DUAL POSITIVE-EDGE-TRIGGERED D-TYPE FLIP-FLOP WITH CLEAR AND PRESET

Controlled Baseline – One Assembly/Test Site, One Fabrication Site Extended Temperature Performance of –55°C to 125°C Enhanced Diminishing Manufacturing Sources (DMS) Support Enhanced Product-Change Notification Qualification Pedigree† EPIC (Enhanced-Performance Implanted CMOS) Process

Dual D-type flip-flop with set and reset; positive-edge trigger

DESCRIPTION The 74AHC/AHCT74 are high-speed Si-gate CMOS devices and are pin compatible with low power Schottky TTL (LSTTL). They are specified in compliance with JEDEC standard No. 7A. FEATURES • ESD protection: HBM EIA/JESD22-A114-A exceeds 2000 V MM EIA/JESD22-A115-A exceeds 200 V

Dual D-type flip-flop with set and reset; positive-edge trigger

1. General description The 74AHC74; 74AHCT74 is a high-speed Si-gate CMOS device and is pin compatible with Low-Power Schottky TTL (LSTTL). It is specified in compliance with JEDEC standard No. 7-A. The 74AHC74; 74AHCT74 is a dual positive-edge triggered, D-type flip-flop with individual data

Dual D-type flip-flop with set and reset; positive-edge trigger

1. General description The 74AHC74; 74AHCT74 is a high-speed Si-gate CMOS device and is pin compatible with Low-Power Schottky TTL (LSTTL). It is specified in compliance with JEDEC standard No. 7-A. The 74AHC74; 74AHCT74 is a dual positive-edge triggered, D-type flip-flop with individual data

Dual D-type flip-flop with set and reset; positive-edge trigger

Dual D-type flip-flop with set and reset; positive-edge trigger

DESCRIPTION The 74AHC/AHCT74 are high-speed Si-gate CMOS devices and are pin compatible with low power Schottky TTL (LSTTL). They are specified in compliance with JEDEC standard No. 7A. FEATURES • ESD protection: HBM EIA/JESD22-A114-A exceeds 2000 V MM EIA/JESD22-A115-A exceeds 200 V