1 Features

• Vendor item drawing available, VID

V62/23632-01XE

• Total ionizing dose characterized at 30 krad (Si)

– Total ionizing dose radiation lot acceptance

testing (TID RLAT) for every wafer lot to 30

krad (Si)

• Single-event effects (SEE) characterized:

– Single event latch-up (SEL) immune to linear

energy transfer (LET) = 43 MeV-cm2 /mg

– Single event transient (SET) characterized to

43 MeV-cm2 /mg

• Wide operating range of 1.2 V to 5.5 V

• Single-supply translating gates at 5/3.3/2.5/1.8/1.2

V VCC

– TTL compatible inputs:

• Up translation:

– 1.8-V – Inputs from 1.2 V

– 2.5-V – Inputs from 1.8 V

– 3.3-V – Inputs from 1.8 V, 2.5 V

– 5.0-V – Inputs from 2.5 V, 3.3 V

• Down translation:

– 1.2-V – Inputs from 1.8 V, 2.5 V, 3.3 V,

5.0 V

– 1.8-V – Inputs from 2.5 V, 3.3 V, 5.0 V

– 2.5-V – Inputs from 3.3 V, 5.0 V

– 3.3-V – Inputs from 5.0 V

• 5.5 V tolerant input pins

• Output drive up to 25 mA AT 5-V

• Latch-up performance exceeds 250 mA per

JESD 17

• Space enhanced plastic (SEP)

– Controlled baseline

– Gold bondwire

– NiPdAu lead finish

– One assembly and test site

– One fabrication site

– Military (–55°C to 125°C) temperature range

– Extended product life cycle

– Product traceability

– Meets NASAs ASTM E595 outgassing

specification

2 Applications

• Enable or disable a digital signal

• Controlling an indicator LED

• Translation between communication modules and

system controllers

3 Description

The SN54SC2T74-SEP contains two independent Dtype

positive-edge-triggered flip-flops. A low level at

the preset (PRE) input sets the output high. A low

level at the clear (CLR) input resets the output low.

Preset and clear functions are asynchronous and not

dependent on the levels of the other inputs. When

PRE and CLR are inactive (high), data at the data

(D) input meeting the setup time requirements is

transferred to the outputs (Q, Q) on the positive-going

edge of the clock (CLK) pulse. Clock triggering occurs

at a voltage level and is not directly related to the

rise time of the input clock (CLK) signal. Following

the hold-time interval, data at the data (D) input can

be changed without affecting the levels at the outputs

(Q, Q). The output level is referenced to the supply

voltage (VCC) and supports 1.8-V, 2.5-V, 3.3-V, and

5-V CMOS levels.

The input is designed with a lower threshold circuit to

support up translation for lower voltage CMOS inputs

(for example, 1.2 V input to 1.8 V output or 1.8 V input

to 3.3 V output). In addition, the 5-V tolerant input pins

enable down translation (for example, 3.3 V to 2.5 V

output).