SCAN921025 and SCAN921226 30-80 MHz 10 Bit Bus LVDS Serializer and Deserializer with IEEE 1149.1 (JTAG) and at-speed BIST

1FEATURES 2• IEEE 1149.1 (JTAG) Compliant and At-Speed BIST Test Mode. • Clock Recovery From PLL Lock to Random Data Patterns. • Specified Transition Every Data Transfer Cycle • Chipset (Tx + Rx) Power Consumption

30-80 MHz 10 Bit Bus LVDS Serializer and Deserializer with IEEE 1149.1 (JTAG) and at-speed BIST

文件：474.73 Kbytes Page：21 Pages

SCAN921025 and SCAN921226 30-80 MHz 10 Bit Bus LVDS Serializer and Deserializer with IEEE 1149.1 (JTAG) and at-speed BIST

文件：906.75 Kbytes Page：27 Pages

SCAN921025H and SCAN921226H High Temperature 20-80 MHz 10 Bit Bus LVDS SerDes with IEEE 1149.1 (JTAG) and at-speed BIST

1FEATURES 2• High Temperature Operation to 125°C • IEEE 1149.1 (JTAG) Compliant and At-Speed BIST Test Mode • Clock Recovery from PLL Lock to Random Data Patterns • Ensured Transition Every Data Transfer Cycle • Chipset (Tx + Rx) Power Consumption

SCAN921025H and SCAN921226H High Temperature 20-80 MHz 10 Bit Bus LVDS SerDes with IEEE 1149.1 (JTAG) and at-speed BIST

1FEATURES 2• High Temperature Operation to 125°C • IEEE 1149.1 (JTAG) Compliant and At-Speed BIST Test Mode • Clock Recovery from PLL Lock to Random Data Patterns • Ensured Transition Every Data Transfer Cycle • Chipset (Tx + Rx) Power Consumption

SCAN921025H and SCAN921226H High Temperature 20-80 MHz 10 Bit Bus LVDS SerDes with IEEE 1149.1 (JTAG) and at-speed BIST

1FEATURES 2• High Temperature Operation to 125°C • IEEE 1149.1 (JTAG) Compliant and At-Speed BIST Test Mode • Clock Recovery from PLL Lock to Random Data Patterns • Ensured Transition Every Data Transfer Cycle • Chipset (Tx + Rx) Power Consumption

SCAN921025H and SCAN921226H High Temperature 20-80 MHz 10 Bit Bus LVDS SerDes with IEEE 1149.1 (JTAG) and at-speed BIST

1FEATURES 2• High Temperature Operation to 125°C • IEEE 1149.1 (JTAG) Compliant and At-Speed BIST Test Mode • Clock Recovery from PLL Lock to Random Data Patterns • Ensured Transition Every Data Transfer Cycle • Chipset (Tx + Rx) Power Consumption

SCAN921025H and SCAN921226H High Temperature 20-80 MHz 10 Bit Bus LVDS SerDes with IEEE 1149.1 (JTAG) and at-speed BIST

1FEATURES 2• High Temperature Operation to 125°C • IEEE 1149.1 (JTAG) Compliant and At-Speed BIST Test Mode • Clock Recovery from PLL Lock to Random Data Patterns • Ensured Transition Every Data Transfer Cycle • Chipset (Tx + Rx) Power Consumption

SCAN921025H and SCAN921226H High Temperature 20-80 MHz 10 Bit Bus LVDS SerDes with IEEE 1149.1 (JTAG) and at-speed BIST

1FEATURES 2• High Temperature Operation to 125°C • IEEE 1149.1 (JTAG) Compliant and At-Speed BIST Test Mode • Clock Recovery from PLL Lock to Random Data Patterns • Ensured Transition Every Data Transfer Cycle • Chipset (Tx + Rx) Power Consumption

SCAN921025H and SCAN921226H High Temperature 20-80 MHz 10 Bit Bus LVDS SerDes with IEEE 1149.1 (JTAG) and at-speed BIST

1FEATURES 2• High Temperature Operation to 125°C • IEEE 1149.1 (JTAG) Compliant and At-Speed BIST Test Mode • Clock Recovery from PLL Lock to Random Data Patterns • Ensured Transition Every Data Transfer Cycle • Chipset (Tx + Rx) Power Consumption

SCAN921025 and SCAN921226 30-80 MHz 10 Bit Bus LVDS Serializer and Deserializer with IEEE 1149.1 (JTAG) and at-speed BIST

1FEATURES 2• IEEE 1149.1 (JTAG) Compliant and At-Speed BIST Test Mode. • Clock Recovery From PLL Lock to Random Data Patterns. • Specified Transition Every Data Transfer Cycle • Chipset (Tx + Rx) Power Consumption

SCAN921025 and SCAN921226 30-80 MHz 10 Bit Bus LVDS Serializer and Deserializer with IEEE 1149.1 (JTAG) and at-speed BIST

1FEATURES 2• IEEE 1149.1 (JTAG) Compliant and At-Speed BIST Test Mode. • Clock Recovery From PLL Lock to Random Data Patterns. • Specified Transition Every Data Transfer Cycle • Chipset (Tx + Rx) Power Consumption

SCAN921025 and SCAN921226 30-80 MHz 10 Bit Bus LVDS Serializer and Deserializer with IEEE 1149.1 (JTAG) and at-speed BIST

1FEATURES 2• IEEE 1149.1 (JTAG) Compliant and At-Speed BIST Test Mode. • Clock Recovery From PLL Lock to Random Data Patterns. • Specified Transition Every Data Transfer Cycle • Chipset (Tx + Rx) Power Consumption

SCAN921025 and SCAN921226 30-80 MHz 10 Bit Bus LVDS Serializer and Deserializer with IEEE 1149.1 (JTAG) and at-speed BIST

1FEATURES 2• IEEE 1149.1 (JTAG) Compliant and At-Speed BIST Test Mode. • Clock Recovery From PLL Lock to Random Data Patterns. • Specified Transition Every Data Transfer Cycle • Chipset (Tx + Rx) Power Consumption

High Temperature 20-80 MHz 10 Bit Bus LVDS SerDes with IEEE 1149.1 (JTAG) and at-speed BIST

文件：527.93 Kbytes Page：21 Pages

具有 IEEE 1149.1 测试访问的高温 20 至 80MHz 10 位解串器

High Temperature 20-80 MHz 10 Bit Bus LVDS SerDes with IEEE 1149.1 (JTAG) and at-speed BIST

文件：527.93 Kbytes Page：21 Pages

High Temperature 20-80 MHz 10 Bit Bus LVDS SerDes with IEEE 1149.1 (JTAG) and at-speed BIST

文件：903.37 Kbytes Page：21 Pages

SCAN921025H and SCAN921226H High Temperature 20-80 MHz 10 Bit Bus LVDS SerDes with IEEE 1149.1 (JTAG) and at-speed BIST

文件：1.45073 Mbytes Page：29 Pages

SCAN921025H and SCAN921226H High Temperature 20-80 MHz 10 Bit Bus LVDS SerDes with IEEE 1149.1 (JTAG) and at-speed BIST

文件：1.45073 Mbytes Page：29 Pages

封装/外壳：49-LFBGA 功能：解串器 包装：卷带（TR）剪切带（CT）Digi-Reel® 得捷定制卷带 描述：IC SER/DESER HI TEMP 80MHZ LVDS 集成电路（IC） 串行器，解串器

SCAN921025H and SCAN921226H High Temperature 20-80 MHz 10 Bit Bus LVDS SerDes with IEEE 1149.1 (JTAG) and at-speed BIST

文件：1.45073 Mbytes Page：29 Pages

封装/外壳：49-LFBGA 功能：解串器 包装：卷带（TR） 描述：IC SERDES LVDS 10BIT BUS 49-FBGA 集成电路（IC） 串行器，解串器

30-80 MHz 10 Bit Bus LVDS Serializer and Deserializer with IEEE 1149.1 (JTAG) and at-speed BIST

文件：474.73 Kbytes Page：21 Pages

SCAN921025 and SCAN921226 30-80 MHz 10 Bit Bus LVDS Serializer and Deserializer with IEEE 1149.1 (JTAG) and at-speed BIST

文件：906.75 Kbytes Page：27 Pages

串行器/解串器 - Serdes 30-80 MHz 10 Bit Bus LVDS Deserializer with IEEE 1149.1 (JTAG) and at-speed BIST 49-NFBGA

SCAN921025 and SCAN921226 30-80 MHz 10 Bit Bus LVDS Serializer and Deserializer with IEEE 1149.1 (JTAG) and at-speed BIST

文件：906.75 Kbytes Page：27 Pages