型号 功能描述 生产厂家&企业 LOGO 操作
SNJ54BCT8373AFK.A

SCAN TEST DEVICES WITH OCTAL D-TYPE LATCHES

Members of the Texas Instruments SCOPE E Family of Testability Products Octal Test-Integrated Circuits Functionally Equivalent to ’F373 and BCT373 in the Normal-Function Mode Compatible With the IEEE Standard 1149.1-1990 (JTAG) Test Access Port and Boundary-Scan Architecture Test Operation

TI2

德州仪器

SCAN TEST DEVICES WITH OCTAL D-TYPE LATCHES

Members of the Texas Instruments SCOPE E Family of Testability Products Octal Test-Integrated Circuits Functionally Equivalent to ’F373 and BCT373 in the Normal-Function Mode Compatible With the IEEE Standard 1149.1-1990 (JTAG) Test Access Port and Boundary-Scan Architecture Test Operation

TI2

德州仪器

SCAN TEST DEVICES WITH OCTAL D-TYPE LATCHES

文件:473.69 Kbytes Page:26 Pages

TI

德州仪器

SCAN TEST DEVICES WITH OCTAL D-TYPE LATCHES

文件:473.69 Kbytes Page:26 Pages

TI

德州仪器

SCAN TEST DEVICES WITH OCTAL D-TYPE LATCHES

文件:473.69 Kbytes Page:26 Pages

TI

德州仪器

SCAN TEST DEVICES WITH OCTAL D-TYPE LATCHES

文件:473.69 Kbytes Page:26 Pages

TI

德州仪器

更新时间:2025-8-6 18:06:00
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9630
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TI
22+
NA
500000
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