1 Features

• VID V62/26602

• Radiation - total ionizing dose (TID):

– TID characterized up to 50krad(Si)

– TID performance assurance up to 30krad(Si)

– Radiation Lot Acceptance Testing (RLAT) for every wafer lot up to 30krad(Si)

• Radiation - single-event effects (SEE):

– Single event latch-up (SEL) immune up to 50MeV-cm2/mg at 125°C

– Single event transient (SET) characterized up to LET = 50MeV-cm2/mg

• Wide operating range from 1.2V to 5.5V

• 5.5V tolerant input pins

• Supports standard pinouts

• Up to 150Mbps with 5V or 3.3V VCC

• Latch-up performance exceeds 100mA per JESD 78

• Space enhanced plastic:

– Supports Defense and Aerospace Applications

– Controlled baseline

– Au bond-wire and NiPdAu lead finish

– Meets NASA ASTM E595 out gassing specification

– One fabrication, assembly, and test site

– Extended product life cycle

– Product traceability