位置：首页 > IC中文资料第5774页 > ABT18502
| 型号 | 功能描述 | 生产厂家 企业 | LOGO | 操作 |
|---|---|---|---|---|
丝印代码：ABT18502；SCAN TEST DEVICE WITH 18-BIT REGISTERED BUS TRANSCEIVER Member of the Texas Instruments Widebus Family UBT Transceiver Combines D-Type Latches and D-Type Flip-Flops for Operation in Transparent, Latched, or Clocked Mode Compatible With IEEE Std 1149.1-1990 (JTAG) Test Access Port (TAP) and Boundary-Scan Architecture Includes D-Type Flip-Flop | TI 德州仪器 |   | ||
丝印代码：ABT18502；SCAN TEST DEVICE WITH 18-BIT REGISTERED BUS TRANSCEIVER Member of the Texas Instruments Widebus Family UBT Transceiver Combines D-Type Latches and D-Type Flip-Flops for Operation in Transparent, Latched, or Clocked Mode Compatible With IEEE Std 1149.1-1990 (JTAG) Test Access Port (TAP) and Boundary-Scan Architecture Includes D-Type Flip-Flop | TI 德州仪器 | | ||
丝印代码：ABT18502；SCAN TEST DEVICE WITH 18-BIT REGISTERED BUS TRANSCEIVER Member of the Texas Instruments Widebus Family UBT Transceiver Combines D-Type Latches and D-Type Flip-Flops for Operation in Transparent, Latched, or Clocked Mode Compatible With IEEE Std 1149.1-1990 (JTAG) Test Access Port (TAP) and Boundary-Scan Architecture Includes D-Type Flip-Flop | TI 德州仪器 | | ||
丝印代码：ABT18502；SCAN TEST DEVICE WITH 18-BIT REGISTERED BUS TRANSCEIVER Member of the Texas Instruments Widebus Family UBT Transceiver Combines D-Type Latches and D-Type Flip-Flops for Operation in Transparent, Latched, or Clocked Mode Compatible With IEEE Std 1149.1-1990 (JTAG) Test Access Port (TAP) and Boundary-Scan Architecture Includes D-Type Flip-Flop | TI 德州仪器 | | ||
丝印代码：ABT18502；SCAN TEST DEVICE WITH 18-BIT REGISTERED BUS TRANSCEIVER Member of the Texas Instruments Widebus Family UBT Transceiver Combines D-Type Latches and D-Type Flip-Flops for Operation in Transparent, Latched, or Clocked Mode Compatible With IEEE Std 1149.1-1990 (JTAG) Test Access Port (TAP) and Boundary-Scan Architecture Includes D-Type Flip-Flop | TI 德州仪器 | | ||
ABT18502 | SCAN TEST DEVICE WITH 18-BIT REGISTERED BUS TRANSCEIVER 文件：433.54 Kbytes Page：30 Pages | TI 德州仪器 | | |
isc N-Channel MOSFET Transistor FEATURES ·Drain Current : ID= 100A@ TC=25℃ ·Drain Source Voltage : VDSS= 40V(Min) ·Static Drain-Source On-Resistance : RDS(on) = 2.9mΩ(Max) @ VGS= 10V ·100 avalanche tested ·Minimum Lot-to-Lot variations for robust device performance and reliable operation DESCRIPTION ·motor drive, DC- | ISC 无锡固电 | | ||
40-V, N-Channel NexFET Power MOSFETs 文件：906.4 Kbytes Page：9 Pages | TI 德州仪器 | | ||
184.8MHz SAW Filter 1.6MHz Bandwidth 文件：252.58 Kbytes Page：3 Pages | SIPAT 胜普电子 | | ||
BiCMOS PFC/PWM Combination Controller 文件：91.38 Kbytes Page：8 Pages | TI 德州仪器 | |
ABT18502产品属性
- 类型
描述
- 型号
ABT18502
- 制造商
TI
- 制造商全称
Texas Instruments
- 功能描述
SCAN TEST DEVICE WITH 18-BIT REGISTERED BUS TRANSCEIVER
| IC供应商 | 芯片型号 | 品牌 | 批号 | 封装 | 库存 | 备注 | 价格 |
|---|---|---|---|---|---|---|---|
TI |
25+ |
LQFP64 |
22360 |
样件支持,可原厂排单订货! |
|||
TI(德州仪器) |
25+ |
LQFP64(10x10) |
1588 |
原装现货,免费供样,技术支持,原厂对接 |
|||
TI |
25+23+ |
LQFP-64 |
18922 |
绝对原装正品全新进口深圳现货 |
|||
TI |
24+ |
6 |
|||||
TI/德州仪器 |
25+ |
原厂封装 |
10280 |
原厂授权代理,专注军工、汽车、医疗、工业、新能源！ |
|||
TI/德州仪器 |
23+ |
LQFP-64 |
5000 |
全新原装,支持实单,非诚勿扰 |
|||
TI/德州仪器 |
23+ |
LQFP-64 |
3200 |
公司只做原装，可来电咨询 |
|||
TI/德州仪器 |
2447 |
QFP |
100500 |
一级代理专营品牌!原装正品,优势现货,长期排单到货 |
|||
TI/德州仪器 |
22+ |
LQFP-64 |
20000 |
公司只做原装 品质保障 |
|||
TI |
23+ |
N/A |
560 |
原厂原装 |
ABT18502芯片相关品牌
ABT18502规格书下载地址
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ABT18502数据表相关新闻
ABX00032
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2020-5-23
DdatasheetPDF页码索引
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