型号 功能描述 生产厂家 企业 LOGO 操作

QUADRUPLE BUS BUFFER GATES WITH 3-STATE OUTPUTS

State-of-the-Art BiCMOS Design Significantly Reduces ICCZ ESD Protection Exceeds 2000 V Per MIL-STD-883C, Method 3015 3-State Outputs Drive Bus Lines or Buffer Memory Address Registers Package Options Include Plastic Small-Outline (D) Packages, Ceramic Chip Carriers (FK) and Flatpacks (W),

TI

德州仪器

QUADRUPLE BUS BUFFER GATES WITH 3-STATE OUTPUTS

State-of-the-Art BiCMOS Design Significantly Reduces ICCZ ESD Protection Exceeds 2000 V Per MIL-STD-883C, Method 3015 3-State Outputs Drive Bus Lines or Buffer Memory Address Registers Package Options Include Plastic Small-Outline (D) Packages, Ceramic Chip Carriers (FK) and Flatpacks (W),

TI

德州仪器

QUADRUPLE BUS BUFFER GATES WITH 3-STATE OUTPUTS

State-of-the-Art BiCMOS Design Significantly Reduces ICCZ ESD Protection Exceeds 2000 V Per MIL-STD-883C, Method 3015 3-State Outputs Drive Bus Lines or Buffer Memory Address Registers Package Options Include Plastic Small-Outline (D) Packages, Ceramic Chip Carriers (FK) and Flatpacks (W),

TI

德州仪器

OCTAL BUFFERS AND LINE/MOS DRIVERS WITH 3-STATE OUTPUTS

Operating Voltage Range of 4.5 V to 5.5 V State-of-the-Art BiCMOS Design Significantly Reduces ICCZ Output Ports Have Equivalent 33-Ω Series Resistors, So No External Resistors Are Required 3-State Outputs Drive Bus Lines or Buffer Memory Address Registers description/ordering informatio

TI

德州仪器

25-Q OCTAL BUS TRANSCEIVERS WITH 3-STATE OUTPUTS

• State-of-the-Art BiCMOS Design Significantly Reduces ICCZ • ESD Protection Exceeds 2000 V Per MIL-STD-883C, Method 3015; Exceeds 200 V Using Machine Model (C = 200 pF, R = 0) • Designed to Facilitate Incident-Wave Switching for Line Impedances of 25 Ω or Greater • Distributed VCC and GN

TI

德州仪器

10-BIT BUS/MOS MEMORY DRIVERS WITH 3-STATE OUTPUTS

BiCMOS Design Substantially Reduces ICCZ Output Ports Have Equivalent 25-Ω Resistors; No External Resistors Are Required Specifically Designed to Drive MOS DRAMs 3-State Outputs Drive Bus Lines or Buffer Memory Address Registers Flow-Through Architecture Optimizes PCB Layout Power-Up High

TI

德州仪器

10-BIT BUFFERS/DRIVERS WITH 3-STATE OUTPUTS

• State-of-the-Art BiCMOS Design Significantly Reduces ICCZ • ESD Protection Exceeds 2000 V Per MIL-STD-883C, Method 3015; Exceeds 200 V Using Machine Model (C = 200 pF, R = 0) • 3-State Outputs Drive Bus Lines or Buffer Memory Address Registers • P-N-P Inputs Reduce DC Loading • Flow-Thr

TI

德州仪器

9-BIT BUS TRANSCEIVERS WITH 3-STATE OUTPUTS

• BiCMOS Design Substantially Reduces ICCZ • Functionally Equivalent to ′ALS29863 and AMD Am29863A • Power-Up High-Impedance State • ESD Protection Exceeds 2000 V Per MIL-STD-883C, Method 3015 • Package Options Include Plastic Small-Outline Packages (DW), Ceramic Chip Carriers (FK) and Fla

TI

德州仪器

OCTAL TRANSPARENT D-TYPE LATCHES WITH 3-STATE OUTPUTS

Operating Voltage Range of 4.5 V to 5.5 V State-of-the-Art BiCMOS Design Significantly Reduces ICCZ Full Parallel Access for Loading 3-State Outputs Drive Bus Lines or Buffer Memory Address Registers ESD Protection Exceeds JESD 22 – 2000-V Human-Body Model (A114-A) description/ordering i

TI

德州仪器

OCTAL BUFFERS/DRIVERS WITH 3-STATE OUTPUTS

Operating Voltage Range of 4.5 V to 5.5 V State-of-the-Art BiCMOS Design Significantly Reduces ICCZ 3-State Outputs Drive Bus Lines or Buffer Memory Address Registers P-N-P Inputs Reduce DC Loading Data Flow-Through Pinout (All Inputs on Opposite Side From Outputs) ESD Protection Exceeds J

TI

德州仪器

OCTAL REGISTERED TRANSCEIVERS WITH 3-STATE OUTPUTS

State-of-the-Art BiCMOS Design Significantly Reduces ICCZ 3-State True Outputs Back-to-Back Registers for Storage ESD Protection Exceeds 2000 V Per MIL-STD-883C, Method 3015 Package Options Include Plastic Small-Outline Packages (DW), Ceramic Chip Carriers (FK) and Flatpacks (W), and Plas

TI

德州仪器

OCTAL TRANSPARENT D-TYPE LATCHES WITH 3-STATE OUTPUTS

Operating Voltage Range of 4.5 V to 5.5 V State-of-the-Art BiCMOS Design Significantly Reduces ICCZ Full Parallel Access for Loading ESD Protection Exceeds JESD 22 − 2000-V Human-Body Model (A114-A) − 200-V Machine Model (A115-A) − 1000-V Charged-Device Model (C101) description/ordering

TI

德州仪器

OCTAL TRANSPARENT D-TYPE FLIP-FLOPS WITH 3-STATE OUTPUTS

Operating Voltage Range of 4.5 V to 5.5 V State-of-the-Art BiCMOS Design Significantly Reduces ICCZ Full Parallel Access for Loading ESD Protection Exceeds JESD 22 − 2000-V Human-Body Model (A114-A) − 200-V Machine Model (A115-A) − 1000-V Charged-Device Model (C101) description/ordering

TI

德州仪器

OCTAL BUS TRANSCEIVERS WITH 3-STATE OUTPUTS

State-of-the-Art BiCMOS Design Significantly Reduces ICCZ ESD Protection Exceeds 2000 V Per MIL-STD-883C, Method 3015 Package Options Include Plastic Small-Outline (DW) Packages, Ceramic Chip Carriers (FK) and Flatpacks (W), and Plastic and Ceramic 300-mil DIPs (J, N) description The ′B

TI

德州仪器

OCTAL BUS TRANSCEIVERS AND REGISTERS WITH 3-STATE OUTPUTS

State-of-the-Art BiCMOS Design Significantly Reduces ICCZ Bus Transceivers/Registers Independent Registers and Enables for A and B Buses Multiplexed Real-Time and Stored Data ESD Protection Exceeds JESD 22 − 2000-V Human-Body Model (A114-A) − 200-V Machine Model (A115-A) description/ord

TI

德州仪器

OCTAL BUS TRANSCEIVERS AND REGISTERS WITH 3-STATE OUTPUTS

State-of-the-Art BiCMOS Design Significantly Reduces ICCZ ESD Protection Exceeds 2000 V Per MIL-STD-883C, Method 3015; Exceeds 200 V Using Machine Model (C = 200 pF, R = 0) Independent Registers and Enables for A and B Buses Multiplexed Real-Time and Stored Data Power-Up High-Impedance Mo

TI

德州仪器

OCTAL BUFFER/DRIVER WITH OPEN-COLLECTOR OUTPUTS

FEATURES · Controlled Baseline – One Assembly/Test Site, One Fabrication Site · Extended Temperature Performance of –55°C to 125°C · Enhanced Diminishing Manufacturing Sources (DMS) Support · Enhanced Product-Change Notification · Qualification Pedigree (1) · Open-Collector Version of 'B

TI

德州仪器

SCAN TEST DEVICES WITH OCTAL INVERTING BUFFERS

Members of the Texas Instruments SCOPE E Family of Testability Products Octal Test-Integrated Circuits Functionally Equivalent to ’F240 and ’BCT240 in the Normal-Function Mode Compatible With the IEEE Standard 1149.1-1990 (JTAG) Test Access Port and Boundary-Scan Architecture Test Operatio

TI

德州仪器

SCAN TEST DEVICES WITH OCTAL BUFFERS

Members of the Texas Instruments SCOPE™ Family of Testability Products Octal Test-Integrated Circuits Functionally Equivalent to ’F244 and ’BCT244 in the Normal-Function Mode Compatible With the IEEE Standard 1149.1-1990 (JTAG) Test Access Port and Boundary-Scan Architecture Test Operation

TI

德州仪器

SCAN TEST DEVICES WITH OCTAL BUS TRANSCEIVERS

Members of the Texas Instruments SCOPE ™ Family of Testability Products Octal Test-Integrated Circuits Functionally Equivalent to ’F245 and BCT245 in the Normal- Function Mode Compatible With the IEEE Standard 1149.1-1990 (JTAG) Test Access Port and Boundary-Scan Architecture Test Operatio

TI

德州仪器

SCAN TEST DEVICES WITH OCTAL D-TYPE LATCHES

Members of the Texas Instruments SCOPE E Family of Testability Products Octal Test-Integrated Circuits Functionally Equivalent to ’F373 and BCT373 in the Normal-Function Mode Compatible With the IEEE Standard 1149.1-1990 (JTAG) Test Access Port and Boundary-Scan Architecture Test Operation

TI

德州仪器

SCAN TEST DEVICES WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS

Members of the Texas Instruments SCOPE  Family of Testability Products Octal Test-Integrated Circuits Functionally Equivalent to ’F374 and ’BCT374 in the Normal-Function Mode Compatible With the IEEE Standard 1149.1-1990 (JTAG) Test Access Port and Boundary-Scan Architecture Test Operatio

TI

德州仪器

QUADRUPLE BUS BUFFER GATES WITH 3-STATE OUTPUTS

文件:72.49 Kbytes Page:5 Pages

TI

德州仪器

QUADRUPLE BUS BUFFER GATES WITH 3-STATE OUTPUTS

文件:72.49 Kbytes Page:5 Pages

TI

德州仪器

QUADRUPLE BUS BUFFER GATES WITH 3-STATE OUTPUTS

文件:491.65 Kbytes Page:14 Pages

TI

德州仪器

QUADRUPLE BUS BUFFER GATES WITH 3-STATE OUTPUTS

文件:1.02454 Mbytes Page:18 Pages

TI

德州仪器

QUADRUPLE BUS BUFFER GATES WITH 3-STATE OUTPUTS

文件:1.02454 Mbytes Page:18 Pages

TI

德州仪器

QUADRUPLE BUS BUFFER GATES WITH 3-STATE OUTPUTS

文件:72.49 Kbytes Page:5 Pages

TI

德州仪器

QUADRUPLE BUS BUFFER GATES WITH 3-STATE OUTPUTS

文件:72.49 Kbytes Page:5 Pages

TI

德州仪器

QUADRUPLE BUS BUFFER GATES WITH 3-STATE OUTPUTS

文件:491.65 Kbytes Page:14 Pages

TI

德州仪器

QUADRUPLE BUS BUFFER GATES WITH 3-STATE OUTPUTS

文件:1.02454 Mbytes Page:18 Pages

TI

德州仪器

QUADRUPLE BUS BUFFER GATES WITH 3-STATE OUTPUTS

文件:72.49 Kbytes Page:5 Pages

TI

德州仪器

QUADRUPLE BUS BUFFER GATES WITH 3-STATE OUTPUTS

文件:70.26 Kbytes Page:5 Pages

TI

德州仪器

QUADRUPLE BUS BUFFER GATES WITH 3-STATE OUTPUTS

文件:237.26 Kbytes Page:10 Pages

TI

德州仪器

具有 TTL 兼容型 CMOS 输入和三态输出的军用 4 通道 4.5V 至 5.5V 缓冲器

TI

德州仪器

QUADRUPLE BUS BUFFER GATES WITH 3-STATE OUTPUTS

文件:237.26 Kbytes Page:10 Pages

TI

德州仪器

QUADRUPLE BUS BUFFER GATES WITH 3-STATE OUTPUTS

文件:70.26 Kbytes Page:5 Pages

TI

德州仪器

QUADRUPLE BUS BUFFER GATES WITH 3-STATE OUTPUTS

文件:70.26 Kbytes Page:5 Pages

TI

德州仪器

QUADRUPLE BUS BUFFER GATES WITH 3-STATE OUTPUTS

文件:237.26 Kbytes Page:10 Pages

TI

德州仪器

QUADRUPLE BUS BUFFER GATES WITH 3-STATE OUTPUTS

文件:70.26 Kbytes Page:5 Pages

TI

德州仪器

OCTAL BUFFERS AND LINE/MOS DRIVERS WITH 3-STATE OUTPUTS

文件:74.41 Kbytes Page:5 Pages

TI

德州仪器

OCTAL BUFFERS AND LINE/MOS DRIVERS WITH 3-STATE OUTPUTS

文件:252.3 Kbytes Page:11 Pages

TI

德州仪器

具有 TTL 兼容型 CMOS 输入和三态输出的军用 8 通道 4.5V 至 5.5V 反相器

TI

德州仪器

OCTAL BUFFERS AND LINE/MOS DRIVERS WITH 3-STATE OUTPUTS

文件:252.3 Kbytes Page:11 Pages

TI

德州仪器

OCTAL BUFFERS AND LINE/MOS DRIVERS WITH 3-STATE OUTPUTS

文件:74.41 Kbytes Page:5 Pages

TI

德州仪器

OCTAL BUFFERS AND LINE/MOS DRIVERS WITH 3-STATE OUTPUTS

文件:74.41 Kbytes Page:5 Pages

TI

德州仪器

OCTAL BUFFERS AND LINE/MOS DRIVERS WITH 3-STATE OUTPUTS

文件:74.41 Kbytes Page:5 Pages

TI

德州仪器

OCTAL BUFFERS AND LINE/MOS DRIVERS WITH 3-STATE OUTPUTS

文件:492.04 Kbytes Page:13 Pages

TI

德州仪器

OCTAL BUFFERS AND LINE/MOS DRIVERS WITH 3-STATE OUTPUTS

文件:664.97 Kbytes Page:16 Pages

TI

德州仪器

OCTAL BUFFERS AND LINE/MOS DRIVERS WITH 3-STATE OUTPUTS

文件:699.62 Kbytes Page:15 Pages

TI

德州仪器

具有三态输出的军用 8 通道 4.5V 至 5.5V 缓冲器

TI

德州仪器

OCTAL BUFFERS AND LINE/MOS DRIVERS WITH 3-STATE OUTPUTS

文件:664.97 Kbytes Page:16 Pages

TI

德州仪器

OCTAL BUFFERS AND LINE/MOS DRIVERS WITH 3-STATE OUTPUTS

文件:699.62 Kbytes Page:15 Pages

TI

德州仪器

OCTAL BUFFERS AND LINE/MOS DRIVERS WITH 3-STATE OUTPUTS

文件:492.04 Kbytes Page:13 Pages

TI

德州仪器

OCTAL BUFFERS AND LINE/MOS DRIVERS WITH 3-STATE OUTPUTS

文件:492.04 Kbytes Page:13 Pages

TI

德州仪器

OCTAL BUFFERS AND LINE/MOS DRIVERS WITH 3-STATE OUTPUTS

文件:492.04 Kbytes Page:13 Pages

TI

德州仪器

OCTAL BUFFERS/DRIVERS WITH 3-STATE OUTPUTS

文件:73.9 Kbytes Page:5 Pages

TI

德州仪器

OCTAL BUFFERS/DRIVERS WITH 3-STATE OUTPUTS

文件:1.27875 Mbytes Page:19 Pages

TI

德州仪器

OCTAL BUFFERS/DRIVERS WITH 3-STATE OUTPUTS

文件:1.27875 Mbytes Page:19 Pages

TI

德州仪器

OCTAL BUFFERS/DRIVERS WITH 3-STATE OUTPUTS

文件:73.9 Kbytes Page:5 Pages

TI

德州仪器

SN54BCT产品属性

  • 类型

    描述

  • 型号

    SN54BCT

  • 制造商

    Texas Instruments

  • 功能描述

    Buffer/Line Driver 4-CH Non-Inverting 3-ST BiCMOS 14-Pin CDIP Tube

  • 制造商

    Texas Instruments

  • 功能描述

    BFFR/LINE DRVR 4-CH NON-INV 3-ST BICMOS 14CDIP - Rail/Tube

更新时间:2025-11-6 18:10:00
IC供应商 芯片型号 品牌 批号 封装 库存 备注 价格
TI/德州仪器
23+
CDIP-14
9990
正规渠道,只有原装!
TI/德州仪器
21+
NA
12820
只做原装,质量保证
TI/德州仪器
2450+
NA
9850
只做原厂原装正品现货或订货假一赔十!
TI/德州仪器
22+
N/A
12245
现货,原厂原装假一罚十!
TI/德州仪器
23+
CDIP-14
5000
只有原装,欢迎来电咨询!
TI/德州仪器
24+
CDIP20
22055
郑重承诺只做原装进口现货
TI(德州仪器)
24+
DIP14
1476
原装现货,免费供样,技术支持,原厂对接
TI(德州仪器)
24+
DIP14
907
只做原装,提供一站式配单服务,代工代料。BOM配单
TI/德州仪器
23+
CDIP
11200
原厂授权一级代理、全球订货优势渠道、可提供一站式BO
TI德州仪器
22+
24000
原装正品现货,实单可谈,量大价优

SN54BCT数据表相关新闻