SCAN926260 Six 1 to 10 Bus LVDS Deserializers with IEEE 1149.1 and At-Speed BIST

1FEATURES 2• Deserializes One to Six Bus LVDS Input Serial Data Streams with Embedded Clocks • IEEE 1149.1 (JTAG) Compliant and At-Speed BIST Test Modes • Parallel Clock Rate 16-66MHz • On Chip Filtering for PLL • High Impedance Inputs Upon Power Off (Vcc = 0V) • Single Power Supply at +3

SCAN926260 Six 1 to 10 Bus LVDS Deserializers with IEEE 1149.1 and At-Speed BIST

1FEATURES 2• Deserializes One to Six Bus LVDS Input Serial Data Streams with Embedded Clocks • IEEE 1149.1 (JTAG) Compliant and At-Speed BIST Test Modes • Parallel Clock Rate 16-66MHz • On Chip Filtering for PLL • High Impedance Inputs Upon Power Off (Vcc = 0V) • Single Power Supply at +3

Six 1 to 10 Bus LVDS Deserializers with IEEE 1149.1 and At-Speed BIST

文件：372.15 Kbytes Page：18 Pages

Six 1 to 10 Bus LVDS Deserializers with IEEE 1149.1 and At-Speed BIST

文件：395.5 Kbytes Page：20 Pages

Six 1 to 10 Bus LVDS Deserializers with IEEE 1149.1 and At-Speed BIST

文件：395.5 Kbytes Page：20 Pages

SCAN926260 Six 1 to 10 Bus LVDS Deserializers with IEEE 1149.1 and At-Speed BIST

文件：1.25384 Mbytes Page：25 Pages