SN74BCT8374A价格

参考价格:¥38.0561

型号:SN74BCT8374ADW 品牌:TI 备注:这里有SN74BCT8374A多少钱,2026年最近7天走势,今日出价,今日竞价,SN74BCT8374A批发/采购报价,SN74BCT8374A行情走势销售排行榜,SN74BCT8374A报价。
型号 功能描述 生产厂家 企业 LOGO 操作
SN74BCT8374A

SCAN TEST DEVICES WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS

Members of the Texas Instruments SCOPE  Family of Testability Products Octal Test-Integrated Circuits Functionally Equivalent to ’F374 and ’BCT374 in the Normal-Function Mode Compatible With the IEEE Standard 1149.1-1990 (JTAG) Test Access Port and Boundary-Scan Architecture Test Operatio

TI

德州仪器

SN74BCT8374A

具有八路边沿触发式 D 型触发器的扫描测试设备

TI

德州仪器

SN74BCT8374A

SCAN TEST DEVICES WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS

文件:474.07 Kbytes Page:26 Pages

TI

德州仪器

SN74BCT8374A

SCAN TEST DEVICES WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS

文件:644.36 Kbytes Page:28 Pages

TI

德州仪器

SCAN TEST DEVICES WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS

Members of the Texas Instruments SCOPE  Family of Testability Products Octal Test-Integrated Circuits Functionally Equivalent to ’F374 and ’BCT374 in the Normal-Function Mode Compatible With the IEEE Standard 1149.1-1990 (JTAG) Test Access Port and Boundary-Scan Architecture Test Operatio

TI

德州仪器

SCAN TEST DEVICES WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS

Members of the Texas Instruments SCOPE  Family of Testability Products Octal Test-Integrated Circuits Functionally Equivalent to ’F374 and ’BCT374 in the Normal-Function Mode Compatible With the IEEE Standard 1149.1-1990 (JTAG) Test Access Port and Boundary-Scan Architecture Test Operatio

TI

德州仪器

SCAN TEST DEVICES WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS

文件:474.07 Kbytes Page:26 Pages

TI

德州仪器

SCAN TEST DEVICES WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS

文件:644.36 Kbytes Page:28 Pages

TI

德州仪器

SCAN TEST DEVICES WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS

文件:474.07 Kbytes Page:26 Pages

TI

德州仪器

SCAN TEST DEVICES WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS

文件:644.36 Kbytes Page:28 Pages

TI

德州仪器

SCAN TEST DEVICES WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS

文件:644.36 Kbytes Page:28 Pages

TI

德州仪器

SCAN TEST DEVICES WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS

文件:474.07 Kbytes Page:26 Pages

TI

德州仪器

SCAN TEST DEVICES WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS

文件:644.36 Kbytes Page:28 Pages

TI

德州仪器

封装/外壳:24-SOIC(0.295",7.50mm 宽) 包装:卷带(TR) 描述:IC SCAN TEST DEVICE W/FF 24-SOIC 集成电路(IC) 专用逻辑器件

TI

德州仪器

封装/外壳:24-SOIC(0.295",7.50mm 宽) 包装:卷带(TR) 描述:IC SCAN TEST DEVICE W/FF 24-SOIC 集成电路(IC) 专用逻辑器件

TI

德州仪器

SCAN TEST DEVICES WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS

文件:474.07 Kbytes Page:26 Pages

TI

德州仪器

SCAN TEST DEVICES WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS

文件:644.36 Kbytes Page:28 Pages

TI

德州仪器

SCAN TEST DEVICES WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS

文件:644.36 Kbytes Page:28 Pages

TI

德州仪器

SCAN TEST DEVICES WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS

文件:644.36 Kbytes Page:28 Pages

TI

德州仪器

SCAN TEST DEVICES WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS

文件:474.07 Kbytes Page:26 Pages

TI

德州仪器

SCAN TEST DEVICES WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS

文件:644.36 Kbytes Page:28 Pages

TI

德州仪器

SCAN TEST DEVICES WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS

文件:474.07 Kbytes Page:26 Pages

TI

德州仪器

SN74BCT8374A产品属性

  • 类型

    描述

  • 型号

    SN74BCT8374A

  • 功能描述

    特定功能逻辑 Device w/Octal D-Typ Edge-Trig Flip-Flop

  • RoHS

  • 制造商

    Texas Instruments

  • 系列

    SN74ABTH18502A

  • 工作电源电压

    5 V

  • 封装/箱体

    LQFP-64

  • 封装

    Tube

更新时间:2026-3-2 14:38:00
IC供应商 芯片型号 品牌 批号 封装 库存 备注 价格
Texas Instruments
25+
24-SOIC(0.295 7.50mm 宽)
9350
独立分销商 公司只做原装 诚心经营 免费试样正品保证
TI
23+
N/A
7560
原厂原装
Texas Instruments
24+25+
16500
全新原厂原装现货!受权代理!可送样可提供技术支持!
TI(德州仪器)
25+
SOP24300mil
1493
原装现货,免费供样,技术支持,原厂对接
TI
20+
24SOIC
53650
TI原装主营-可开原型号增税票
TI/德州仪器
22+
SOIC-24
20000
公司只有原装 品质保障
TI
25+
DIP
4301
全新现货
24+
3000
自己现货
SN74BCT8374ADWR
25+
1823
1823
TI
22+
24PDIP
9000
原厂渠道,现货配单

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