型号 功能描述 生产厂家&企业 LOGO 操作
SNJ54BCT8373AFK

SCAN TEST DEVICES WITH OCTAL D-TYPE LATCHES

Members of the Texas Instruments SCOPE E Family of Testability Products Octal Test-Integrated Circuits Functionally Equivalent to ’F373 and BCT373 in the Normal-Function Mode Compatible With the IEEE Standard 1149.1-1990 (JTAG) Test Access Port and Boundary-Scan Architecture Test Operation

TI2

德州仪器

SNJ54BCT8373AFK

SCAN TEST DEVICES WITH OCTAL D-TYPE LATCHES

文件:473.69 Kbytes Page:26 Pages

TI

德州仪器

SCAN TEST DEVICES WITH OCTAL D-TYPE LATCHES

Members of the Texas Instruments SCOPE E Family of Testability Products Octal Test-Integrated Circuits Functionally Equivalent to ’F373 and BCT373 in the Normal-Function Mode Compatible With the IEEE Standard 1149.1-1990 (JTAG) Test Access Port and Boundary-Scan Architecture Test Operation

TI2

德州仪器

SCAN TEST DEVICES WITH OCTAL D-TYPE LATCHES

文件:473.69 Kbytes Page:26 Pages

TI

德州仪器

SCAN TEST DEVICES WITH OCTAL D-TYPE LATCHES

文件:473.69 Kbytes Page:26 Pages

TI

德州仪器

SCAN TEST DEVICES WITH OCTAL D-TYPE LATCHES

文件:473.69 Kbytes Page:26 Pages

TI

德州仪器

SNJ54BCT8373AFK产品属性

  • 类型

    描述

  • 型号

    SNJ54BCT8373AFK

  • 制造商

    Texas Instruments

更新时间:2025-8-9 17:39:00
IC供应商 芯片型号 品牌 批号 封装 库存 备注 价格
TI
18+
N/A
6000
主营军工偏门料,国内外都有渠道
TI/TEXAS
23+
原厂封装
8931
LINEAR/凌特
QQ咨询
CDIP
271
全新原装 研究所指定供货商
TI
18+
CDIP24
12500
全新原装正品,本司专业配单,大单小单都配
TI
23+
NA
20000
TI/德州仪器
18+
LCCC28
5000
TI原厂原装全系列订货假一赔十
TI
23+
3200
公司只做原装,可来电咨询
TI/德州仪器
25+
LCCC
13000
公司只有原装
最新
2000
原装正品现货
TI
22+
NA
500000
万三科技,秉承原装,购芯无忧

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