SCAN921025 and SCAN921226 30-80 MHz 10 Bit Bus LVDS Serializer and Deserializer with IEEE 1149.1 (JTAG) and at-speed BIST

1FEATURES 2• IEEE 1149.1 (JTAG) Compliant and At-Speed BIST Test Mode. • Clock Recovery From PLL Lock to Random Data Patterns. • Specified Transition Every Data Transfer Cycle • Chipset (Tx + Rx) Power Consumption

封装/外壳：49-LFBGA 功能：解串器 包装：卷带（TR） 描述：IC DESERIALIZER 10BIT 49FBGA 集成电路（IC） 串行器，解串器

串行器/解串器 - Serdes 30-80 MHz 10 Bit Bus LVDS Deserializer with IEEE 1149.1 (JTAG) and at-speed BIST 49-NFBGA

SCAN921025 and SCAN921226 30-80 MHz 10 Bit Bus LVDS Serializer and Deserializer with IEEE 1149.1 (JTAG) and at-speed BIST

文件：906.75 Kbytes Page：27 Pages

SCAN921025 and SCAN921226 30-80 MHz 10 Bit Bus LVDS Serializer and Deserializer with IEEE 1149.1 (JTAG) and at-speed BIST

1FEATURES 2• IEEE 1149.1 (JTAG) Compliant and At-Speed BIST Test Mode. • Clock Recovery From PLL Lock to Random Data Patterns. • Specified Transition Every Data Transfer Cycle • Chipset (Tx + Rx) Power Consumption

SCAN921025 and SCAN921226 30-80 MHz 10 Bit Bus LVDS Serializer and Deserializer with IEEE 1149.1 (JTAG) and at-speed BIST

文件：906.75 Kbytes Page：27 Pages

30-80 MHz 10 Bit Bus LVDS Serializer and Deserializer with IEEE 1149.1 (JTAG) and at-speed BIST

文件：474.73 Kbytes Page：21 Pages

SCAN921025 and SCAN921226 30-80 MHz 10 Bit Bus LVDS Serializer and Deserializer with IEEE 1149.1 (JTAG) and at-speed BIST

1FEATURES 2• IEEE 1149.1 (JTAG) Compliant and At-Speed BIST Test Mode. • Clock Recovery From PLL Lock to Random Data Patterns. • Specified Transition Every Data Transfer Cycle • Chipset (Tx + Rx) Power Consumption

High Temperature 20-80 MHz 10 Bit Bus LVDS SerDes with IEEE 1149.1 (JTAG) and at-speed BIST

文件：527.93 Kbytes Page：21 Pages

SCAN921025H and SCAN921226H High Temperature 20-80 MHz 10 Bit Bus LVDS SerDes with IEEE 1149.1 (JTAG) and at-speed BIST

文件：1.45073 Mbytes Page：29 Pages