型号 功能描述 生产厂家&企业 LOGO 操作
SNJ54BCT8244AJT

SCAN TEST DEVICES WITH OCTAL BUFFERS

Members of the Texas Instruments SCOPE™ Family of Testability Products Octal Test-Integrated Circuits Functionally Equivalent to ’F244 and ’BCT244 in the Normal-Function Mode Compatible With the IEEE Standard 1149.1-1990 (JTAG) Test Access Port and Boundary-Scan Architecture Test Operation

TI2

德州仪器

SNJ54BCT8244AJT

SCAN TEST DEVICES WITH OCTAL BUFFERS

文件:472.15 Kbytes Page:26 Pages

TI

德州仪器

SNJ54BCT8244AJT

SCAN TEST DEVICES WITH OCTAL BUFFERS

文件:612.97 Kbytes Page:28 Pages

TI

德州仪器

SNJ54BCT8244AJT

SCAN TEST DEVICES WITH OCTAL BUFFERS

文件:642.79 Kbytes Page:28 Pages

TI

德州仪器

SCAN TEST DEVICES WITH OCTAL BUFFERS

Members of the Texas Instruments SCOPE™ Family of Testability Products Octal Test-Integrated Circuits Functionally Equivalent to ’F244 and ’BCT244 in the Normal-Function Mode Compatible With the IEEE Standard 1149.1-1990 (JTAG) Test Access Port and Boundary-Scan Architecture Test Operation

TI2

德州仪器

SCAN TEST DEVICES WITH OCTAL BUFFERS

文件:612.97 Kbytes Page:28 Pages

TI

德州仪器

SCAN TEST DEVICES WITH OCTAL BUFFERS

文件:642.79 Kbytes Page:28 Pages

TI

德州仪器

SCAN TEST DEVICES WITH OCTAL BUFFERS

文件:472.15 Kbytes Page:26 Pages

TI

德州仪器

SCAN TEST DEVICES WITH OCTAL BUFFERS

文件:472.15 Kbytes Page:26 Pages

TI

德州仪器

SCAN TEST DEVICES WITH OCTAL BUFFERS

文件:472.15 Kbytes Page:26 Pages

TI

德州仪器

SNJ54BCT8244AJT产品属性

  • 类型

    描述

  • 型号

    SNJ54BCT8244AJT

  • 制造商

    Texas Instruments

  • 功能描述

    Scan Buffer/Line Driver 8-CH Non-Inverting 3-ST BiCMOS 24-Pin CDIP Tube

更新时间:2025-8-11 16:06:00
IC供应商 芯片型号 品牌 批号 封装 库存 备注 价格
TI/德州仪器
23+
LCC28
11200
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TEXAS
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7500
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TI/TEXAS
23+
原厂封装
8931
TI/德州仪器
25+
CDIP
13000
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TI/德州仪器
24+
DIP
66800
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最新
2000
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TI
22+
NA
500000
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TI
20+
N/A
3600
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LINEAR/凌特
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CDIP
271
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TI
24+
CDIP
9630
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