SCAN921226H价格

参考价格:¥56.5068

型号:SCAN921226HSM 品牌:TI 备注:这里有SCAN921226H多少钱,2025年最近7天走势,今日出价,今日竞价,SCAN921226H批发/采购报价,SCAN921226H行情走势销售排行榜,SCAN921226H报价。
型号 功能描述 生产厂家 企业 LOGO 操作
SCAN921226H

SCAN921025H and SCAN921226H High Temperature 20-80 MHz 10 Bit Bus LVDS SerDes with IEEE 1149.1 (JTAG) and at-speed BIST

1FEATURES 2• High Temperature Operation to 125°C • IEEE 1149.1 (JTAG) Compliant and At-Speed BIST Test Mode • Clock Recovery from PLL Lock to Random Data Patterns • Ensured Transition Every Data Transfer Cycle • Chipset (Tx + Rx) Power Consumption

TI

德州仪器

SCAN921226H

具有 IEEE 1149.1 测试访问的高温 20 至 80MHz 10 位解串器

TI

德州仪器

SCAN921226H

High Temperature 20-80 MHz 10 Bit Bus LVDS SerDes with IEEE 1149.1 (JTAG) and at-speed BIST

文件:527.93 Kbytes Page:21 Pages

NSC

国半

SCAN921025 and SCAN921226 30-80 MHz 10 Bit Bus LVDS Serializer and Deserializer with IEEE 1149.1 (JTAG) and at-speed BIST

1FEATURES 2• IEEE 1149.1 (JTAG) Compliant and At-Speed BIST Test Mode. • Clock Recovery From PLL Lock to Random Data Patterns. • Specified Transition Every Data Transfer Cycle • Chipset (Tx + Rx) Power Consumption

TI

德州仪器

30-80 MHz 10 Bit Bus LVDS Serializer and Deserializer with IEEE 1149.1 (JTAG) and at-speed BIST

文件:474.73 Kbytes Page:21 Pages

NSC

国半

SCAN921025 and SCAN921226 30-80 MHz 10 Bit Bus LVDS Serializer and Deserializer with IEEE 1149.1 (JTAG) and at-speed BIST

文件:906.75 Kbytes Page:27 Pages

TI

德州仪器

SCAN921025H and SCAN921226H High Temperature 20-80 MHz 10 Bit Bus LVDS SerDes with IEEE 1149.1 (JTAG) and at-speed BIST

1FEATURES 2• High Temperature Operation to 125°C • IEEE 1149.1 (JTAG) Compliant and At-Speed BIST Test Mode • Clock Recovery from PLL Lock to Random Data Patterns • Ensured Transition Every Data Transfer Cycle • Chipset (Tx + Rx) Power Consumption

TI

德州仪器

SCAN921025H and SCAN921226H High Temperature 20-80 MHz 10 Bit Bus LVDS SerDes with IEEE 1149.1 (JTAG) and at-speed BIST

1FEATURES 2• High Temperature Operation to 125°C • IEEE 1149.1 (JTAG) Compliant and At-Speed BIST Test Mode • Clock Recovery from PLL Lock to Random Data Patterns • Ensured Transition Every Data Transfer Cycle • Chipset (Tx + Rx) Power Consumption

TI

德州仪器

SCAN921025H and SCAN921226H High Temperature 20-80 MHz 10 Bit Bus LVDS SerDes with IEEE 1149.1 (JTAG) and at-speed BIST

1FEATURES 2• High Temperature Operation to 125°C • IEEE 1149.1 (JTAG) Compliant and At-Speed BIST Test Mode • Clock Recovery from PLL Lock to Random Data Patterns • Ensured Transition Every Data Transfer Cycle • Chipset (Tx + Rx) Power Consumption

TI

德州仪器

SCAN921025H and SCAN921226H High Temperature 20-80 MHz 10 Bit Bus LVDS SerDes with IEEE 1149.1 (JTAG) and at-speed BIST

1FEATURES 2• High Temperature Operation to 125°C • IEEE 1149.1 (JTAG) Compliant and At-Speed BIST Test Mode • Clock Recovery from PLL Lock to Random Data Patterns • Ensured Transition Every Data Transfer Cycle • Chipset (Tx + Rx) Power Consumption

TI

德州仪器

SCAN921025H and SCAN921226H High Temperature 20-80 MHz 10 Bit Bus LVDS SerDes with IEEE 1149.1 (JTAG) and at-speed BIST

1FEATURES 2• High Temperature Operation to 125°C • IEEE 1149.1 (JTAG) Compliant and At-Speed BIST Test Mode • Clock Recovery from PLL Lock to Random Data Patterns • Ensured Transition Every Data Transfer Cycle • Chipset (Tx + Rx) Power Consumption

TI

德州仪器

SCAN921025H and SCAN921226H High Temperature 20-80 MHz 10 Bit Bus LVDS SerDes with IEEE 1149.1 (JTAG) and at-speed BIST

1FEATURES 2• High Temperature Operation to 125°C • IEEE 1149.1 (JTAG) Compliant and At-Speed BIST Test Mode • Clock Recovery from PLL Lock to Random Data Patterns • Ensured Transition Every Data Transfer Cycle • Chipset (Tx + Rx) Power Consumption

TI

德州仪器

High Temperature 20-80 MHz 10 Bit Bus LVDS SerDes with IEEE 1149.1 (JTAG) and at-speed BIST

文件:527.93 Kbytes Page:21 Pages

NSC

国半

High Temperature 20-80 MHz 10 Bit Bus LVDS SerDes with IEEE 1149.1 (JTAG) and at-speed BIST

文件:903.37 Kbytes Page:21 Pages

NSC

国半

SCAN921025H and SCAN921226H High Temperature 20-80 MHz 10 Bit Bus LVDS SerDes with IEEE 1149.1 (JTAG) and at-speed BIST

文件:1.45073 Mbytes Page:29 Pages

TI

德州仪器

SCAN921025H and SCAN921226H High Temperature 20-80 MHz 10 Bit Bus LVDS SerDes with IEEE 1149.1 (JTAG) and at-speed BIST

文件:1.45073 Mbytes Page:29 Pages

TI

德州仪器

封装/外壳:49-LFBGA 功能:解串器 包装:卷带(TR)剪切带(CT)Digi-Reel® 得捷定制卷带 描述:IC SER/DESER HI TEMP 80MHZ LVDS 集成电路(IC) 串行器,解串器

TI

德州仪器

SCAN921025H and SCAN921226H High Temperature 20-80 MHz 10 Bit Bus LVDS SerDes with IEEE 1149.1 (JTAG) and at-speed BIST

文件:1.45073 Mbytes Page:29 Pages

TI

德州仪器

封装/外壳:49-LFBGA 功能:解串器 包装:卷带(TR) 描述:IC SERDES LVDS 10BIT BUS 49-FBGA 集成电路(IC) 串行器,解串器

TI

德州仪器

SCAN921226H产品属性

  • 类型

    描述

  • 型号

    SCAN921226H

  • 制造商

    NSC

  • 制造商全称

    National Semiconductor

  • 功能描述

    High Temperature 20-80 MHz 10 Bit Bus LVDS SerDes with IEEE 1149.1(JTAG) and at-speed BIST

更新时间:2025-12-29 19:26:00
IC供应商 芯片型号 品牌 批号 封装 库存 备注 价格
TEXASINST
20+
BGA
32970
原装优势主营型号-可开原型号增税票
TI
22+
49BGA
9000
原厂渠道,现货配单
TI(德州仪器)
20+
BGA-49(7x7)
416
TI
2018+
26976
代理原装现货/特价热卖!
TI/德州仪器
24+
NA/
15
优势代理渠道,原装正品,可全系列订货开增值税票
NSC
23+
NA
283
专做原装正品,假一罚百!
TI
25+23+
BGA
35560
绝对原装正品全新进口深圳现货
SST
原厂封装
9800
原装进口公司现货假一赔百
TI/德州仪器
23+
49-BGA
3975
原装正品代理渠道价格优势
TexasInstruments
18+
ICSER/DESERHITEMP80MHZLV
6800
公司原装现货/欢迎来电咨询!

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