| 型号 | 功能描述 | 生产厂家 企业 | LOGO | 操作 |
|---|---|---|---|---|
丝印代码：ABTH162245；16-BIT BUS TRANSCEIVERS WITH 3-STATE OUTPUTS Members of the Texas Instruments WidebusE Family A-Port Outputs Have Equivalent 25-W Series Resistors, So No External Resistors Are Required State-of-the-Art EPIC-IIBE BiCMOS Design Significantly Reduces Power Dissipation Typical VOLP (Output Ground Bounce) | TI 德州仪器 |   | ||
丝印代码：ABTH162260；12-BIT TO 24-BIT MULTIPLEXED D-TYPE LATCHES WITH SERIES-DAMPING RESISTORS AND 3-STATE OUTPUTS Members of the Texas Instruments WidebusE Family B-Port Outputs Have Equivalent 25-W Series Resistors, So No External Resistors Are Required State-of-the-Art EPIC-IIBE BiCMOS Design Significantly Reduces Power Dissipation ESD Protection Exceeds 2000 V Per MIL-STD-883, Method 3015; Exceeds | TI 德州仪器 | | ||
丝印代码：ABTH16245；16-BIT BUS TRANSCEIVERS WITH 3-STATE OUTPUTS Members of the Texas Instruments WidebusE Family State-of-the-Art EPIC-IIBE BiCMOS Design Significantly Reduces Power Dissipation Typical VOLP (Output Ground Bounce) | TI 德州仪器 | | ||
丝印代码：ABTH16245；16-BIT BUS TRANSCEIVERS WITH 3-STATE OUTPUTS Members of the Texas Instruments WidebusE Family State-of-the-Art EPIC-IIBE BiCMOS Design Significantly Reduces Power Dissipation Typical VOLP (Output Ground Bounce) | TI 德州仪器 | | ||
丝印代码：ABTH16245；16-BIT BUS TRANSCEIVERS WITH 3-STATE OUTPUTS Members of the Texas Instruments WidebusE Family State-of-the-Art EPIC-IIBE BiCMOS Design Significantly Reduces Power Dissipation Typical VOLP (Output Ground Bounce) | TI 德州仪器 | | ||
丝印代码：ABTH182502A；SCAN TEST DEVICES WITH 18-BIT UNIVERSAL BUS TRANSCEIVERS Members of the Texas Instruments SCOPE E Family of Testability Products Members of the Texas Instruments Widebus E Family Compatible With the IEEE Standard 1149.1-1990 (JTAG) Test Access Port and Boundary-Scan Architecture UBT E (Universal Bus Transceiver) Combines D-Type Latches and D-Typ | TI 德州仪器 | | ||
丝印代码：ABTH182646A；SCAN TEST DEVICES WITH 18-BIT TRANSCEIVERS AND REGISTERS Members of the Texas Instruments SCOPE E Family of Testability Products Members of the Texas Instruments WidebusE Family Compatible With the IEEE Standard 1149.1-1990 (JTAG) Test Access Port and Boundary-Scan Architecture Include D-Type Flip-Flops and Control Circuitry to Provide Multiplex | TI 德州仪器 | | ||
丝印代码：ABTH182646A；SCAN TEST DEVICES WITH 18-BIT TRANSCEIVERS AND REGISTERS Members of the Texas Instruments SCOPE E Family of Testability Products Members of the Texas Instruments WidebusE Family Compatible With the IEEE Standard 1149.1-1990 (JTAG) Test Access Port and Boundary-Scan Architecture Include D-Type Flip-Flops and Control Circuitry to Provide Multiplex | TI 德州仪器 | | ||
丝印代码：ABTH182646A；SCAN TEST DEVICES WITH 18-BIT TRANSCEIVERS AND REGISTERS Members of the Texas Instruments SCOPE E Family of Testability Products Members of the Texas Instruments WidebusE Family Compatible With the IEEE Standard 1149.1-1990 (JTAG) Test Access Port and Boundary-Scan Architecture Include D-Type Flip-Flops and Control Circuitry to Provide Multiplex | TI 德州仪器 | | ||
丝印代码：ABTH182652A；SCAN TEST DEVICES WITH 18-BIT BUS TRANSCEIVERS AND REGISTERS Members of the Texas Instruments SCOPE Family of Testability Products Members of the Texas Instruments Widebus Family Compatible With the IEEE Standard 1149.1-1990 (JTAG) Test Access Port and Boundary-Scan Architecture Include D-Type Flip-Flops and Control Circuitry to Provide Multiplex | TI 德州仪器 | | ||
丝印代码：ABTH162245；16-BIT BUS TRANSCEIVERS WITH 3-STATE OUTPUTS Members of the Texas Instruments WidebusE Family A-Port Outputs Have Equivalent 25-W Series Resistors, So No External Resistors Are Required State-of-the-Art EPIC-IIBE BiCMOS Design Significantly Reduces Power Dissipation Typical VOLP (Output Ground Bounce) | TI 德州仪器 | | ||
丝印代码：ABTH162245；16-BIT BUS TRANSCEIVERS WITH 3-STATE OUTPUTS Members of the Texas Instruments WidebusE Family A-Port Outputs Have Equivalent 25-W Series Resistors, So No External Resistors Are Required State-of-the-Art EPIC-IIBE BiCMOS Design Significantly Reduces Power Dissipation Typical VOLP (Output Ground Bounce) | TI 德州仪器 | | ||
丝印代码：ABTH162245；16-BIT BUS TRANSCEIVERS WITH 3-STATE OUTPUTS Members of the Texas Instruments WidebusE Family A-Port Outputs Have Equivalent 25-W Series Resistors, So No External Resistors Are Required State-of-the-Art EPIC-IIBE BiCMOS Design Significantly Reduces Power Dissipation Typical VOLP (Output Ground Bounce) | TI 德州仪器 | | ||
丝印代码：ABTH162245；16-BIT BUS TRANSCEIVERS WITH 3-STATE OUTPUTS Members of the Texas Instruments WidebusE Family A-Port Outputs Have Equivalent 25-W Series Resistors, So No External Resistors Are Required State-of-the-Art EPIC-IIBE BiCMOS Design Significantly Reduces Power Dissipation Typical VOLP (Output Ground Bounce) | TI 德州仪器 | | ||
丝印代码：ABTH162245；16-BIT BUS TRANSCEIVERS WITH 3-STATE OUTPUTS Members of the Texas Instruments WidebusE Family A-Port Outputs Have Equivalent 25-W Series Resistors, So No External Resistors Are Required State-of-the-Art EPIC-IIBE BiCMOS Design Significantly Reduces Power Dissipation Typical VOLP (Output Ground Bounce) | TI 德州仪器 | | ||
丝印代码：ABTH162245；16-BIT BUS TRANSCEIVERS WITH 3-STATE OUTPUTS Members of the Texas Instruments WidebusE Family A-Port Outputs Have Equivalent 25-W Series Resistors, So No External Resistors Are Required State-of-the-Art EPIC-IIBE BiCMOS Design Significantly Reduces Power Dissipation Typical VOLP (Output Ground Bounce) | TI 德州仪器 | | ||
丝印代码：ABTH162260；12-BIT TO 24-BIT MULTIPLEXED D-TYPE LATCHES WITH SERIES-DAMPING RESISTORS AND 3-STATE OUTPUTS Members of the Texas Instruments WidebusE Family B-Port Outputs Have Equivalent 25-W Series Resistors, So No External Resistors Are Required State-of-the-Art EPIC-IIBE BiCMOS Design Significantly Reduces Power Dissipation ESD Protection Exceeds 2000 V Per MIL-STD-883, Method 3015; Exceeds | TI 德州仪器 | | ||
丝印代码：ABTH162260；12-BIT TO 24-BIT MULTIPLEXED D-TYPE LATCHES WITH SERIES-DAMPING RESISTORS AND 3-STATE OUTPUTS Members of the Texas Instruments WidebusE Family B-Port Outputs Have Equivalent 25-W Series Resistors, So No External Resistors Are Required State-of-the-Art EPIC-IIBE BiCMOS Design Significantly Reduces Power Dissipation ESD Protection Exceeds 2000 V Per MIL-STD-883, Method 3015; Exceeds | TI 德州仪器 | | ||
丝印代码：ABTH162260；12-BIT TO 24-BIT MULTIPLEXED D-TYPE LATCHES WITH SERIES-DAMPING RESISTORS AND 3-STATE OUTPUTS Members of the Texas Instruments WidebusE Family B-Port Outputs Have Equivalent 25-W Series Resistors, So No External Resistors Are Required State-of-the-Art EPIC-IIBE BiCMOS Design Significantly Reduces Power Dissipation ESD Protection Exceeds 2000 V Per MIL-STD-883, Method 3015; Exceeds | TI 德州仪器 | | ||
丝印代码：ABTH162260；12-BIT TO 24-BIT MULTIPLEXED D-TYPE LATCHES WITH SERIES-DAMPING RESISTORS AND 3-STATE OUTPUTS Members of the Texas Instruments WidebusE Family B-Port Outputs Have Equivalent 25-W Series Resistors, So No External Resistors Are Required State-of-the-Art EPIC-IIBE BiCMOS Design Significantly Reduces Power Dissipation ESD Protection Exceeds 2000 V Per MIL-STD-883, Method 3015; Exceeds | TI 德州仪器 | | ||
丝印代码：ABTH16244；16-BIT BUFFERS/DRIVERS WITH 3-STATE OUTPUTS Members of the Texas Instruments WidebusE Family State-of-the-Art EPIC-IIBE BiCMOS Design Significantly Reduces Power Dissipation Latch-Up Performance Exceeds 500 mA Per JESD 17 Typical VOLP (Output Ground Bounce) | TI 德州仪器 | | ||
丝印代码：ABTH16244；16-BIT BUFFERS/DRIVERS WITH 3-STATE OUTPUTS Members of the Texas Instruments WidebusE Family State-of-the-Art EPIC-IIBE BiCMOS Design Significantly Reduces Power Dissipation Latch-Up Performance Exceeds 500 mA Per JESD 17 Typical VOLP (Output Ground Bounce) | TI 德州仪器 | | ||
丝印代码：ABTH16244；16-BIT BUFFERS/DRIVERS WITH 3-STATE OUTPUTS Members of the Texas Instruments WidebusE Family State-of-the-Art EPIC-IIBE BiCMOS Design Significantly Reduces Power Dissipation Latch-Up Performance Exceeds 500 mA Per JESD 17 Typical VOLP (Output Ground Bounce) | TI 德州仪器 | | ||
丝印代码：ABTH16244；16-BIT BUFFERS/DRIVERS WITH 3-STATE OUTPUTS Members of the Texas Instruments WidebusE Family State-of-the-Art EPIC-IIBE BiCMOS Design Significantly Reduces Power Dissipation Latch-Up Performance Exceeds 500 mA Per JESD 17 Typical VOLP (Output Ground Bounce) | TI 德州仪器 | | ||
丝印代码：ABTH16244；16-BIT BUFFERS/DRIVERS WITH 3-STATE OUTPUTS Members of the Texas Instruments WidebusE Family State-of-the-Art EPIC-IIBE BiCMOS Design Significantly Reduces Power Dissipation Latch-Up Performance Exceeds 500 mA Per JESD 17 Typical VOLP (Output Ground Bounce) | TI 德州仪器 | | ||
丝印代码：ABTH16244；16-BIT BUFFERS/DRIVERS WITH 3-STATE OUTPUTS Members of the Texas Instruments WidebusE Family State-of-the-Art EPIC-IIBE BiCMOS Design Significantly Reduces Power Dissipation Latch-Up Performance Exceeds 500 mA Per JESD 17 Typical VOLP (Output Ground Bounce) | TI 德州仪器 | | ||
丝印代码：ABTH16245；16-BIT BUS TRANSCEIVERS WITH 3-STATE OUTPUTS Members of the Texas Instruments WidebusE Family State-of-the-Art EPIC-IIBE BiCMOS Design Significantly Reduces Power Dissipation Typical VOLP (Output Ground Bounce) | TI 德州仪器 | | ||
丝印代码：ABTH16245；16-BIT BUS TRANSCEIVERS WITH 3-STATE OUTPUTS Members of the Texas Instruments WidebusE Family State-of-the-Art EPIC-IIBE BiCMOS Design Significantly Reduces Power Dissipation Typical VOLP (Output Ground Bounce) | TI 德州仪器 | | ||
丝印代码：ABTH16245；16-BIT BUS TRANSCEIVERS WITH 3-STATE OUTPUTS Members of the Texas Instruments WidebusE Family State-of-the-Art EPIC-IIBE BiCMOS Design Significantly Reduces Power Dissipation Typical VOLP (Output Ground Bounce) | TI 德州仪器 | | ||
丝印代码：ABTH16245；16-BIT BUS TRANSCEIVERS WITH 3-STATE OUTPUTS Members of the Texas Instruments WidebusE Family State-of-the-Art EPIC-IIBE BiCMOS Design Significantly Reduces Power Dissipation Typical VOLP (Output Ground Bounce) | TI 德州仪器 | | ||
丝印代码：ABTH16245；16-BIT BUS TRANSCEIVERS WITH 3-STATE OUTPUTS Members of the Texas Instruments WidebusE Family State-of-the-Art EPIC-IIBE BiCMOS Design Significantly Reduces Power Dissipation Typical VOLP (Output Ground Bounce) | TI 德州仪器 | | ||
丝印代码：ABTH16245；16-BIT BUS TRANSCEIVERS WITH 3-STATE OUTPUTS Members of the Texas Instruments WidebusE Family State-of-the-Art EPIC-IIBE BiCMOS Design Significantly Reduces Power Dissipation Typical VOLP (Output Ground Bounce) | TI 德州仪器 | | ||
丝印代码：ABTH16245；16-BIT BUS TRANSCEIVERS WITH 3-STATE OUTPUTS Members of the Texas Instruments WidebusE Family State-of-the-Art EPIC-IIBE BiCMOS Design Significantly Reduces Power Dissipation Typical VOLP (Output Ground Bounce) | TI 德州仪器 | | ||
丝印代码：ABTH16245；16-BIT BUS TRANSCEIVERS WITH 3-STATE OUTPUTS Members of the Texas Instruments WidebusE Family State-of-the-Art EPIC-IIBE BiCMOS Design Significantly Reduces Power Dissipation Typical VOLP (Output Ground Bounce) | TI 德州仪器 | | ||
丝印代码：ABTH16245；16-BIT BUS TRANSCEIVERS WITH 3-STATE OUTPUTS Members of the Texas Instruments WidebusE Family State-of-the-Art EPIC-IIBE BiCMOS Design Significantly Reduces Power Dissipation Typical VOLP (Output Ground Bounce) | TI 德州仪器 | | ||
丝印代码：ABTH16245；16-BIT BUS TRANSCEIVERS WITH 3-STATE OUTPUTS Members of the Texas Instruments WidebusE Family State-of-the-Art EPIC-IIBE BiCMOS Design Significantly Reduces Power Dissipation Typical VOLP (Output Ground Bounce) | TI 德州仪器 | | ||
丝印代码：ABTH16245；16-BIT BUS TRANSCEIVERS WITH 3-STATE OUTPUTS Members of the Texas Instruments WidebusE Family State-of-the-Art EPIC-IIBE BiCMOS Design Significantly Reduces Power Dissipation Typical VOLP (Output Ground Bounce) | TI 德州仪器 | | ||
丝印代码：ABTH16245；16-BIT BUS TRANSCEIVERS WITH 3-STATE OUTPUTS Members of the Texas Instruments WidebusE Family State-of-the-Art EPIC-IIBE BiCMOS Design Significantly Reduces Power Dissipation Typical VOLP (Output Ground Bounce) | TI 德州仪器 | | ||
丝印代码：ABTH16245；16-BIT BUS TRANSCEIVERS WITH 3-STATE OUTPUTS Members of the Texas Instruments WidebusE Family State-of-the-Art EPIC-IIBE BiCMOS Design Significantly Reduces Power Dissipation Typical VOLP (Output Ground Bounce) | TI 德州仪器 | | ||
丝印代码：ABTH16245；16-BIT BUS TRANSCEIVERS WITH 3-STATE OUTPUTS Members of the Texas Instruments WidebusE Family State-of-the-Art EPIC-IIBE BiCMOS Design Significantly Reduces Power Dissipation Typical VOLP (Output Ground Bounce) | TI 德州仪器 | | ||
丝印代码：ABTH16245；16-BIT BUS TRANSCEIVERS WITH 3-STATE OUTPUTS Members of the Texas Instruments WidebusE Family State-of-the-Art EPIC-IIBE BiCMOS Design Significantly Reduces Power Dissipation Typical VOLP (Output Ground Bounce) | TI 德州仪器 | | ||
丝印代码：ABTH16245；16-BIT BUS TRANSCEIVERS WITH 3-STATE OUTPUTS Members of the Texas Instruments WidebusE Family State-of-the-Art EPIC-IIBE BiCMOS Design Significantly Reduces Power Dissipation Typical VOLP (Output Ground Bounce) | TI 德州仪器 | | ||
丝印代码：ABTH16245；16-BIT BUS TRANSCEIVERS WITH 3-STATE OUTPUTS Members of the Texas Instruments WidebusE Family State-of-the-Art EPIC-IIBE BiCMOS Design Significantly Reduces Power Dissipation Typical VOLP (Output Ground Bounce) | TI 德州仪器 | | ||
丝印代码：ABTH16245；16-BIT BUS TRANSCEIVERS WITH 3-STATE OUTPUTS Members of the Texas Instruments WidebusE Family State-of-the-Art EPIC-IIBE BiCMOS Design Significantly Reduces Power Dissipation Typical VOLP (Output Ground Bounce) | TI 德州仪器 | | ||
丝印代码：ABTH16260；12-BIT TO 24-BIT MULTIPLEXED D-TYPE LATCHES WITH 3-STATE OUTPUTS Members of the Texas Instruments WidebusE Family State-of-the-Art EPIC-IIBE BiCMOS Design Significantly Reduces Power Dissipation ESD Protection Exceeds 2000 V Per MIL-STD-883, Method 3015; Exceeds 200 V Using Machine Model (C = 200 pF, R = 0) Latch-Up Performance Exceeds 500 mA Per JEDEC | TI 德州仪器 | | ||
丝印代码：ABTH16260；12-BIT TO 24-BIT MULTIPLEXED D-TYPE LATCHES WITH 3-STATE OUTPUTS Members of the Texas Instruments WidebusE Family State-of-the-Art EPIC-IIBE BiCMOS Design Significantly Reduces Power Dissipation ESD Protection Exceeds 2000 V Per MIL-STD-883, Method 3015; Exceeds 200 V Using Machine Model (C = 200 pF, R = 0) Latch-Up Performance Exceeds 500 mA Per JEDEC | TI 德州仪器 | | ||
丝印代码：ABTH16260；12-BIT TO 24-BIT MULTIPLEXED D-TYPE LATCHES WITH 3-STATE OUTPUTS Members of the Texas Instruments WidebusE Family State-of-the-Art EPIC-IIBE BiCMOS Design Significantly Reduces Power Dissipation ESD Protection Exceeds 2000 V Per MIL-STD-883, Method 3015; Exceeds 200 V Using Machine Model (C = 200 pF, R = 0) Latch-Up Performance Exceeds 500 mA Per JEDEC | TI 德州仪器 | | ||
丝印代码：ABTH16260；12-BIT TO 24-BIT MULTIPLEXED D-TYPE LATCHES WITH 3-STATE OUTPUTS Members of the Texas Instruments WidebusE Family State-of-the-Art EPIC-IIBE BiCMOS Design Significantly Reduces Power Dissipation ESD Protection Exceeds 2000 V Per MIL-STD-883, Method 3015; Exceeds 200 V Using Machine Model (C = 200 pF, R = 0) Latch-Up Performance Exceeds 500 mA Per JEDEC | TI 德州仪器 | | ||
丝印代码：ABTH16823；18-BIT BUS-INTERFACE FLIP-FLOPS WITH 3-STATE OUTPUTS Members of the Texas Instruments WidebusE Family State-of-the-Art EPIC-IIBE BiCMOS Design Significantly Reduces Power Dissipation ESD Protection Exceeds 2000 V Per MIL-STD-883, Method 3015; Exceeds 200 V Using Machine Model (C = 200 pF, R = 0) Typical VOLP (Output Ground Bounce) | TI 德州仪器 | | ||
丝印代码：ABTH16823；18-BIT BUS-INTERFACE FLIP-FLOPS WITH 3-STATE OUTPUTS Members of the Texas Instruments WidebusE Family State-of-the-Art EPIC-IIBE BiCMOS Design Significantly Reduces Power Dissipation ESD Protection Exceeds 2000 V Per MIL-STD-883, Method 3015; Exceeds 200 V Using Machine Model (C = 200 pF, R = 0) Typical VOLP (Output Ground Bounce) | TI 德州仪器 | | ||
丝印代码：ABTH182502A；SCAN TEST DEVICES WITH 18-BIT UNIVERSAL BUS TRANSCEIVERS Members of the Texas Instruments SCOPE E Family of Testability Products Members of the Texas Instruments Widebus E Family Compatible With the IEEE Standard 1149.1-1990 (JTAG) Test Access Port and Boundary-Scan Architecture UBT E (Universal Bus Transceiver) Combines D-Type Latches and D-Typ | TI 德州仪器 | | ||
丝印代码：ABTH182502A；SCAN TEST DEVICES WITH 18-BIT UNIVERSAL BUS TRANSCEIVERS Members of the Texas Instruments SCOPE E Family of Testability Products Members of the Texas Instruments Widebus E Family Compatible With the IEEE Standard 1149.1-1990 (JTAG) Test Access Port and Boundary-Scan Architecture UBT E (Universal Bus Transceiver) Combines D-Type Latches and D-Typ | TI 德州仪器 | | ||
丝印代码：ABTH182502A；SCAN TEST DEVICES WITH 18-BIT UNIVERSAL BUS TRANSCEIVERS Members of the Texas Instruments SCOPE E Family of Testability Products Members of the Texas Instruments Widebus E Family Compatible With the IEEE Standard 1149.1-1990 (JTAG) Test Access Port and Boundary-Scan Architecture UBT E (Universal Bus Transceiver) Combines D-Type Latches and D-Typ | TI 德州仪器 | | ||
丝印代码：ABTH182504A；SCAN TEST DEVICES WITH 20-BIT UNIVERSAL BUS TRANSCEIVERS Members of the Texas Instruments SCOPEE Family of Testability Products Members of the Texas Instruments WidebusE Family Compatible With the IEEE Standard 1149.1-1990 (JTAG) Test Access Port and Boundary-Scan Architecture UBT E (Universal Bus Transceiver) Combines D-Type Latches and D-Type | TI 德州仪器 | | ||
丝印代码：ABTH182504A；SCAN TEST DEVICES WITH 20-BIT UNIVERSAL BUS TRANSCEIVERS Members of the Texas Instruments SCOPEE Family of Testability Products Members of the Texas Instruments WidebusE Family Compatible With the IEEE Standard 1149.1-1990 (JTAG) Test Access Port and Boundary-Scan Architecture UBT E (Universal Bus Transceiver) Combines D-Type Latches and D-Type | TI 德州仪器 | | ||
丝印代码：ABTH182504A；SCAN TEST DEVICES WITH 20-BIT UNIVERSAL BUS TRANSCEIVERS Members of the Texas Instruments SCOPEE Family of Testability Products Members of the Texas Instruments WidebusE Family Compatible With the IEEE Standard 1149.1-1990 (JTAG) Test Access Port and Boundary-Scan Architecture UBT E (Universal Bus Transceiver) Combines D-Type Latches and D-Type | TI 德州仪器 | | ||
丝印代码：ABTH182504A；SCAN TEST DEVICES WITH 20-BIT UNIVERSAL BUS TRANSCEIVERS Members of the Texas Instruments SCOPEE Family of Testability Products Members of the Texas Instruments WidebusE Family Compatible With the IEEE Standard 1149.1-1990 (JTAG) Test Access Port and Boundary-Scan Architecture UBT E (Universal Bus Transceiver) Combines D-Type Latches and D-Type | TI 德州仪器 | | ||
丝印代码：ABTH182646A；SCAN TEST DEVICES WITH 18-BIT TRANSCEIVERS AND REGISTERS Members of the Texas Instruments SCOPE E Family of Testability Products Members of the Texas Instruments WidebusE Family Compatible With the IEEE Standard 1149.1-1990 (JTAG) Test Access Port and Boundary-Scan Architecture Include D-Type Flip-Flops and Control Circuitry to Provide Multiplex | TI 德州仪器 | | ||
丝印代码：ABTH182646A；SCAN TEST DEVICES WITH 18-BIT TRANSCEIVERS AND REGISTERS Members of the Texas Instruments SCOPE E Family of Testability Products Members of the Texas Instruments WidebusE Family Compatible With the IEEE Standard 1149.1-1990 (JTAG) Test Access Port and Boundary-Scan Architecture Include D-Type Flip-Flops and Control Circuitry to Provide Multiplex | TI 德州仪器 | | ||
丝印代码：ABTH182646A；SCAN TEST DEVICES WITH 18-BIT TRANSCEIVERS AND REGISTERS Members of the Texas Instruments SCOPE E Family of Testability Products Members of the Texas Instruments WidebusE Family Compatible With the IEEE Standard 1149.1-1990 (JTAG) Test Access Port and Boundary-Scan Architecture Include D-Type Flip-Flops and Control Circuitry to Provide Multiplex | TI 德州仪器 | |
| IC供应商 | 芯片型号 | 品牌 | 批号 | 封装 | 库存 | 备注 | 价格 |
|---|---|---|---|---|---|---|---|
TI |
25+ |
SSOP48 |
7786 |
正规渠道,免费送样。支持账期,BOM一站式配齐 |
|||
TI(德州仪器) |
25+ |
SSOP48300mil |
1493 |
原装现货,免费供样,技术支持,原厂对接 |
|||
Texas Instruments |
24+ |
48-SSOP |
65200 |
一级代理/放心采购 |
|||
TI/德州仪器 |
2450+ |
SSOP48 |
6540 |
只做原装正品假一赔十为客户做到零风险!! |
|||
Texas Instruments |
24+25+ |
16500 |
全新原厂原装现货!受权代理!可送样可提供技术支持! |
||||
TI/德州仪器 |
22+ |
SSOP-48 |
20000 |
公司只有原装 品质保障 |
|||
TI |
23+ |
SSOP48 |
3200 |
正规渠道,只有原装! |
|||
TI |
23+ |
NA |
20000 |
||||
TI |
22+ |
48SSOP |
9000 |
原厂渠道,现货配单 |
|||
TI |
24+ |
SSOP-48P |
4 |
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ABX00032
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2024-1-3ABX00063
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2020-5-23
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