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SN74LVT8986PMG4中文资料

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SN74LVT8986PMG4

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1041.7Kbytes

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55

功能描述

3.3-V LINKING ADDRESSABLE SCAN PORTS MULTIDROP-ADDRESSABLE IEEE STD 1149.1 (JTAG) TAP TRANSCEIVERS

数据手册

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生产厂商

TI2

SN74LVT8986PMG4数据手册规格书PDF详情

FEATURES

· Members of the Texas Instruments (TI) Family

of JTAG Scan-Support Products

· Extend Scan Access From Board Level to

Higher Level of System Integration

· Three IEEE Std 1149.1-Compatible

Configurable Secondary Scan Paths to One

Primary Scan Path

· Multiple Devices Can Be Cascaded to Link 24

Secondary Scan Paths to One Primary Scan

Path

· Simple (Linking Shadow) Protocol Is Used to

Connect the Primary Test Access Port (TAP)

to Secondary TAPs. This Single Protocol Is

Used to Address and Configure the

Secondary Scan Path.

· LASP (8986) and ASP (8996) Can Be

Configured on the Same Backplane Using

Similar Shadow Protocols

· Linking Shadow Protocols Can Occur in Any

of Test Logic Reset, Run Test/Idle, Pause DR,

Pause IR TAP States to Provide

Board-to-Board and Built In Self Test

· Bypass (BYP5–BYP0) Forces Primary to

Configured Secondary Paths Without Use of

Linking Shadow Protocols

· Connect (CON2–CON0) Provides Indication of

Primary-to-Secondary Paths Connections

· Secondary TAPs Can Be Configured at High

Impedance Via the OE Input to Allow an

Alternate Test Master to Take Control of the

Secondary TAPs

· High-Drive Outputs (–32 mA IOH, 64 mA IOL)

Support Backplane Interface at Primary

Outputs and High Fanout at Secondary

Outputs

· While Powered at 3.3 V, Both Primary and

Secondary TAPs Are Fully 5 V Tolerant for

Interfacing 5 V and/or 3.3 V Masters and

Targets

· Package Options Include Plastic BGA (GGV)

and LQFP (PM) Packages and Ceramic Quad

Flat (HV) Packages Using 25-mil

Center-to-Center Spacing

DESCRIPTION/ORDERING INFORMATION

The 'LVT8986 linking addressable scan ports (LASPs) are members of the TI family of IEEE Std 1149.1 (JTAG)

scan-support products. The scan-support product family facilitates testing of fully boundary-scannable devices.

The LASP applies linking shadow protocols through the test access port (TAP) to extend scan access to the

system level and divide scan chains at the board level.

The LASP consists of a primary TAP for interfacing to the backplane IEEE Std 1149.1 serial-bus signals (PTDI,

PTMS, PTCK, PTDO, PRTST) and three secondary TAPs for interfacing to the board-level IEEE Std 1149.1

serial-bus signals. Each secondary TAP consists of signals STDIx, STMSx, STCKx, STDOx, and STRSTx.

Conceptually, the LASP is a gateway device that can be used to connect a set of primary TAP signals to a set of

secondary TAP signals – for example, to interface backplane TAP signals to a board-level TAP. The LASP

provides all signal buffering that might be required at these two interfaces. Primary-to-secondary TAP

connections can be configured with the help of linking shadow protocol or protocol bypass (BYP5–BYP0) inputs.

All possible configurations are tabulated in Function Tables 1, 2, and 3.

更新时间:2025-11-29 8:30:00
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