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SN74LVT8986ZGV中文资料
SN74LVT8986ZGV数据手册规格书PDF详情
FEATURES
· Members of the Texas Instruments (TI) Family
of JTAG Scan-Support Products
· Extend Scan Access From Board Level to
Higher Level of System Integration
· Three IEEE Std 1149.1-Compatible
Configurable Secondary Scan Paths to One
Primary Scan Path
· Multiple Devices Can Be Cascaded to Link 24
Secondary Scan Paths to One Primary Scan
Path
· Simple (Linking Shadow) Protocol Is Used to
Connect the Primary Test Access Port (TAP)
to Secondary TAPs. This Single Protocol Is
Used to Address and Configure the
Secondary Scan Path.
· LASP (8986) and ASP (8996) Can Be
Configured on the Same Backplane Using
Similar Shadow Protocols
· Linking Shadow Protocols Can Occur in Any
of Test Logic Reset, Run Test/Idle, Pause DR,
Pause IR TAP States to Provide
Board-to-Board and Built In Self Test
· Bypass (BYP5–BYP0) Forces Primary to
Configured Secondary Paths Without Use of
Linking Shadow Protocols
· Connect (CON2–CON0) Provides Indication of
Primary-to-Secondary Paths Connections
· Secondary TAPs Can Be Configured at High
Impedance Via the OE Input to Allow an
Alternate Test Master to Take Control of the
Secondary TAPs
· High-Drive Outputs (–32 mA IOH, 64 mA IOL)
Support Backplane Interface at Primary
Outputs and High Fanout at Secondary
Outputs
· While Powered at 3.3 V, Both Primary and
Secondary TAPs Are Fully 5 V Tolerant for
Interfacing 5 V and/or 3.3 V Masters and
Targets
· Package Options Include Plastic BGA (GGV)
and LQFP (PM) Packages and Ceramic Quad
Flat (HV) Packages Using 25-mil
Center-to-Center Spacing
DESCRIPTION/ORDERING INFORMATION
The 'LVT8986 linking addressable scan ports (LASPs) are members of the TI family of IEEE Std 1149.1 (JTAG)
scan-support products. The scan-support product family facilitates testing of fully boundary-scannable devices.
The LASP applies linking shadow protocols through the test access port (TAP) to extend scan access to the
system level and divide scan chains at the board level.
The LASP consists of a primary TAP for interfacing to the backplane IEEE Std 1149.1 serial-bus signals (PTDI,
PTMS, PTCK, PTDO, PRTST) and three secondary TAPs for interfacing to the board-level IEEE Std 1149.1
serial-bus signals. Each secondary TAP consists of signals STDIx, STMSx, STCKx, STDOx, and STRSTx.
Conceptually, the LASP is a gateway device that can be used to connect a set of primary TAP signals to a set of
secondary TAP signals – for example, to interface backplane TAP signals to a board-level TAP. The LASP
provides all signal buffering that might be required at these two interfaces. Primary-to-secondary TAP
connections can be configured with the help of linking shadow protocol or protocol bypass (BYP5–BYP0) inputs.
All possible configurations are tabulated in Function Tables 1, 2, and 3.
SN74LVT8986ZGV产品属性
- 类型
描述
- 型号
SN74LVT8986ZGV
- 功能描述
特定功能逻辑 Linking Addressable Scan Ports 3.3v
- RoHS
否
- 制造商
Texas Instruments
- 系列
SN74ABTH18502A
- 工作电源电压
5 V
- 封装/箱体
LQFP-64
- 封装
Tube
| 供应商 | 型号 | 品牌 | 批号 | 封装 | 库存 | 备注 | 价格 |
|---|---|---|---|---|---|---|---|
TexasInstruments |
18+ |
ICLINKADDRSSSCAN-PORT64- |
6800 |
公司原装现货/欢迎来电咨询! |
|||
TI |
16+ |
UBGA |
10000 |
原装正品 |
|||
Texas Instruments |
24+ |
64-BGA MICROSTAR(8x8) |
56200 |
一级代理/放心采购 |
|||
TI |
25+ |
BGA-64 |
348 |
就找我吧!--邀您体验愉快问购元件! |
|||
TI |
23+ |
N/A |
7560 |
原厂原装 |
|||
TI |
22+ |
64BGA MICROSTAR |
9000 |
原厂渠道,现货配单 |
|||
TI/德州仪器 |
23+ |
BGA64 |
11200 |
原厂授权一级代理、全球订货优势渠道、可提供一站式BO |
|||
TI/德州仪器 |
24+ |
BGA64 |
225 |
只供应原装正品 欢迎询价 |
|||
TI |
23+ |
BGA64 |
8560 |
受权代理!全新原装现货特价热卖! |
|||
Texas Instruments(德州仪器) |
24+ |
690000 |
代理渠道/支持实单/只做原装 |
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Datasheet数据表PDF页码索引
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