SCAN TEST DEVICES WITH OCTAL BUS TRANSCEIVERS AND REGISTERS

Members of the Texas Instruments SCOPE E Family of Testability Products Compatible With the IEEE Standard 1149.1-1990 (JTAG) Test Access Port and Boundary-Scan Architecture Functionally Equivalent to ’F652 and ABT652 in the Normal-Function Mode SCOPE E Instruction Set – IEEE Standard 1149.

SCAN TEST DEVICES WITH OCTAL BUS TRANSCEIVERS AND REGISTERS

Members of the Texas Instruments SCOPE E Family of Testability Products Compatible With the IEEE Standard 1149.1-1990 (JTAG) Test Access Port and Boundary-Scan Architecture Functionally Equivalent to ’F652 and ABT652 in the Normal-Function Mode SCOPE E Instruction Set – IEEE Standard 1149.

SCAN TEST DEVICES WITH OCTAL BUS TRANSCEIVERS AND REGISTERS

文件：366.98 Kbytes Page：25 Pages

SCAN TEST DEVICES WITH OCTAL BUS TRANSCEIVERS AND REGISTERS

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SCAN TEST DEVICES WITH OCTAL BUS TRANSCEIVERS AND REGISTERS

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SCAN TEST DEVICES WITH OCTAL BUS TRANSCEIVERS AND REGISTERS

文件：366.98 Kbytes Page：25 Pages