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型号 功能描述 生产厂家 企业 LOGO 操作
SCAN926260

SCAN926260 Six 1 to 10 Bus LVDS Deserializers with IEEE 1149.1 and At-Speed BIST

1FEATURES 2• Deserializes One to Six Bus LVDS Input Serial Data Streams with Embedded Clocks • IEEE 1149.1 (JTAG) Compliant and At-Speed BIST Test Modes • Parallel Clock Rate 16-66MHz • On Chip Filtering for PLL • High Impedance Inputs Upon Power Off (Vcc = 0V) • Single Power Supply at +3

TI

德州仪器

SCAN926260

具有 IEEE 1149.1 和全速度 BIST 的六个 1 至 10 总线 LVDS 解串器

The SCAN926260 integrates six 10-bit deserializer devices into a single chip. The SCAN926260 can simultaneously deserialize up to six data streams that have been serialized by TI’s 10-bit Bus LVDS serializers. In addition, the SCAN926260 is compliant with IEEE standard 1149.1 and also features an At • Deserializes One to Six Bus LVDS Input Serial Data Streams with Embedded Clocks\n• IEEE 1149.1 (JTAG) Compliant and At-Speed BIST Test Modes\n• Parallel Clock Rate 16-66MHz\n• On Chip Filtering for PLL\n• High Impedance Inputs Upon Power Off (Vcc = 0V)\n• Single Power Supply at +3.3V\n• 196-Pin NF;

TI

德州仪器

SCAN926260

Six 1 to 10 Bus LVDS Deserializers with IEEE 1149.1 and At-Speed BIST

文件:372.15 Kbytes Page:18 Pages

NSC

国半

SCAN926260

Six 1 to 10 Bus LVDS Deserializers with IEEE 1149.1 and At-Speed BIST

文件:395.5 Kbytes Page:20 Pages

NSC

国半

SCAN926260

Six 1 to 10 Bus LVDS Deserializers with IEEE 1149.1 and At-Speed BIST

文件:395.5 Kbytes Page:20 Pages

NSC

国半

SCAN926260

SCAN926260 Six 1 to 10 Bus LVDS Deserializers with IEEE 1149.1 and At-Speed BIST

文件:1.25384 Mbytes Page:25 Pages

TI

德州仪器

丝印代码:SCAN926260TUF;SCAN926260 Six 1 to 10 Bus LVDS Deserializers with IEEE 1149.1 and At-Speed BIST

1FEATURES 2• Deserializes One to Six Bus LVDS Input Serial Data Streams with Embedded Clocks • IEEE 1149.1 (JTAG) Compliant and At-Speed BIST Test Modes • Parallel Clock Rate 16-66MHz • On Chip Filtering for PLL • High Impedance Inputs Upon Power Off (Vcc = 0V) • Single Power Supply at +3

TI

德州仪器

丝印代码:SCAN926260TUF;SCAN926260 Six 1 to 10 Bus LVDS Deserializers with IEEE 1149.1 and At-Speed BIST

1FEATURES 2• Deserializes One to Six Bus LVDS Input Serial Data Streams with Embedded Clocks • IEEE 1149.1 (JTAG) Compliant and At-Speed BIST Test Modes • Parallel Clock Rate 16-66MHz • On Chip Filtering for PLL • High Impedance Inputs Upon Power Off (Vcc = 0V) • Single Power Supply at +3

TI

德州仪器

丝印代码:SCAN926260TUF;SCAN926260 Six 1 to 10 Bus LVDS Deserializers with IEEE 1149.1 and At-Speed BIST

1FEATURES 2• Deserializes One to Six Bus LVDS Input Serial Data Streams with Embedded Clocks • IEEE 1149.1 (JTAG) Compliant and At-Speed BIST Test Modes • Parallel Clock Rate 16-66MHz • On Chip Filtering for PLL • High Impedance Inputs Upon Power Off (Vcc = 0V) • Single Power Supply at +3

TI

德州仪器

丝印代码:SCAN926260TUF;SCAN926260 Six 1 to 10 Bus LVDS Deserializers with IEEE 1149.1 and At-Speed BIST

1FEATURES 2• Deserializes One to Six Bus LVDS Input Serial Data Streams with Embedded Clocks • IEEE 1149.1 (JTAG) Compliant and At-Speed BIST Test Modes • Parallel Clock Rate 16-66MHz • On Chip Filtering for PLL • High Impedance Inputs Upon Power Off (Vcc = 0V) • Single Power Supply at +3

TI

德州仪器

丝印代码:SCAN926260TUF;SCAN926260 Six 1 to 10 Bus LVDS Deserializers with IEEE 1149.1 and At-Speed BIST

1FEATURES 2• Deserializes One to Six Bus LVDS Input Serial Data Streams with Embedded Clocks • IEEE 1149.1 (JTAG) Compliant and At-Speed BIST Test Modes • Parallel Clock Rate 16-66MHz • On Chip Filtering for PLL • High Impedance Inputs Upon Power Off (Vcc = 0V) • Single Power Supply at +3

TI

德州仪器

丝印代码:SCAN926260TUF;SCAN926260 Six 1 to 10 Bus LVDS Deserializers with IEEE 1149.1 and At-Speed BIST

1FEATURES 2• Deserializes One to Six Bus LVDS Input Serial Data Streams with Embedded Clocks • IEEE 1149.1 (JTAG) Compliant and At-Speed BIST Test Modes • Parallel Clock Rate 16-66MHz • On Chip Filtering for PLL • High Impedance Inputs Upon Power Off (Vcc = 0V) • Single Power Supply at +3

TI

德州仪器

丝印代码:SCAN926260TUF;SCAN926260 Six 1 to 10 Bus LVDS Deserializers with IEEE 1149.1 and At-Speed BIST

1FEATURES 2• Deserializes One to Six Bus LVDS Input Serial Data Streams with Embedded Clocks • IEEE 1149.1 (JTAG) Compliant and At-Speed BIST Test Modes • Parallel Clock Rate 16-66MHz • On Chip Filtering for PLL • High Impedance Inputs Upon Power Off (Vcc = 0V) • Single Power Supply at +3

TI

德州仪器

丝印代码:SCAN926260TUF;SCAN926260 Six 1 to 10 Bus LVDS Deserializers with IEEE 1149.1 and At-Speed BIST

1FEATURES 2• Deserializes One to Six Bus LVDS Input Serial Data Streams with Embedded Clocks • IEEE 1149.1 (JTAG) Compliant and At-Speed BIST Test Modes • Parallel Clock Rate 16-66MHz • On Chip Filtering for PLL • High Impedance Inputs Upon Power Off (Vcc = 0V) • Single Power Supply at +3

TI

德州仪器

Six 1 to 10 Bus LVDS Deserializers with IEEE 1149.1 and At-Speed BIST

文件:395.5 Kbytes Page:20 Pages

NSC

国半

Six 1 to 10 Bus LVDS Deserializers with IEEE 1149.1 and At-Speed BIST

文件:395.5 Kbytes Page:20 Pages

NSC

国半

SCAN926260 Six 1 to 10 Bus LVDS Deserializers with IEEE 1149.1 and At-Speed BIST

文件:1.25384 Mbytes Page:25 Pages

TI

德州仪器

Six 1 to 10 Bus LVDS Deserializers with IEEE 1149.1 and At-Speed BIST

文件:372.15 Kbytes Page:18 Pages

NSC

国半

SCAN926260 Six 1 to 10 Bus LVDS Deserializers with IEEE 1149.1 and At-Speed BIST

文件:1.25384 Mbytes Page:25 Pages

TI

德州仪器

Six 1 to 10 Bus LVDS Deserializers with IEEE 1149.1 and At-Speed BIST

文件:395.5 Kbytes Page:20 Pages

NSC

国半

Six 1 to 10 Bus LVDS Deserializers with IEEE 1149.1 and At-Speed BIST

文件:395.5 Kbytes Page:20 Pages

NSC

国半

封装/外壳:196-LBGA 功能:解串器 包装:托盘 描述:IC DESERIALIZER X6 1:10 196LBGA 集成电路(IC) 串行器,解串器

TI

德州仪器

SCAN926260 Six 1 to 10 Bus LVDS Deserializers with IEEE 1149.1 and At-Speed BIST

文件:1.25384 Mbytes Page:25 Pages

TI

德州仪器

SCAN926260 Six 1 to 10 Bus LVDS Deserializers with IEEE 1149.1 and At-Speed BIST

文件:1.25384 Mbytes Page:25 Pages

TI

德州仪器

Six 1 to 10 Bus LVDS Deserializers with IEEE 1149.1 and At-Speed BIST

文件:395.5 Kbytes Page:20 Pages

NSC

国半

封装/外壳:196-LBGA 功能:解串器 包装:卷带(TR)剪切带(CT)Digi-Reel® 得捷定制卷带 描述:IC DESERIALIZER X6 1:10 196-LBGA 集成电路(IC) 串行器,解串器

TI

德州仪器

Six 1 to 10 Bus LVDS Deserializers with IEEE 1149.1 and At-Speed BIST

文件:395.5 Kbytes Page:20 Pages

NSC

国半

Six 1 to 10 Bus LVDS Deserializers with IEEE 1149.1 and At-Speed BIST

文件:372.15 Kbytes Page:18 Pages

NSC

国半

SCAN926260 Six 1 to 10 Bus LVDS Deserializers with IEEE 1149.1 and At-Speed BIST

文件:1.25384 Mbytes Page:25 Pages

TI

德州仪器

SCAN926260 Six 1 to 10 Bus LVDS Deserializers with IEEE 1149.1 and At-Speed BIST

文件:1.25384 Mbytes Page:25 Pages

TI

德州仪器

SCAN926260 Six 1 to 10 Bus LVDS Deserializers with IEEE 1149.1 and At-Speed BIST

文件:1.25384 Mbytes Page:25 Pages

TI

德州仪器

SCAN926260产品属性

  • 类型

    描述

  • Package Group:

    NFBGA

  • Package size:

    mm2

更新时间:2026-8-2 23:01:00
IC供应商 芯片型号 品牌 批号 封装 库存 备注 价格
TI
25+
NFBGA-196(15x15)
7786
正规渠道,免费送样。支持账期,BOM一站式配齐
NSC
2016+
LBGA196
8800
只做原装,假一罚十,公司可开17%增值税发票!
26+
BGA
20000
公司只有正品,实单来谈
NationalSemiconductor
25+23+
196-LBGA
16642
绝对原装正品全新进口深圳现货
NS
22+
BGA
3000
原装正品,支持实单
NS
25+
BGA
3000
全新原装、诚信经营、公司现货销售!
NS
2025+
BGA
3000
原装进口价格优 请找坤融电子!
Texas Instruments
24+25+
16500
全新原厂原装现货!受权代理!可送样可提供技术支持!
SCAN926260TUFX/NOPB
25+
339
339
17+
6200
100%原装正品现货

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