型号 功能描述 生产厂家 企业 LOGO 操作
SNJ54BCT8373AFK

SCAN TEST DEVICES WITH OCTAL D-TYPE LATCHES

Members of the Texas Instruments SCOPE E Family of Testability Products Octal Test-Integrated Circuits Functionally Equivalent to ’F373 and BCT373 in the Normal-Function Mode Compatible With the IEEE Standard 1149.1-1990 (JTAG) Test Access Port and Boundary-Scan Architecture Test Operation

TI

德州仪器

SNJ54BCT8373AFK

SCAN TEST DEVICES WITH OCTAL D-TYPE LATCHES

文件:473.69 Kbytes Page:26 Pages

TI

德州仪器

SCAN TEST DEVICES WITH OCTAL D-TYPE LATCHES

Members of the Texas Instruments SCOPE E Family of Testability Products Octal Test-Integrated Circuits Functionally Equivalent to ’F373 and BCT373 in the Normal-Function Mode Compatible With the IEEE Standard 1149.1-1990 (JTAG) Test Access Port and Boundary-Scan Architecture Test Operation

TI

德州仪器

SCAN TEST DEVICES WITH OCTAL D-TYPE LATCHES

Members of the Texas Instruments SCOPE E Family of Testability Products Octal Test-Integrated Circuits Functionally Equivalent to ’F373 and BCT373 in the Normal-Function Mode Compatible With the IEEE Standard 1149.1-1990 (JTAG) Test Access Port and Boundary-Scan Architecture Test Operation

TI

德州仪器

SCAN TEST DEVICES WITH OCTAL D-TYPE LATCHES

文件:473.69 Kbytes Page:26 Pages

TI

德州仪器

SCAN TEST DEVICES WITH OCTAL D-TYPE LATCHES

文件:473.69 Kbytes Page:26 Pages

TI

德州仪器

SCAN TEST DEVICES WITH OCTAL D-TYPE LATCHES

文件:473.69 Kbytes Page:26 Pages

TI

德州仪器

SNJ54BCT8373AFK产品属性

  • 类型

    描述

  • 型号

    SNJ54BCT8373AFK

  • 制造商

    Texas Instruments

更新时间:2026-3-5 17:20:00
IC供应商 芯片型号 品牌 批号 封装 库存 备注 价格
TI/德州仪器
18+
LCCC28
5000
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TI
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TI/德州仪器
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TI
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TI
2026+
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12500
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271
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TI/德州仪器
24+
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TI
25+
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26+
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8931
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TI
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3200
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