SCAN-PATH LINKERS WITH 4-BIT IDENTIFICATION BUSES SCAN-CONTROLLED IEEE STD 1149.1 (JTAG) TAP CONCATENATORS

Members of the Texas Instruments SCOPE E Family of Testability Products Compatible With the IEEE Standard 1149.1-1990 (JTAG) Serial Test Bus Allow Partitioning of System Scan Paths Can Be Cascaded Horizontally or Vertically Select Up to Four Secondary Scan Paths to Be Included in a Primary

SCAN-PATH LINKERS WITH 4-BIT IDENTIFICATION BUSES SCAN-CONTROLLED IEEE STD 1149.1 JTAG TAP CONCATENATORS

文件：335.5 Kbytes Page：28 Pages

封装/外壳：28-SOIC（0.295"，7.50mm 宽） 包装：卷带（TR）剪切带（CT）Digi-Reel® 得捷定制卷带 描述：IC SCAN-PATH LINKER 28-SOIC 集成电路（IC） 专用逻辑器件

SCAN-PATH LINKERS WITH 4-BIT IDENTIFICATION BUSES SCAN-CONTROLLED IEEE STD 1149.1 (JTAG) TAP CONCATENATORS

Members of the Texas Instruments SCOPE E Family of Testability Products Compatible With the IEEE Standard 1149.1-1990 (JTAG) Serial Test Bus Allow Partitioning of System Scan Paths Can Be Cascaded Horizontally or Vertically Select Up to Four Secondary Scan Paths to Be Included in a Primary

SCAN-PATH LINKERS WITH 4-BIT IDENTIFICATION BUSES SCAN-CONTROLLED IEEE STD 1149.1 JTAG TAP CONCATENATORS

文件：335.5 Kbytes Page：28 Pages

SCAN-PATH LINKERS WITH 4-BIT IDENTIFICATION BUSES SCAN-CONTROLLED IEEE STD 1149.1 (JTAG) TAP CONCATENATORS

Members of the Texas Instruments SCOPE E Family of Testability Products Compatible With the IEEE Standard 1149.1-1990 (JTAG) Serial Test Bus Allow Partitioning of System Scan Paths Can Be Cascaded Horizontally or Vertically Select Up to Four Secondary Scan Paths to Be Included in a Primary

SCAN-PATH LINKERS WITH 4-BIT IDENTIFICATION BUSES SCAN-CONTROLLED IEEE STD 1149.1 JTAG TAP CONCATENATORS

文件：335.5 Kbytes Page：28 Pages

封装/外壳：28-SOIC（0.295"，7.50mm 宽） 包装：卷带（TR）剪切带（CT）Digi-Reel® 得捷定制卷带 描述：IC SCAN-PATH LINKER 28-SOIC 集成电路（IC） 专用逻辑器件