Members of the Texas Instruments (TIE)

SCOPE E Family of Testability Products

Members of the TI WidebusE Family

State-of-the-Art 3.3-V ABT Design Supports

Mixed-Mode Signal Operation (5-V Input

and Output Voltages With 3.3-V VCC)

Support Unregulated Battery Operation

Down to 2.7 V

UBT E (Universal Bus Transceiver)

Combines D-Type Latches and D-Type

Flip-Flops for Operation in Transparent,

Latched, or Clocked Mode

Bus Hold on Data Inputs Eliminates the

Need for External Pullup/Pulldown

Resistors

B-Port Outputs of ’LVTH182514 Devices

Have Equivalent 25-W Series Resistors, So

No External Resistors Are Required

Compatible With the IEEE Std 1149.1-1990

(JTAG) Test Access Port and

Boundary-Scan Architecture

SCOPE E Instruction Set

– IEEE Std 1149.1-1990 Required

Instructions and Optional CLAMP and

HIGHZ

– Parallel-Signature Analysis at Inputs

– Pseudo-Random Pattern Generation

From Outputs

– Sample Inputs/Toggle Outputs

– Binary Count From Outputs

– Device Identification

– Even-Parity Opcodes

Package Options Include 64-Pin Plastic

Thin Shrink Small-Outline (DGG) and 64-Pin

Ceramic Dual Flat (HKC) Packages Using

0.5-mm Center-to-Center Spacings

description

The ’LVTH18514 and ’LVTH182514 scan test devices with 20-bit universal bus transceivers are members of

the TI SCOPE testability integrated-circuit family. This family of devices supports IEEE Std 1149.1-1990

boundary scan to facilitate testing of complex circuit-board assemblies. Scan access to the test circuitry is

accomplished via the 4-wire test access port (TAP) interface.

Additionally, these devices are designed specifically for low-voltage (3.3-V) VCC operation, but with the

capability to provide a TTL interface to a 5-V system environment.