SN74BCT8374A价格

参考价格:¥38.0561

型号:SN74BCT8374ADW 品牌:TI 备注:这里有SN74BCT8374A多少钱,2025年最近7天走势,今日出价,今日竞价,SN74BCT8374A批发/采购报价,SN74BCT8374A行情走势销售排行榜,SN74BCT8374A报价。
型号 功能描述 生产厂家 企业 LOGO 操作
SN74BCT8374A

SCAN TEST DEVICES WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS

Members of the Texas Instruments SCOPE  Family of Testability Products Octal Test-Integrated Circuits Functionally Equivalent to ’F374 and ’BCT374 in the Normal-Function Mode Compatible With the IEEE Standard 1149.1-1990 (JTAG) Test Access Port and Boundary-Scan Architecture Test Operatio

TI

德州仪器

SN74BCT8374A

具有八路边沿触发式 D 型触发器的扫描测试设备

TI

德州仪器

SN74BCT8374A

SCAN TEST DEVICES WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS

文件:474.07 Kbytes Page:26 Pages

TI

德州仪器

SN74BCT8374A

SCAN TEST DEVICES WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS

文件:644.36 Kbytes Page:28 Pages

TI

德州仪器

SCAN TEST DEVICES WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS

Members of the Texas Instruments SCOPE  Family of Testability Products Octal Test-Integrated Circuits Functionally Equivalent to ’F374 and ’BCT374 in the Normal-Function Mode Compatible With the IEEE Standard 1149.1-1990 (JTAG) Test Access Port and Boundary-Scan Architecture Test Operatio

TI

德州仪器

SCAN TEST DEVICES WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS

Members of the Texas Instruments SCOPE  Family of Testability Products Octal Test-Integrated Circuits Functionally Equivalent to ’F374 and ’BCT374 in the Normal-Function Mode Compatible With the IEEE Standard 1149.1-1990 (JTAG) Test Access Port and Boundary-Scan Architecture Test Operatio

TI

德州仪器

SCAN TEST DEVICES WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS

文件:474.07 Kbytes Page:26 Pages

TI

德州仪器

SCAN TEST DEVICES WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS

文件:644.36 Kbytes Page:28 Pages

TI

德州仪器

SCAN TEST DEVICES WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS

文件:474.07 Kbytes Page:26 Pages

TI

德州仪器

SCAN TEST DEVICES WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS

文件:644.36 Kbytes Page:28 Pages

TI

德州仪器

SCAN TEST DEVICES WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS

文件:644.36 Kbytes Page:28 Pages

TI

德州仪器

SCAN TEST DEVICES WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS

文件:474.07 Kbytes Page:26 Pages

TI

德州仪器

SCAN TEST DEVICES WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS

文件:644.36 Kbytes Page:28 Pages

TI

德州仪器

封装/外壳:24-SOIC(0.295",7.50mm 宽) 包装:卷带(TR) 描述:IC SCAN TEST DEVICE W/FF 24-SOIC 集成电路(IC) 专用逻辑器件

TI

德州仪器

封装/外壳:24-SOIC(0.295",7.50mm 宽) 包装:卷带(TR) 描述:IC SCAN TEST DEVICE W/FF 24-SOIC 集成电路(IC) 专用逻辑器件

TI

德州仪器

SCAN TEST DEVICES WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS

文件:474.07 Kbytes Page:26 Pages

TI

德州仪器

SCAN TEST DEVICES WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS

文件:644.36 Kbytes Page:28 Pages

TI

德州仪器

SCAN TEST DEVICES WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS

文件:644.36 Kbytes Page:28 Pages

TI

德州仪器

SCAN TEST DEVICES WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS

文件:644.36 Kbytes Page:28 Pages

TI

德州仪器

SCAN TEST DEVICES WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS

文件:474.07 Kbytes Page:26 Pages

TI

德州仪器

SCAN TEST DEVICES WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS

文件:644.36 Kbytes Page:28 Pages

TI

德州仪器

SCAN TEST DEVICES WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS

文件:474.07 Kbytes Page:26 Pages

TI

德州仪器

SN74BCT8374A产品属性

  • 类型

    描述

  • 型号

    SN74BCT8374A

  • 功能描述

    特定功能逻辑 Device w/Octal D-Typ Edge-Trig Flip-Flop

  • RoHS

  • 制造商

    Texas Instruments

  • 系列

    SN74ABTH18502A

  • 工作电源电压

    5 V

  • 封装/箱体

    LQFP-64

  • 封装

    Tube

更新时间:2025-12-30 10:46:00
IC供应商 芯片型号 品牌 批号 封装 库存 备注 价格
TI(德州仪器)
2021+
SOIC-24
499
TI/德州仪器
22+
SOIC-24
20000
公司只有原装 品质保障
TI
22+
24PDIP
9000
原厂渠道,现货配单
24+
3000
自己现货
TI/德州仪器
24+
SOIC-24
9600
原装现货,优势供应,支持实单!
24+
N/A
57000
一级代理-主营优势-实惠价格-不悔选择
TI/德州仪器
23+
SOIC-24
5000
只有原装,欢迎来电咨询!
Texas Instruments
24+
24-SOIC
56200
一级代理/放心采购
TI/德州仪器
25+
SOIC-24
9980
只做原装 支持实单
TI/德州仪器
25+
SOIC-24
8880
原装认准芯泽盛世!

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