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SCAN921226价格
参考价格：￥56.5068
型号：SCAN921226HSM 品牌：TI 备注：这里有SCAN921226多少钱，2026年最近7天走势，今日出价，今日竞价，SCAN921226批发/采购报价，SCAN921226行情走势销售排行榜，SCAN921226报价。| 型号 | 功能描述 | 生产厂家 企业 | LOGO | 操作 |
|---|---|---|---|---|
SCAN921226 | SCAN921025 and SCAN921226 30-80 MHz 10 Bit Bus LVDS Serializer and Deserializer with IEEE 1149.1 (JTAG) and at-speed BIST 1FEATURES 2• IEEE 1149.1 (JTAG) Compliant and At-Speed BIST Test Mode. • Clock Recovery From PLL Lock to Random Data Patterns. • Specified Transition Every Data Transfer Cycle • Chipset (Tx + Rx) Power Consumption | TI 德州仪器 |   | |
SCAN921226 | 30-80 MHz 10 Bit Bus LVDS Serializer and Deserializer with IEEE 1149.1 (JTAG) and at-speed BIST 文件：474.73 Kbytes Page：21 Pages | NSC 国半 | | |
SCAN921226 | SCAN921025 and SCAN921226 30-80 MHz 10 Bit Bus LVDS Serializer and Deserializer with IEEE 1149.1 (JTAG) and at-speed BIST 文件：906.75 Kbytes Page：27 Pages | TI 德州仪器 | | |
丝印代码：SCAN921226HSM；SCAN921025H and SCAN921226H High Temperature 20-80 MHz 10 Bit Bus LVDS SerDes with IEEE 1149.1 (JTAG) and at-speed BIST 1FEATURES 2• High Temperature Operation to 125°C • IEEE 1149.1 (JTAG) Compliant and At-Speed BIST Test Mode • Clock Recovery from PLL Lock to Random Data Patterns • Ensured Transition Every Data Transfer Cycle • Chipset (Tx + Rx) Power Consumption | TI 德州仪器 | | ||
丝印代码：SCAN921226HSM；SCAN921025H and SCAN921226H High Temperature 20-80 MHz 10 Bit Bus LVDS SerDes with IEEE 1149.1 (JTAG) and at-speed BIST 1FEATURES 2• High Temperature Operation to 125°C • IEEE 1149.1 (JTAG) Compliant and At-Speed BIST Test Mode • Clock Recovery from PLL Lock to Random Data Patterns • Ensured Transition Every Data Transfer Cycle • Chipset (Tx + Rx) Power Consumption | TI 德州仪器 | | ||
丝印代码：SCAN921226HSM；SCAN921025H and SCAN921226H High Temperature 20-80 MHz 10 Bit Bus LVDS SerDes with IEEE 1149.1 (JTAG) and at-speed BIST 1FEATURES 2• High Temperature Operation to 125°C • IEEE 1149.1 (JTAG) Compliant and At-Speed BIST Test Mode • Clock Recovery from PLL Lock to Random Data Patterns • Ensured Transition Every Data Transfer Cycle • Chipset (Tx + Rx) Power Consumption | TI 德州仪器 | | ||
丝印代码：SCAN921226HSM；SCAN921025H and SCAN921226H High Temperature 20-80 MHz 10 Bit Bus LVDS SerDes with IEEE 1149.1 (JTAG) and at-speed BIST 1FEATURES 2• High Temperature Operation to 125°C • IEEE 1149.1 (JTAG) Compliant and At-Speed BIST Test Mode • Clock Recovery from PLL Lock to Random Data Patterns • Ensured Transition Every Data Transfer Cycle • Chipset (Tx + Rx) Power Consumption | TI 德州仪器 | | ||
丝印代码：SCAN921226HSM；SCAN921025H and SCAN921226H High Temperature 20-80 MHz 10 Bit Bus LVDS SerDes with IEEE 1149.1 (JTAG) and at-speed BIST 1FEATURES 2• High Temperature Operation to 125°C • IEEE 1149.1 (JTAG) Compliant and At-Speed BIST Test Mode • Clock Recovery from PLL Lock to Random Data Patterns • Ensured Transition Every Data Transfer Cycle • Chipset (Tx + Rx) Power Consumption | TI 德州仪器 | | ||
丝印代码：SCAN921226HSM；SCAN921025H and SCAN921226H High Temperature 20-80 MHz 10 Bit Bus LVDS SerDes with IEEE 1149.1 (JTAG) and at-speed BIST 1FEATURES 2• High Temperature Operation to 125°C • IEEE 1149.1 (JTAG) Compliant and At-Speed BIST Test Mode • Clock Recovery from PLL Lock to Random Data Patterns • Ensured Transition Every Data Transfer Cycle • Chipset (Tx + Rx) Power Consumption | TI 德州仪器 | | ||
丝印代码：SCAN921226SLC；SCAN921025 and SCAN921226 30-80 MHz 10 Bit Bus LVDS Serializer and Deserializer with IEEE 1149.1 (JTAG) and at-speed BIST 1FEATURES 2• IEEE 1149.1 (JTAG) Compliant and At-Speed BIST Test Mode. • Clock Recovery From PLL Lock to Random Data Patterns. • Specified Transition Every Data Transfer Cycle • Chipset (Tx + Rx) Power Consumption | TI 德州仪器 | | ||
丝印代码：SCAN921226SLC；SCAN921025 and SCAN921226 30-80 MHz 10 Bit Bus LVDS Serializer and Deserializer with IEEE 1149.1 (JTAG) and at-speed BIST 1FEATURES 2• IEEE 1149.1 (JTAG) Compliant and At-Speed BIST Test Mode. • Clock Recovery From PLL Lock to Random Data Patterns. • Specified Transition Every Data Transfer Cycle • Chipset (Tx + Rx) Power Consumption | TI 德州仪器 | | ||
丝印代码：SCAN921226SLC；SCAN921025 and SCAN921226 30-80 MHz 10 Bit Bus LVDS Serializer and Deserializer with IEEE 1149.1 (JTAG) and at-speed BIST 1FEATURES 2• IEEE 1149.1 (JTAG) Compliant and At-Speed BIST Test Mode. • Clock Recovery From PLL Lock to Random Data Patterns. • Specified Transition Every Data Transfer Cycle • Chipset (Tx + Rx) Power Consumption | TI 德州仪器 | | ||
丝印代码：SCAN921226SLC；SCAN921025 and SCAN921226 30-80 MHz 10 Bit Bus LVDS Serializer and Deserializer with IEEE 1149.1 (JTAG) and at-speed BIST 1FEATURES 2• IEEE 1149.1 (JTAG) Compliant and At-Speed BIST Test Mode. • Clock Recovery From PLL Lock to Random Data Patterns. • Specified Transition Every Data Transfer Cycle • Chipset (Tx + Rx) Power Consumption | TI 德州仪器 | | ||
SCAN921025H and SCAN921226H High Temperature 20-80 MHz 10 Bit Bus LVDS SerDes with IEEE 1149.1 (JTAG) and at-speed BIST 1FEATURES 2• High Temperature Operation to 125°C • IEEE 1149.1 (JTAG) Compliant and At-Speed BIST Test Mode • Clock Recovery from PLL Lock to Random Data Patterns • Ensured Transition Every Data Transfer Cycle • Chipset (Tx + Rx) Power Consumption | TI 德州仪器 | | ||
High Temperature 20-80 MHz 10 Bit Bus LVDS SerDes with IEEE 1149.1 (JTAG) and at-speed BIST 文件：527.93 Kbytes Page：21 Pages | NSC 国半 | | ||
具有 IEEE 1149.1 测试访问的高温 20 至 80MHz 10 位解串器 | TI 德州仪器 | | ||
High Temperature 20-80 MHz 10 Bit Bus LVDS SerDes with IEEE 1149.1 (JTAG) and at-speed BIST 文件：527.93 Kbytes Page：21 Pages | NSC 国半 | | ||
High Temperature 20-80 MHz 10 Bit Bus LVDS SerDes with IEEE 1149.1 (JTAG) and at-speed BIST 文件：903.37 Kbytes Page：21 Pages | NSC 国半 | | ||
SCAN921025H and SCAN921226H High Temperature 20-80 MHz 10 Bit Bus LVDS SerDes with IEEE 1149.1 (JTAG) and at-speed BIST 文件：1.45073 Mbytes Page：29 Pages | TI 德州仪器 | | ||
SCAN921025H and SCAN921226H High Temperature 20-80 MHz 10 Bit Bus LVDS SerDes with IEEE 1149.1 (JTAG) and at-speed BIST 文件：1.45073 Mbytes Page：29 Pages | TI 德州仪器 | | ||
封装/外壳：49-LFBGA 功能：解串器 包装：卷带（TR）剪切带（CT）Digi-Reel® 得捷定制卷带 描述：IC SER/DESER HI TEMP 80MHZ LVDS 集成电路（IC） 串行器，解串器 | TI 德州仪器 | | ||
SCAN921025H and SCAN921226H High Temperature 20-80 MHz 10 Bit Bus LVDS SerDes with IEEE 1149.1 (JTAG) and at-speed BIST 文件：1.45073 Mbytes Page：29 Pages | TI 德州仪器 | | ||
封装/外壳：49-LFBGA 功能：解串器 包装：卷带（TR） 描述：IC SERDES LVDS 10BIT BUS 49-FBGA 集成电路（IC） 串行器，解串器 | TI 德州仪器 | | ||
30-80 MHz 10 Bit Bus LVDS Serializer and Deserializer with IEEE 1149.1 (JTAG) and at-speed BIST 文件：474.73 Kbytes Page：21 Pages | NSC 国半 | | ||
SCAN921025 and SCAN921226 30-80 MHz 10 Bit Bus LVDS Serializer and Deserializer with IEEE 1149.1 (JTAG) and at-speed BIST 文件：906.75 Kbytes Page：27 Pages | TI 德州仪器 | | ||
串行器/解串器 - Serdes 30-80 MHz 10 Bit Bus LVDS Deserializer with IEEE 1149.1 (JTAG) and at-speed BIST 49-NFBGA | TI 德州仪器 | | ||
SCAN921025 and SCAN921226 30-80 MHz 10 Bit Bus LVDS Serializer and Deserializer with IEEE 1149.1 (JTAG) and at-speed BIST 文件：906.75 Kbytes Page：27 Pages | TI 德州仪器 | |
SCAN921226产品属性
- 类型
描述
- 型号
SCAN921226
- 制造商
NSC
- 制造商全称
National Semiconductor
- 功能描述
30-80 MHz 10 Bit Bus LVDS Serializer and Deserializer with IEEE 1149.1(JTAG) and at-speed BIST
| IC供应商 | 芯片型号 | 品牌 | 批号 | 封装 | 库存 | 备注 | 价格 |
|---|---|---|---|---|---|---|---|
TI |
25+ |
BGA-49(7x7) |
21000 |
原装正品现货,原厂订货,可支持含税原型号开票。 |
|||
TI |
25+ |
49-NFBGA(7x7) |
11491 |
样件支持,可原厂排单订货! |
|||
TI |
2016+ |
BGA |
8144 |
只做原装,假一罚十,公司可开17%增值税发票! |
|||
TI/德州仪器 |
2026+ |
BGA |
54648 |
百分百原装现货 实单必成 欢迎询价 |
|||
TI |
25+23+ |
BGA |
35560 |
绝对原装正品全新进口深圳现货 |
|||
TI(德州仪器) |
20+ |
BGA-49(7x7) |
416 |
||||
NSC |
25+ |
6 |
公司优势库存 热卖中! |
||||
NS |
22+ |
BGA |
3000 |
原装正品,支持实单 |
|||
Texas Instruments |
24+25+ |
16500 |
全新原厂原装现货!受权代理!可送样可提供技术支持! |
||||
TI/德州仪器 |
23+ |
49-BGA |
3975 |
原装正品代理渠道价格优势 |
SCAN921226规格书下载地址
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DdatasheetPDF页码索引
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