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SN74ABT8245DW价格
参考价格：￥27.5779
型号：SN74ABT8245DW 品牌：TI 备注：这里有SN74ABT8245DW多少钱，2025年最近7天走势，今日出价，今日竞价，SN74ABT8245DW批发/采购报价，SN74ABT8245DW行情走势销售排行榜，SN74ABT8245DW报价。| 型号 | 功能描述 | 生产厂家 企业 | LOGO | 操作 |
|---|---|---|---|---|
SN74ABT8245DW | SCAN TEST DEVICES WITH OCTAL BUS TRANSCEIVERS Members of the Texas Instruments SCOPE E Family of Testability Products Compatible With the IEEE Standard 1149.1-1990 (JTAG) Test Access Port and Boundary-Scan Architecture Functionally Equivalent to ’F245 and ’ABT245 in the Normal-Function Mode SCOPE E Instruction Set: – IEEE Standard 114 | TI 德州仪器 |   | |
SN74ABT8245DW | 封装/外壳：24-SOIC（0.295"，7.50mm 宽） 包装：卷带（TR）剪切带（CT）Digi-Reel® 得捷定制卷带 描述：IC SCAN TEST DEV/TXRX 24-SOIC 集成电路（IC） 专用逻辑器件 | TI 德州仪器 | | |
SN74ABT8245DW | SCAN TEST DEVICES WITH OCTAL BUS TRANSCEIVERS 文件：483.36 Kbytes Page：28 Pages | TI 德州仪器 | | |
SN74ABT8245DW | SCAN TEST DEVICES WITH OCTAL BUS TRANSCEIVERS 文件：635.5 Kbytes Page：30 Pages | TI 德州仪器 | | |
SN74ABT8245DW | SCAN TEST DEVICES WITH OCTAL BUS TRANSCEIVERS 文件：364.54 Kbytes Page：25 Pages | TI 德州仪器 | | |
SCAN TEST DEVICES WITH OCTAL BUS TRANSCEIVERS Members of the Texas Instruments SCOPE E Family of Testability Products Compatible With the IEEE Standard 1149.1-1990 (JTAG) Test Access Port and Boundary-Scan Architecture Functionally Equivalent to ’F245 and ’ABT245 in the Normal-Function Mode SCOPE E Instruction Set: – IEEE Standard 114 | TI 德州仪器 | | ||
SCAN TEST DEVICES WITH OCTAL BUS TRANSCEIVERS 文件：665.11 Kbytes Page：30 Pages | TI 德州仪器 | | ||
SCAN TEST DEVICES WITH OCTAL BUS TRANSCEIVERS 文件：635.5 Kbytes Page：30 Pages | TI 德州仪器 | | ||
SCAN TEST DEVICES WITH OCTAL BUS TRANSCEIVERS 文件：364.54 Kbytes Page：25 Pages | TI 德州仪器 | | ||
SCAN TEST DEVICES WITH OCTAL BUS TRANSCEIVERS 文件：483.36 Kbytes Page：28 Pages | TI 德州仪器 | | ||
SCAN TEST DEVICES WITH OCTAL BUS TRANSCEIVERS Members of the Texas Instruments SCOPE E Family of Testability Products Compatible With the IEEE Standard 1149.1-1990 (JTAG) Test Access Port and Boundary-Scan Architecture Functionally Equivalent to ’F245 and ’ABT245 in the Normal-Function Mode SCOPE E Instruction Set: – IEEE Standard 114 | TI 德州仪器 | | ||
SCAN TEST DEVICES WITH OCTAL BUS TRANSCEIVERS Members of the Texas Instruments SCOPE E Family of Testability Products Compatible With the IEEE Standard 1149.1-1990 (JTAG) Test Access Port and Boundary-Scan Architecture Functionally Equivalent to ’F245 and ’ABT245 in the Normal-Function Mode SCOPE E Instruction Set: – IEEE Standard 114 | TI 德州仪器 | | ||
SCAN TEST DEVICES WITH OCTAL BUS TRANSCEIVERS Members of the Texas Instruments SCOPE E Family of Testability Products Compatible With the IEEE Standard 1149.1-1990 (JTAG) Test Access Port and Boundary-Scan Architecture Functionally Equivalent to ’F245 and ’ABT245 in the Normal-Function Mode SCOPE E Instruction Set: – IEEE Standard 114 | TI 德州仪器 | | ||
SCAN TEST DEVICES WITH OCTAL BUS TRANSCEIVERS Members of the Texas Instruments SCOPE E Family of Testability Products Compatible With the IEEE Standard 1149.1-1990 (JTAG) Test Access Port and Boundary-Scan Architecture Functionally Equivalent to ’F245 and ’ABT245 in the Normal-Function Mode SCOPE E Instruction Set: – IEEE Standard 114 | TI 德州仪器 | | ||
SCAN TEST DEVICES WITH OCTAL BUS TRANSCEIVERS 文件：635.5 Kbytes Page：30 Pages | TI 德州仪器 | | ||
SCAN TEST DEVICES WITH OCTAL BUS TRANSCEIVERS 文件：483.36 Kbytes Page：28 Pages | TI 德州仪器 | | ||
SCAN TEST DEVICES WITH OCTAL BUS TRANSCEIVERS 文件：635.5 Kbytes Page：30 Pages | TI 德州仪器 | | ||
SCAN TEST DEVICES WITH OCTAL BUS TRANSCEIVERS 文件：635.5 Kbytes Page：30 Pages | TI 德州仪器 | | ||
SCAN TEST DEVICES WITH OCTAL BUS TRANSCEIVERS 文件：364.54 Kbytes Page：25 Pages | TI 德州仪器 | | ||
SCAN TEST DEVICES WITH OCTAL BUS TRANSCEIVERS 文件：483.36 Kbytes Page：28 Pages | TI 德州仪器 | | ||
封装/外壳：24-SOIC（0.295"，7.50mm 宽） 包装：卷带（TR）剪切带（CT）Digi-Reel® 得捷定制卷带 描述：IC SCAN TEST DEV W/OBT 24-SOIC 集成电路（IC） 专用逻辑器件 | TI 德州仪器 | | ||
SCAN TEST DEVICES WITH OCTAL BUS TRANSCEIVERS 文件：483.36 Kbytes Page：28 Pages | TI 德州仪器 | | ||
SCAN TEST DEVICES WITH OCTAL BUS TRANSCEIVERS 文件：635.5 Kbytes Page：30 Pages | TI 德州仪器 | | ||
SCAN TEST DEVICES WITH OCTAL BUS TRANSCEIVERS 文件：635.5 Kbytes Page：30 Pages | TI 德州仪器 | |
SN74ABT8245DW产品属性
- 类型
描述
- 型号
SN74ABT8245DW
- 功能描述
特定功能逻辑 Scan Test Device
- RoHS
否
- 制造商
Texas Instruments
- 系列
SN74ABTH18502A
- 工作电源电压
5 V
- 封装/箱体
LQFP-64
- 封装
Tube
| IC供应商 | 芯片型号 | 品牌 | 批号 | 封装 | 库存 | 备注 | 价格 |
|---|---|---|---|---|---|---|---|
TEXAS INSTRUMENTS |
23+ |
SOIC24 |
9600 |
全新原装正品!一手货源价格优势! |
|||
TI |
22+ |
24SOIC |
9000 |
原厂渠道,现货配单 |
|||
TexasInstruments |
18+ |
ICSCANTESTDEV/TXRX24-SOI |
6800 |
公司原装现货/欢迎来电咨询! |
|||
TI |
23+ |
N/A |
7560 |
原厂原装 |
|||
Texas Instruments |
25+ |
24-SOIC(0.295 7.50mm 宽) |
9350 |
独立分销商 公司只做原装 诚心经营 免费试样正品保证 |
|||
TI |
2526+ |
原厂封装 |
12500 |
15年芯片行业经验/只供原装正品:0755-83267371邹小姐 |
|||
TI |
25+ |
标准封装 |
18000 |
原厂直接发货进口原装 |
|||
TI(德州仪器) |
24+ |
SOP24300mil |
1493 |
原装现货,免费供样,技术支持,原厂对接 |
|||
Texas Instruments |
24+ |
24-SOIC |
56200 |
一级代理/放心采购 |
|||
24+ |
3000 |
自己现货 |
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https://hch01.114ic.com/
2020-11-13
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