3.3-V 10-BIT ADDRESSABLE SCAN PORTS MULTIDROP-ADDRESSABLE IEEE STD 1149.1 (JTAG) TAP TRANSCEIVERS

Members of the Texas Instruments (TIE) Broad Family of Testability Products Supporting IEEE Std 1149.1-1990 (JTAG) Test Access Port (TAP) and Boundary-Scan Architecture Extend Scan Access From Board Level to Higher Levels of System Integration Promote Reuse of Lower-Level Chip/Board) Tests

3.3V ABT 10 位可寻址扫描端口、多点可寻址 IEEE 标准 1149.1 (JTAG) TAP 收发器

The 'LVT8996 10-bit addressable scan ports (ASP) are members of the Texas Instruments SCOPETM testability integrated-circuit family. This family of devices supports IEEE Std 1149.1-1990 boundary scan to facilitate testing of complex circuit assemblies. Unlike most SCOPETM devices, the ASP is not a b • Members of the Texas Instruments (TI TM) Broad Family of Testability Products Supporting IEEE Std 1149.1-1990 (JTAG) Test Access Port (TAP) and Boundary-Scan Architecture\n• Promote Reuse of Lower-Level (Chip/Board) Tests in System Environment\n• Switch-Based Architecture Allows Direct Connect of ;

3.3-V 10-BIT ADDRESSABLE SCAN PORTS MULTIDROP-ADDRESSABLE IEEE STD 1149.1 JTAG TAP TRANSCEIVERS

文件：717.8 Kbytes Page：44 Pages

3.3-V 10-BIT ADDRESSABLE SCAN PORTS MULTIDROP-ADDRESSABLE IEEE STD 1149.1 (JTAG) TAP TRANSCEIVERS

文件：603.55 Kbytes Page：41 Pages

3.3-V 10-BIT ADDRESSABLE SCAN PORTS MULTIDROP-ADDRESSABLE IEEE STD 1149.1 (JTAG) TAP TRANSCEIVERS

Members of the Texas Instruments (TIE) Broad Family of Testability Products Supporting IEEE Std 1149.1-1990 (JTAG) Test Access Port (TAP) and Boundary-Scan Architecture Extend Scan Access From Board Level to Higher Levels of System Integration Promote Reuse of Lower-Level Chip/Board) Tests

3.3-V 10-BIT ADDRESSABLE SCAN PORTS MULTIDROP-ADDRESSABLE IEEE STD 1149.1 (JTAG) TAP TRANSCEIVERS

Members of the Texas Instruments (TIE) Broad Family of Testability Products Supporting IEEE Std 1149.1-1990 (JTAG) Test Access Port (TAP) and Boundary-Scan Architecture Extend Scan Access From Board Level to Higher Levels of System Integration Promote Reuse of Lower-Level Chip/Board) Tests

增强型产品 3.3V Abt 10 位多点可寻址 Ieee Std 1149.1 Tap 收发器

The SN74LVT8996 10-bit addressable scan port (ASP) is a member of the Texas Instruments SCOPE™ testability integrated-circuit family. This family of devices supports IEEE Std 1149.1-1990 boundary scan to facilitate testing of complex circuit assemblies. Unlike most SCOPE™ devices, the ASP is not a b • Controlled Baseline \n• Enhanced Diminishing Manufacturing Sources (DMS) Support\n• Qualification Pedigree\n• Extends Scan Access From Board Level to Higher Levels of System Integration\n• While Powered at 3.3 V, Both the Primary and Secondary TAPs Are Fully 5-V Tolerant for Interfacing to 5-V and;

3.3-V 10-BIT ADDRESSABLE SCAN PORTS MULTIDROP-ADDRESSABLE IEEE STD 1149.1 (JTAG) TAP TRANSCEIVERS

Members of the Texas Instruments (TIE) Broad Family of Testability Products Supporting IEEE Std 1149.1-1990 (JTAG) Test Access Port (TAP) and Boundary-Scan Architecture Extend Scan Access From Board Level to Higher Levels of System Integration Promote Reuse of Lower-Level Chip/Board) Tests

丝印代码：LX8996；3.3-V 10-BIT ADDRESSABLE SCAN PORTS MULTIDROP-ADDRESSABLE IEEE STD 1149.1 (JTAG) TAP TRANSCEIVERS

Members of the Texas Instruments (TIE) Broad Family of Testability Products Supporting IEEE Std 1149.1-1990 (JTAG) Test Access Port (TAP) and Boundary-Scan Architecture Extend Scan Access From Board Level to Higher Levels of System Integration Promote Reuse of Lower-Level Chip/Board) Tests

丝印代码：LX8996；3.3-V 10-BIT ADDRESSABLE SCAN PORTS MULTIDROP-ADDRESSABLE IEEE STD 1149.1 (JTAG) TAP TRANSCEIVERS

Members of the Texas Instruments (TIE) Broad Family of Testability Products Supporting IEEE Std 1149.1-1990 (JTAG) Test Access Port (TAP) and Boundary-Scan Architecture Extend Scan Access From Board Level to Higher Levels of System Integration Promote Reuse of Lower-Level Chip/Board) Tests

丝印代码：LX8996；3.3-V 10-BIT ADDRESSABLE SCAN PORTS MULTIDROP-ADDRESSABLE IEEE STD 1149.1 (JTAG) TAP TRANSCEIVERS

Members of the Texas Instruments (TIE) Broad Family of Testability Products Supporting IEEE Std 1149.1-1990 (JTAG) Test Access Port (TAP) and Boundary-Scan Architecture Extend Scan Access From Board Level to Higher Levels of System Integration Promote Reuse of Lower-Level Chip/Board) Tests

3.3-V 10-BIT ADDRESSABLE SCAN PORTS MULTIDROP-ADDRESSABLE IEEE STD 1149.1 JTAG TAP TRANSCEIVERS

文件：717.8 Kbytes Page：44 Pages

3.3-V 10-BIT ADDRESSABLE SCAN PORTS MULTIDROP-ADDRESSABLE IEEE STD 1149.1 JTAG TAP TRANSCEIVERS

文件：717.8 Kbytes Page：44 Pages

封装/外壳：24-SOIC（0.295"，7.50mm 宽） 包装：卷带（TR）剪切带（CT）Digi-Reel® 得捷定制卷带 描述：IC 10-BIT SCAN PORT XCVR 24-SOIC 集成电路（IC） 专用逻辑器件

3.3-V 10-BIT ADDRESSABLE SCAN PORT MULTIDROP-ADDRESSABLE IEEE STD 1149.1 (KTAG) TAP TRANSCEIVER

文件：764.19 Kbytes Page：42 Pages

封装/外壳：24-TSSOP（0.173"，4.40mm 宽） 包装：卷带（TR）剪切带（CT）Digi-Reel® 得捷定制卷带 描述：IC 10B ADDRSBL SCAN PORT 24TSSOP 集成电路（IC） 专用逻辑器件

3.3-V 10-BIT ADDRESSABLE SCAN PORT MULTIDROP-ADDRESSABLE IEEE STD 1149.1 (KTAG) TAP TRANSCEIVER

文件：764.19 Kbytes Page：42 Pages

3.3-V 10-BIT ADDRESSABLE SCAN PORTS MULTIDROP-ADDRESSABLE IEEE STD 1149.1 JTAG TAP TRANSCEIVERS

文件：717.8 Kbytes Page：44 Pages

3.3-V 10-BIT ADDRESSABLE SCAN PORTS MULTIDROP-ADDRESSABLE IEEE STD 1149.1 JTAG TAP TRANSCEIVERS

文件：717.8 Kbytes Page：44 Pages