
SCAN TEST DEVICES WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS Members of the Texas Instruments SCOPE Family of Testability Products Octal Test-Integrated Circuits Functionally Equivalent to ’F374 and ’BCT374 in the Normal-Function Mode Compatible With the IEEE Standard 1149.1-1990 (JTAG) Test Access Port and Boundary-Scan Architecture Test Operatio | TI 德州仪器 | | ||
QUADRUPLE BUS BUFFER GATES WITH 3-STATE OUTPUTS 文件：491.65 Kbytes Page：14 Pages | TI 德州仪器 | |
SNJ54BCT产品属性
- 类型
描述
- 型号
SNJ54BCT
- 制造商
Texas Instruments
- 功能描述
Buffer/Line Driver 4-CH Non-Inverting 3-ST BiCMOS 14-Pin CDIP Tube
| IC供应商 | 芯片型号 | 品牌 | 批号 | 封装 | 库存 | 备注 | 价格 |
|---|---|---|---|---|---|---|---|
TI |
18+ |
N/A |
6000 |
主营军工偏门料,国内外都有渠道 |
|||
TI/德州仪器 |
QQ咨询 |
CFP14 |
824 |
全新原装 研究所指定供货商 |
|||
TI(德州仪器) |
24+ |
CDIP20 |
1476 |
原装现货,免费供样,技术支持,原厂对接 |
|||
TI/德州仪器 |
23+ |
CDIP14 |
5000 |
TI原厂原装全系列订货假一赔十 |
|||
TI |
16+ |
LCCC |
10000 |
原装正品 |
|||
TI/德州仪器 |
24+ |
LCC |
1122 |
全部原装现货优势产品 |
|||
TI/德州仪器 |
25+ |
CDIP-14 |
9980 |
只做原装 支持实单 |
|||
TI/德州仪器 |
25+ |
CDIP14 |
8880 |
原装认准芯泽盛世！ |
|||
TI |
20+ |
N/A |
3600 |
专业配单,原装正品假一罚十,代理渠道价格优 |
|||
TI/德州仪器 |
23+ |
CFP14 |
11200 |
原厂授权一级代理、全球订货优势渠道、可提供一站式BO |
SNJ54BCT芯片相关品牌
SNJ54BCT规格书下载地址
SNJ54BCT参数引脚图相关
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- SNC725
- SNC710
- SNC698
- SNC688
- SNC678
- SNC668
- SNC658
- SNC5B9
- SNC5B8
- SNC5A8
SNJ54BCT数据表相关新闻
SNJ54HC00FK
SNJ54HC00FK
2021-10-28SNJ54AHC125J
SNJ54AHC125J
2021-10-28SNJ54AHC245FK 总线收发器 Octal 总线收发器
SNJ54AHC245FK 总线收发器 Octal 总线收发器
2020-11-27SNJ54HCT2245FK 贸泽微原装正品优势
SNJ54HCT2245FK 贸泽微原装正品优势
2020-11-6SNJ54AHCT86FK，SNJ54ALS02AJ，SNJ54ALS02J，SNJ54ALS03BJ，SNJ54ALS04AJ，SNJ54ALS1005FK，SNJ54ALS1005J，SNJ54ALS1010AJ，SNJ54ALS112AJ，SNJ54ALS114AJ，SNJ54ALS11AFK，SNJ54ALS1245AFK
SNJ54AHCT86FK，SNJ54ALS02AJ，SNJ54ALS02J，SNJ54ALS03BJ，SNJ54ALS04AJ，SNJ54ALS1005FK，SNJ54ALS1005J，SNJ54ALS1010AJ，SNJ54ALS112AJ，SNJ54ALS114AJ，SNJ54ALS11AFK，SNJ54ALS1245AFK
2019-12-31SNJ54HC114J，SNJ54HC11FK，SNJ54HC11W，SNJ54HC132FK，SNJ54HC133FK，SNJ54HC138FK，SNJ54HC14FK，SNJ54HC153FK，SNJ54HC157W，SNJ54HC161W，SNJ54HC173FK，SNJ54HC174FK，SNJ54HC180J，SNJ54HC190FK
SNJ54HC114J，SNJ54HC11FK，SNJ54HC11W，SNJ54HC132FK，SNJ54HC133FK，SNJ54HC138FK，SNJ54HC14FK，SNJ54HC153FK，SNJ54HC157W，SNJ54HC161W，SNJ54HC173FK，SNJ54HC174FK，SNJ54HC180J，SNJ54HC190FK
2019-12-31
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