SCAN921025H and SCAN921226H High Temperature 20-80 MHz 10 Bit Bus LVDS SerDes with IEEE 1149.1 (JTAG) and at-speed BIST

1FEATURES 2• High Temperature Operation to 125°C • IEEE 1149.1 (JTAG) Compliant and At-Speed BIST Test Mode • Clock Recovery from PLL Lock to Random Data Patterns • Ensured Transition Every Data Transfer Cycle • Chipset (Tx + Rx) Power Consumption

SCAN921025 and SCAN921226 30-80 MHz 10 Bit Bus LVDS Serializer and Deserializer with IEEE 1149.1 (JTAG) and at-speed BIST

1FEATURES 2• IEEE 1149.1 (JTAG) Compliant and At-Speed BIST Test Mode. • Clock Recovery From PLL Lock to Random Data Patterns. • Specified Transition Every Data Transfer Cycle • Chipset (Tx + Rx) Power Consumption

30-80 MHz 10 Bit Bus LVDS Serializer and Deserializer with IEEE 1149.1 (JTAG) and at-speed BIST

文件：474.73 Kbytes Page：21 Pages

SCAN921025 and SCAN921226 30-80 MHz 10 Bit Bus LVDS Serializer and Deserializer with IEEE 1149.1 (JTAG) and at-speed BIST

文件：906.75 Kbytes Page：27 Pages

High Temperature 20-80 MHz 10 Bit Bus LVDS SerDes with IEEE 1149.1 (JTAG) and at-speed BIST

文件：527.93 Kbytes Page：21 Pages

Dispensing Tips

文件：237 Kbytes Page：1 Pages