丝印代码：ABT18245A；SCAN TEST DEVICES WITH 18-BIT BUS TRANSCEIVERS

Members of the Texas Instruments SCOPE E Family of Testability Products Members of the Texas Instruments WidebusE Family Compatible With the IEEE Standard 1149.1-1990 (JTAG) Test Access Port and Boundary-Scan Architecture SCOPE E Instruction Set – IEEE Standard 1149.1-1990 Required Instru

丝印代码：ABT18245A；SCAN TEST DEVICES WITH 18-BIT BUS TRANSCEIVERS

Members of the Texas Instruments SCOPE E Family of Testability Products Members of the Texas Instruments WidebusE Family Compatible With the IEEE Standard 1149.1-1990 (JTAG) Test Access Port and Boundary-Scan Architecture SCOPE E Instruction Set – IEEE Standard 1149.1-1990 Required Instru

丝印代码：ABT18245A；SCAN TEST DEVICES WITH 18-BIT BUS TRANSCEIVERS

Members of the Texas Instruments SCOPE E Family of Testability Products Members of the Texas Instruments WidebusE Family Compatible With the IEEE Standard 1149.1-1990 (JTAG) Test Access Port and Boundary-Scan Architecture SCOPE E Instruction Set – IEEE Standard 1149.1-1990 Required Instru

丝印代码：ABT18502；SCAN TEST DEVICE WITH 18-BIT REGISTERED BUS TRANSCEIVER

Member of the Texas Instruments Widebus Family UBT Transceiver Combines D-Type Latches and D-Type Flip-Flops for Operation in Transparent, Latched, or Clocked Mode Compatible With IEEE Std 1149.1-1990 (JTAG) Test Access Port (TAP) and Boundary-Scan Architecture Includes D-Type Flip-Flop

丝印代码：ABT18502；SCAN TEST DEVICE WITH 18-BIT REGISTERED BUS TRANSCEIVER

Member of the Texas Instruments Widebus Family UBT Transceiver Combines D-Type Latches and D-Type Flip-Flops for Operation in Transparent, Latched, or Clocked Mode Compatible With IEEE Std 1149.1-1990 (JTAG) Test Access Port (TAP) and Boundary-Scan Architecture Includes D-Type Flip-Flop

丝印代码：ABT18502；SCAN TEST DEVICE WITH 18-BIT REGISTERED BUS TRANSCEIVER

Member of the Texas Instruments Widebus Family UBT Transceiver Combines D-Type Latches and D-Type Flip-Flops for Operation in Transparent, Latched, or Clocked Mode Compatible With IEEE Std 1149.1-1990 (JTAG) Test Access Port (TAP) and Boundary-Scan Architecture Includes D-Type Flip-Flop

丝印代码：ABT18502；SCAN TEST DEVICE WITH 18-BIT REGISTERED BUS TRANSCEIVER

Member of the Texas Instruments Widebus Family UBT Transceiver Combines D-Type Latches and D-Type Flip-Flops for Operation in Transparent, Latched, or Clocked Mode Compatible With IEEE Std 1149.1-1990 (JTAG) Test Access Port (TAP) and Boundary-Scan Architecture Includes D-Type Flip-Flop

丝印代码：ABT18502；SCAN TEST DEVICE WITH 18-BIT REGISTERED BUS TRANSCEIVER

Member of the Texas Instruments Widebus Family UBT Transceiver Combines D-Type Latches and D-Type Flip-Flops for Operation in Transparent, Latched, or Clocked Mode Compatible With IEEE Std 1149.1-1990 (JTAG) Test Access Port (TAP) and Boundary-Scan Architecture Includes D-Type Flip-Flop

丝印代码：ABT18504；SCAN TEST DEVICES WITH 20-BIT UNIVERSAL BUS TRANSCEIVERS

Members of the Texas Instruments SCOPE E Family of Testability Products Members of the Texas Instruments Widebus E Family Compatible With the IEEE Standard 1149.1-1990 (JTAG) Test Access Port and Boundary-Scan Architecture UBT E (Universal Bus Transceiver) Combines D-Type Latches and D-Typ

丝印代码：ABT18504；SCAN TEST DEVICES WITH 20-BIT UNIVERSAL BUS TRANSCEIVERS

Members of the Texas Instruments SCOPE E Family of Testability Products Members of the Texas Instruments Widebus E Family Compatible With the IEEE Standard 1149.1-1990 (JTAG) Test Access Port and Boundary-Scan Architecture UBT E (Universal Bus Transceiver) Combines D-Type Latches and D-Typ

丝印代码：ABT18504；SCAN TEST DEVICES WITH 20-BIT UNIVERSAL BUS TRANSCEIVERS

Members of the Texas Instruments SCOPE E Family of Testability Products Members of the Texas Instruments Widebus E Family Compatible With the IEEE Standard 1149.1-1990 (JTAG) Test Access Port and Boundary-Scan Architecture UBT E (Universal Bus Transceiver) Combines D-Type Latches and D-Typ

丝印代码：ABT18640；SCAN TEST DEVICES WITH 18-BIT INVERTING BUS TRANSCEIVERS

Members of the Texas Instruments SCOPE E Family of Testability Products Members of the Texas Instruments WidebusE Family Compatible With the IEEE Standard 1149.1-1990 (JTAG) Test Access Port and Boundary-Scan Architecture SCOPE E Instruction Set – IEEE Standard 1149.1-1990 Required Instru

丝印代码：ABT18640；SCAN TEST DEVICES WITH 18-BIT INVERTING BUS TRANSCEIVERS

Members of the Texas Instruments SCOPE E Family of Testability Products Members of the Texas Instruments WidebusE Family Compatible With the IEEE Standard 1149.1-1990 (JTAG) Test Access Port and Boundary-Scan Architecture SCOPE E Instruction Set – IEEE Standard 1149.1-1990 Required Instru

丝印代码：ABT18646；SCAN TEST DEVICE WITH 18-BIT TRANSCEIVER AND REGISTER

Member of the Texas Instruments Widebus Family Compatible With IEEE Std 1149.1-1990 (JTAG) Test Access Port and Boundary-Scan Architecture Includes D-Type Flip-Flops and Control Circuitry to Provide Multiplexed Transmission of Stored and Real-Time Data Two Boundary-Scan Cells Per I/O for

丝印代码：ABT18646；SCAN TEST DEVICE WITH 18-BIT TRANSCEIVER AND REGISTER

Member of the Texas Instruments Widebus Family Compatible With IEEE Std 1149.1-1990 (JTAG) Test Access Port and Boundary-Scan Architecture Includes D-Type Flip-Flops and Control Circuitry to Provide Multiplexed Transmission of Stored and Real-Time Data Two Boundary-Scan Cells Per I/O for

丝印代码：ABT18646；SCAN TEST DEVICE WITH 18-BIT TRANSCEIVER AND REGISTER

Member of the Texas Instruments Widebus Family Compatible With IEEE Std 1149.1-1990 (JTAG) Test Access Port and Boundary-Scan Architecture Includes D-Type Flip-Flops and Control Circuitry to Provide Multiplexed Transmission of Stored and Real-Time Data Two Boundary-Scan Cells Per I/O for

丝印代码：ABT18652；SCAN TEST DEVICE WITH 18-BIT TRANSCEIVER AND REGISTER

Member of the Texas Instruments Widebus Family Compatible With IEEE Std 1149.1-1990 (JTAG) Test Access Port and Boundary-Scan Architecture Includes D-Type Flip-Flops and Control Circuitry to Provide Multiplexed Transmission of Stored and Real-Time Data Two Boundary-Scan Cells Per I/O for

丝印代码：ABT18652；SCAN TEST DEVICE WITH 18-BIT TRANSCEIVER AND REGISTER

Member of the Texas Instruments Widebus Family Compatible With IEEE Std 1149.1-1990 JTAG) Test Access Port and Boundary-Scan Architecture Includes D-Type Flip-Flops and Control Circuitry to Provide Multiplexed Transmission of Stored and Real-Time Data Two Boundary-Scan Cells Per I/O for

丝印代码：ABT18652；SCAN TEST DEVICE WITH 18-BIT TRANSCEIVER AND REGISTER

Member of the Texas Instruments Widebus Family Compatible With IEEE Std 1149.1-1990 JTAG) Test Access Port and Boundary-Scan Architecture Includes D-Type Flip-Flops and Control Circuitry to Provide Multiplexed Transmission of Stored and Real-Time Data Two Boundary-Scan Cells Per I/O for

丝印代码：ABT18652；SCAN TEST DEVICE WITH 18-BIT TRANSCEIVER AND REGISTER

Member of the Texas Instruments Widebus Family Compatible With IEEE Std 1149.1-1990 (JTAG) Test Access Port and Boundary-Scan Architecture Includes D-Type Flip-Flops and Control Circuitry to Provide Multiplexed Transmission of Stored and Real-Time Data Two Boundary-Scan Cells Per I/O for

丝印代码：ABT18652；SCAN TEST DEVICE WITH 18-BIT TRANSCEIVER AND REGISTER

Member of the Texas Instruments Widebus Family Compatible With IEEE Std 1149.1-1990 JTAG) Test Access Port and Boundary-Scan Architecture Includes D-Type Flip-Flops and Control Circuitry to Provide Multiplexed Transmission of Stored and Real-Time Data Two Boundary-Scan Cells Per I/O for

丝印代码：ABT18652；SCAN TEST DEVICE WITH 18-BIT TRANSCEIVER AND REGISTER

Member of the Texas Instruments Widebus Family Compatible With IEEE Std 1149.1-1990 JTAG) Test Access Port and Boundary-Scan Architecture Includes D-Type Flip-Flops and Control Circuitry to Provide Multiplexed Transmission of Stored and Real-Time Data Two Boundary-Scan Cells Per I/O for

丝印代码：ABT18652；SCAN TEST DEVICE WITH 18-BIT TRANSCEIVER AND REGISTER

Member of the Texas Instruments Widebus Family Compatible With IEEE Std 1149.1-1990 (JTAG) Test Access Port and Boundary-Scan Architecture Includes D-Type Flip-Flops and Control Circuitry to Provide Multiplexed Transmission of Stored and Real-Time Data Two Boundary-Scan Cells Per I/O for

SCAN TEST DEVICE WITH 18-BIT REGISTERED BUS TRANSCEIVER

文件：433.54 Kbytes Page：30 Pages

WITH 18-BIT TRANSCEIVER AND REGISTER

文件：208.68 Kbytes Page：13 Pages