型号 功能描述 生产厂家&企业 LOGO 操作
SNJ54BCT8374AFK

SCAN TEST DEVICES WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS

Members of the Texas Instruments SCOPE  Family of Testability Products Octal Test-Integrated Circuits Functionally Equivalent to ’F374 and ’BCT374 in the Normal-Function Mode Compatible With the IEEE Standard 1149.1-1990 (JTAG) Test Access Port and Boundary-Scan Architecture Test Operatio

TI2

德州仪器

SNJ54BCT8374AFK

SCAN TEST DEVICES WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS

文件:644.36 Kbytes Page:28 Pages

TI

德州仪器

SNJ54BCT8374AFK

SCAN TEST DEVICES WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS

文件:474.07 Kbytes Page:26 Pages

TI

德州仪器

SCAN TEST DEVICES WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS

Members of the Texas Instruments SCOPE  Family of Testability Products Octal Test-Integrated Circuits Functionally Equivalent to ’F374 and ’BCT374 in the Normal-Function Mode Compatible With the IEEE Standard 1149.1-1990 (JTAG) Test Access Port and Boundary-Scan Architecture Test Operatio

TI2

德州仪器

SCAN TEST DEVICES WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS

文件:644.36 Kbytes Page:28 Pages

TI

德州仪器

SCAN TEST DEVICES WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS

文件:474.07 Kbytes Page:26 Pages

TI

德州仪器

SCAN TEST DEVICES WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS

文件:474.07 Kbytes Page:26 Pages

TI

德州仪器

SCAN TEST DEVICES WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS

文件:474.07 Kbytes Page:26 Pages

TI

德州仪器

更新时间:2025-8-6 18:06:00
IC供应商 芯片型号 品牌 批号 封装 库存 备注 价格
TI
18+
N/A
6000
主营军工偏门料,国内外都有渠道
TI/德州仪器
23+
CLCC20
11200
原厂授权一级代理、全球订货优势渠道、可提供一站式BO
TI
16+
CFP
10000
原装正品
TI/TEXAS
23+
原厂封装
8931
TI
23+
3200
正规渠道,只有原装!
TI
2021+
60000
原装现货,欢迎询价
TI
20+
N/A
3600
专业配单,原装正品假一罚十,代理渠道价格优
TI
23+
NA
20000
TI
23+
5000
全新原装,支持实单,非诚勿扰
TI
23+
CDIP-14
5000
原装正品,假一罚十

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