SCAN921025价格

参考价格:¥34.3521

型号:SCAN921025HSM/NOPB 品牌:TI 备注:这里有SCAN921025多少钱,2025年最近7天走势,今日出价,今日竞价,SCAN921025批发/采购报价,SCAN921025行情走势销售排行榜,SCAN921025报价。
型号 功能描述 生产厂家 企业 LOGO 操作
SCAN921025

SCAN921025 and SCAN921226 30-80 MHz 10 Bit Bus LVDS Serializer and Deserializer with IEEE 1149.1 (JTAG) and at-speed BIST

1FEATURES 2• IEEE 1149.1 (JTAG) Compliant and At-Speed BIST Test Mode. • Clock Recovery From PLL Lock to Random Data Patterns. • Specified Transition Every Data Transfer Cycle • Chipset (Tx + Rx) Power Consumption

TI

德州仪器

SCAN921025

SCAN921025 and SCAN921226 30-80 MHz 10 Bit Bus LVDS Serializer and Deserializer with IEEE 1149.1 (JTAG) and at-speed BIST

文件:906.75 Kbytes Page:27 Pages

TI

德州仪器

SCAN921025

30-80 MHz 10 Bit Bus LVDS Serializer and Deserializer with IEEE 1149.1 (JTAG) and at-speed BIST

文件:474.73 Kbytes Page:21 Pages

NSC

国半

SCAN921025

30-80 MHz 10 Bit Bus LVDS Serializer and Deserializer with IEEE 1149.1 (JTAG) and at-speed BIST

TI

德州仪器

SCAN921025H and SCAN921226H High Temperature 20-80 MHz 10 Bit Bus LVDS SerDes with IEEE 1149.1 (JTAG) and at-speed BIST

1FEATURES 2• High Temperature Operation to 125°C • IEEE 1149.1 (JTAG) Compliant and At-Speed BIST Test Mode • Clock Recovery from PLL Lock to Random Data Patterns • Ensured Transition Every Data Transfer Cycle • Chipset (Tx + Rx) Power Consumption

TI

德州仪器

SCAN921025H and SCAN921226H High Temperature 20-80 MHz 10 Bit Bus LVDS SerDes with IEEE 1149.1 (JTAG) and at-speed BIST

1FEATURES 2• High Temperature Operation to 125°C • IEEE 1149.1 (JTAG) Compliant and At-Speed BIST Test Mode • Clock Recovery from PLL Lock to Random Data Patterns • Ensured Transition Every Data Transfer Cycle • Chipset (Tx + Rx) Power Consumption

TI

德州仪器

SCAN921025H and SCAN921226H High Temperature 20-80 MHz 10 Bit Bus LVDS SerDes with IEEE 1149.1 (JTAG) and at-speed BIST

1FEATURES 2• High Temperature Operation to 125°C • IEEE 1149.1 (JTAG) Compliant and At-Speed BIST Test Mode • Clock Recovery from PLL Lock to Random Data Patterns • Ensured Transition Every Data Transfer Cycle • Chipset (Tx + Rx) Power Consumption

TI

德州仪器

SCAN921025H and SCAN921226H High Temperature 20-80 MHz 10 Bit Bus LVDS SerDes with IEEE 1149.1 (JTAG) and at-speed BIST

1FEATURES 2• High Temperature Operation to 125°C • IEEE 1149.1 (JTAG) Compliant and At-Speed BIST Test Mode • Clock Recovery from PLL Lock to Random Data Patterns • Ensured Transition Every Data Transfer Cycle • Chipset (Tx + Rx) Power Consumption

TI

德州仪器

SCAN921025H and SCAN921226H High Temperature 20-80 MHz 10 Bit Bus LVDS SerDes with IEEE 1149.1 (JTAG) and at-speed BIST

1FEATURES 2• High Temperature Operation to 125°C • IEEE 1149.1 (JTAG) Compliant and At-Speed BIST Test Mode • Clock Recovery from PLL Lock to Random Data Patterns • Ensured Transition Every Data Transfer Cycle • Chipset (Tx + Rx) Power Consumption

TI

德州仪器

SCAN921025H and SCAN921226H High Temperature 20-80 MHz 10 Bit Bus LVDS SerDes with IEEE 1149.1 (JTAG) and at-speed BIST

1FEATURES 2• High Temperature Operation to 125°C • IEEE 1149.1 (JTAG) Compliant and At-Speed BIST Test Mode • Clock Recovery from PLL Lock to Random Data Patterns • Ensured Transition Every Data Transfer Cycle • Chipset (Tx + Rx) Power Consumption

TI

德州仪器

SCAN921025H and SCAN921226H High Temperature 20-80 MHz 10 Bit Bus LVDS SerDes with IEEE 1149.1 (JTAG) and at-speed BIST

1FEATURES 2• High Temperature Operation to 125°C • IEEE 1149.1 (JTAG) Compliant and At-Speed BIST Test Mode • Clock Recovery from PLL Lock to Random Data Patterns • Ensured Transition Every Data Transfer Cycle • Chipset (Tx + Rx) Power Consumption

TI

德州仪器

SCAN921025H and SCAN921226H High Temperature 20-80 MHz 10 Bit Bus LVDS SerDes with IEEE 1149.1 (JTAG) and at-speed BIST

1FEATURES 2• High Temperature Operation to 125°C • IEEE 1149.1 (JTAG) Compliant and At-Speed BIST Test Mode • Clock Recovery from PLL Lock to Random Data Patterns • Ensured Transition Every Data Transfer Cycle • Chipset (Tx + Rx) Power Consumption

TI

德州仪器

SCAN921025H and SCAN921226H High Temperature 20-80 MHz 10 Bit Bus LVDS SerDes with IEEE 1149.1 (JTAG) and at-speed BIST

1FEATURES 2• High Temperature Operation to 125°C • IEEE 1149.1 (JTAG) Compliant and At-Speed BIST Test Mode • Clock Recovery from PLL Lock to Random Data Patterns • Ensured Transition Every Data Transfer Cycle • Chipset (Tx + Rx) Power Consumption

TI

德州仪器

SCAN921025H and SCAN921226H High Temperature 20-80 MHz 10 Bit Bus LVDS SerDes with IEEE 1149.1 (JTAG) and at-speed BIST

1FEATURES 2• High Temperature Operation to 125°C • IEEE 1149.1 (JTAG) Compliant and At-Speed BIST Test Mode • Clock Recovery from PLL Lock to Random Data Patterns • Ensured Transition Every Data Transfer Cycle • Chipset (Tx + Rx) Power Consumption

TI

德州仪器

SCAN921025H and SCAN921226H High Temperature 20-80 MHz 10 Bit Bus LVDS SerDes with IEEE 1149.1 (JTAG) and at-speed BIST

1FEATURES 2• High Temperature Operation to 125°C • IEEE 1149.1 (JTAG) Compliant and At-Speed BIST Test Mode • Clock Recovery from PLL Lock to Random Data Patterns • Ensured Transition Every Data Transfer Cycle • Chipset (Tx + Rx) Power Consumption

TI

德州仪器

SCAN921025 and SCAN921226 30-80 MHz 10 Bit Bus LVDS Serializer and Deserializer with IEEE 1149.1 (JTAG) and at-speed BIST

1FEATURES 2• IEEE 1149.1 (JTAG) Compliant and At-Speed BIST Test Mode. • Clock Recovery From PLL Lock to Random Data Patterns. • Specified Transition Every Data Transfer Cycle • Chipset (Tx + Rx) Power Consumption

TI

德州仪器

SCAN921025 and SCAN921226 30-80 MHz 10 Bit Bus LVDS Serializer and Deserializer with IEEE 1149.1 (JTAG) and at-speed BIST

1FEATURES 2• IEEE 1149.1 (JTAG) Compliant and At-Speed BIST Test Mode. • Clock Recovery From PLL Lock to Random Data Patterns. • Specified Transition Every Data Transfer Cycle • Chipset (Tx + Rx) Power Consumption

TI

德州仪器

SCAN921025 and SCAN921226 30-80 MHz 10 Bit Bus LVDS Serializer and Deserializer with IEEE 1149.1 (JTAG) and at-speed BIST

1FEATURES 2• IEEE 1149.1 (JTAG) Compliant and At-Speed BIST Test Mode. • Clock Recovery From PLL Lock to Random Data Patterns. • Specified Transition Every Data Transfer Cycle • Chipset (Tx + Rx) Power Consumption

TI

德州仪器

SCAN921025 and SCAN921226 30-80 MHz 10 Bit Bus LVDS Serializer and Deserializer with IEEE 1149.1 (JTAG) and at-speed BIST

1FEATURES 2• IEEE 1149.1 (JTAG) Compliant and At-Speed BIST Test Mode. • Clock Recovery From PLL Lock to Random Data Patterns. • Specified Transition Every Data Transfer Cycle • Chipset (Tx + Rx) Power Consumption

TI

德州仪器

SCAN921025 and SCAN921226 30-80 MHz 10 Bit Bus LVDS Serializer and Deserializer with IEEE 1149.1 (JTAG) and at-speed BIST

文件:906.75 Kbytes Page:27 Pages

TI

德州仪器

具有 IEEE 1149.1 测试访问的高温 20 至 80MHz 10 位串行器

TI

德州仪器

High Temperature 20-80 MHz 10 Bit Bus LVDS SerDes with IEEE 1149.1 (JTAG) and at-speed BIST

文件:903.37 Kbytes Page:21 Pages

NSC

国半

High Temperature 20-80 MHz 10 Bit Bus LVDS SerDes with IEEE 1149.1 (JTAG) and at-speed BIST

文件:527.93 Kbytes Page:21 Pages

NSC

国半

High Temperature 20-80 MHz 10 Bit Bus LVDS SerDes with IEEE 1149.1 (JTAG) and at-speed BIST

文件:903.37 Kbytes Page:21 Pages

NSC

国半

SCAN921025H and SCAN921226H High Temperature 20-80 MHz 10 Bit Bus LVDS SerDes with IEEE 1149.1 (JTAG) and at-speed BIST

文件:1.45073 Mbytes Page:29 Pages

TI

德州仪器

SCAN921025H and SCAN921226H High Temperature 20-80 MHz 10 Bit Bus LVDS SerDes with IEEE 1149.1 (JTAG) and at-speed BIST

文件:1.45073 Mbytes Page:29 Pages

TI

德州仪器

High Temperature 20-80 MHz 10 Bit Bus LVDS SerDes with IEEE 1149.1 (JTAG) and at-speed BIST

文件:527.93 Kbytes Page:21 Pages

NSC

国半

封装/外壳:49-LFBGA 功能:串行器 包装:卷带(TR)剪切带(CT)Digi-Reel® 得捷定制卷带 描述:IC SER/DESER HI TEMP 80MHZ LVDS 集成电路(IC) 串行器,解串器

TI

德州仪器

SCAN921025H and SCAN921226H High Temperature 20-80 MHz 10 Bit Bus LVDS SerDes with IEEE 1149.1 (JTAG) and at-speed BIST

文件:1.45073 Mbytes Page:29 Pages

TI

德州仪器

SCAN921025H and SCAN921226H High Temperature 20-80 MHz 10 Bit Bus LVDS SerDes with IEEE 1149.1 (JTAG) and at-speed BIST

文件:1.45073 Mbytes Page:29 Pages

TI

德州仪器

封装/外壳:49-LFBGA 功能:串行器 包装:卷带(TR) 描述:IC SERDES LVDS 10BIT BUS 49-FBGA 集成电路(IC) 串行器,解串器

TI

德州仪器

SCAN921025H and SCAN921226H High Temperature 20-80 MHz 10 Bit Bus LVDS SerDes with IEEE 1149.1 (JTAG) and at-speed BIST

文件:1.45073 Mbytes Page:29 Pages

TI

德州仪器

SCAN921025H and SCAN921226H High Temperature 20-80 MHz 10 Bit Bus LVDS SerDes with IEEE 1149.1 (JTAG) and at-speed BIST

文件:1.45073 Mbytes Page:29 Pages

TI

德州仪器

30-80 MHz 10 Bit Bus LVDS Serializer and Deserializer with IEEE 1149.1 (JTAG) and at-speed BIST

文件:474.73 Kbytes Page:21 Pages

NSC

国半

SCAN921025 and SCAN921226 30-80 MHz 10 Bit Bus LVDS Serializer and Deserializer with IEEE 1149.1 (JTAG) and at-speed BIST

文件:906.75 Kbytes Page:27 Pages

TI

德州仪器

SCAN921025 and SCAN921226 30-80 MHz 10 Bit Bus LVDS Serializer and Deserializer with IEEE 1149.1 (JTAG) and at-speed BIST

文件:906.75 Kbytes Page:27 Pages

TI

德州仪器

Dispensing Tips

文件:237 Kbytes Page:1 Pages

METCAL

SCAN921025产品属性

  • 类型

    描述

  • 型号

    SCAN921025

  • 制造商

    NSC

  • 制造商全称

    National Semiconductor

  • 功能描述

    30-80 MHz 10 Bit Bus LVDS Serializer and Deserializer with IEEE 1149.1(JTAG) and at-speed BIST

更新时间:2025-12-27 23:01:00
IC供应商 芯片型号 品牌 批号 封装 库存 备注 价格
NS/国半
24+
NA/
9250
原厂直销,现货供应,账期支持!
NSC
2016+
BGA49
6000
只做原装,假一罚十,公司可开17%增值税发票!
NS/国半
25+
BGA49
54648
百分百原装现货 实单必成 欢迎询价
TI(德州仪器)
20+
BGA-49(7x7)
416
TI
22+
49BGA
9000
原厂渠道,现货配单
NSC
23+
NA
1380
专做原装正品,假一罚百!
NCS
25+23+
BGA
22671
绝对原装正品全新进口深圳现货
NSC
20+
BGA49
32970
原装优势主营型号-可开原型号增税票
NS
22+
BGA
3000
原装正品,支持实单
NS/国半
23+
BGA
3000
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