位置：首页 > IC中文资料第5696页 > SCAN926260
| 型号 | 功能描述 | 生产厂家 企业 | LOGO | 操作 |
|---|---|---|---|---|
SCAN926260 | SCAN926260 Six 1 to 10 Bus LVDS Deserializers with IEEE 1149.1 and At-Speed BIST 1FEATURES 2• Deserializes One to Six Bus LVDS Input Serial Data Streams with Embedded Clocks • IEEE 1149.1 (JTAG) Compliant and At-Speed BIST Test Modes • Parallel Clock Rate 16-66MHz • On Chip Filtering for PLL • High Impedance Inputs Upon Power Off (Vcc = 0V) • Single Power Supply at +3 | TI 德州仪器 |   | |
SCAN926260 | SCAN926260 Six 1 to 10 Bus LVDS Deserializers with IEEE 1149.1 and At-Speed BIST 文件：1.25384 Mbytes Page：25 Pages | TI 德州仪器 | | |
SCAN926260 | Six 1 to 10 Bus LVDS Deserializers with IEEE 1149.1 and At-Speed BIST 文件：372.15 Kbytes Page：18 Pages | NSC 国半 | | |
SCAN926260 | Six 1 to 10 Bus LVDS Deserializers with IEEE 1149.1 and At-Speed BIST 文件：395.5 Kbytes Page：20 Pages | NSC 国半 | | |
SCAN926260 | Six 1 to 10 Bus LVDS Deserializers with IEEE 1149.1 and At-Speed BIST 文件：395.5 Kbytes Page：20 Pages | NSC 国半 | | |
SCAN926260 | 具有 IEEE 1149.1 和全速度 BIST 的六个 1 至 10 总线 LVDS 解串器 | TI 德州仪器 | | |
SCAN926260 Six 1 to 10 Bus LVDS Deserializers with IEEE 1149.1 and At-Speed BIST 1FEATURES 2• Deserializes One to Six Bus LVDS Input Serial Data Streams with Embedded Clocks • IEEE 1149.1 (JTAG) Compliant and At-Speed BIST Test Modes • Parallel Clock Rate 16-66MHz • On Chip Filtering for PLL • High Impedance Inputs Upon Power Off (Vcc = 0V) • Single Power Supply at +3 | TI 德州仪器 | | ||
SCAN926260 Six 1 to 10 Bus LVDS Deserializers with IEEE 1149.1 and At-Speed BIST 1FEATURES 2• Deserializes One to Six Bus LVDS Input Serial Data Streams with Embedded Clocks • IEEE 1149.1 (JTAG) Compliant and At-Speed BIST Test Modes • Parallel Clock Rate 16-66MHz • On Chip Filtering for PLL • High Impedance Inputs Upon Power Off (Vcc = 0V) • Single Power Supply at +3 | TI 德州仪器 | | ||
SCAN926260 Six 1 to 10 Bus LVDS Deserializers with IEEE 1149.1 and At-Speed BIST 1FEATURES 2• Deserializes One to Six Bus LVDS Input Serial Data Streams with Embedded Clocks • IEEE 1149.1 (JTAG) Compliant and At-Speed BIST Test Modes • Parallel Clock Rate 16-66MHz • On Chip Filtering for PLL • High Impedance Inputs Upon Power Off (Vcc = 0V) • Single Power Supply at +3 | TI 德州仪器 | | ||
SCAN926260 Six 1 to 10 Bus LVDS Deserializers with IEEE 1149.1 and At-Speed BIST 1FEATURES 2• Deserializes One to Six Bus LVDS Input Serial Data Streams with Embedded Clocks • IEEE 1149.1 (JTAG) Compliant and At-Speed BIST Test Modes • Parallel Clock Rate 16-66MHz • On Chip Filtering for PLL • High Impedance Inputs Upon Power Off (Vcc = 0V) • Single Power Supply at +3 | TI 德州仪器 | | ||
SCAN926260 Six 1 to 10 Bus LVDS Deserializers with IEEE 1149.1 and At-Speed BIST 1FEATURES 2• Deserializes One to Six Bus LVDS Input Serial Data Streams with Embedded Clocks • IEEE 1149.1 (JTAG) Compliant and At-Speed BIST Test Modes • Parallel Clock Rate 16-66MHz • On Chip Filtering for PLL • High Impedance Inputs Upon Power Off (Vcc = 0V) • Single Power Supply at +3 | TI 德州仪器 | | ||
SCAN926260 Six 1 to 10 Bus LVDS Deserializers with IEEE 1149.1 and At-Speed BIST 1FEATURES 2• Deserializes One to Six Bus LVDS Input Serial Data Streams with Embedded Clocks • IEEE 1149.1 (JTAG) Compliant and At-Speed BIST Test Modes • Parallel Clock Rate 16-66MHz • On Chip Filtering for PLL • High Impedance Inputs Upon Power Off (Vcc = 0V) • Single Power Supply at +3 | TI 德州仪器 | | ||
SCAN926260 Six 1 to 10 Bus LVDS Deserializers with IEEE 1149.1 and At-Speed BIST 1FEATURES 2• Deserializes One to Six Bus LVDS Input Serial Data Streams with Embedded Clocks • IEEE 1149.1 (JTAG) Compliant and At-Speed BIST Test Modes • Parallel Clock Rate 16-66MHz • On Chip Filtering for PLL • High Impedance Inputs Upon Power Off (Vcc = 0V) • Single Power Supply at +3 | TI 德州仪器 | | ||
SCAN926260 Six 1 to 10 Bus LVDS Deserializers with IEEE 1149.1 and At-Speed BIST 1FEATURES 2• Deserializes One to Six Bus LVDS Input Serial Data Streams with Embedded Clocks • IEEE 1149.1 (JTAG) Compliant and At-Speed BIST Test Modes • Parallel Clock Rate 16-66MHz • On Chip Filtering for PLL • High Impedance Inputs Upon Power Off (Vcc = 0V) • Single Power Supply at +3 | TI 德州仪器 | | ||
Six 1 to 10 Bus LVDS Deserializers with IEEE 1149.1 and At-Speed BIST 文件：395.5 Kbytes Page：20 Pages | NSC 国半 | | ||
Six 1 to 10 Bus LVDS Deserializers with IEEE 1149.1 and At-Speed BIST 文件：395.5 Kbytes Page：20 Pages | NSC 国半 | | ||
SCAN926260 Six 1 to 10 Bus LVDS Deserializers with IEEE 1149.1 and At-Speed BIST 文件：1.25384 Mbytes Page：25 Pages | TI 德州仪器 | | ||
Six 1 to 10 Bus LVDS Deserializers with IEEE 1149.1 and At-Speed BIST 文件：372.15 Kbytes Page：18 Pages | NSC 国半 | | ||
SCAN926260 Six 1 to 10 Bus LVDS Deserializers with IEEE 1149.1 and At-Speed BIST 文件：1.25384 Mbytes Page：25 Pages | TI 德州仪器 | | ||
Six 1 to 10 Bus LVDS Deserializers with IEEE 1149.1 and At-Speed BIST 文件：395.5 Kbytes Page：20 Pages | NSC 国半 | | ||
Six 1 to 10 Bus LVDS Deserializers with IEEE 1149.1 and At-Speed BIST 文件：395.5 Kbytes Page：20 Pages | NSC 国半 | | ||
封装/外壳：196-LBGA 功能：解串器 包装：托盘 描述：IC DESERIALIZER X6 1:10 196LBGA 集成电路（IC） 串行器，解串器 | TI 德州仪器 | | ||
SCAN926260 Six 1 to 10 Bus LVDS Deserializers with IEEE 1149.1 and At-Speed BIST 文件：1.25384 Mbytes Page：25 Pages | TI 德州仪器 | | ||
SCAN926260 Six 1 to 10 Bus LVDS Deserializers with IEEE 1149.1 and At-Speed BIST 文件：1.25384 Mbytes Page：25 Pages | TI 德州仪器 | | ||
Six 1 to 10 Bus LVDS Deserializers with IEEE 1149.1 and At-Speed BIST 文件：395.5 Kbytes Page：20 Pages | NSC 国半 | | ||
Six 1 to 10 Bus LVDS Deserializers with IEEE 1149.1 and At-Speed BIST 文件：395.5 Kbytes Page：20 Pages | NSC 国半 | | ||
Six 1 to 10 Bus LVDS Deserializers with IEEE 1149.1 and At-Speed BIST 文件：372.15 Kbytes Page：18 Pages | NSC 国半 | | ||
SCAN926260 Six 1 to 10 Bus LVDS Deserializers with IEEE 1149.1 and At-Speed BIST 文件：1.25384 Mbytes Page：25 Pages | TI 德州仪器 | | ||
封装/外壳：196-LBGA 功能：解串器 包装：卷带（TR）剪切带（CT）Digi-Reel® 得捷定制卷带 描述：IC DESERIALIZER X6 1:10 196-LBGA 集成电路（IC） 串行器，解串器 | TI 德州仪器 | | ||
SCAN926260 Six 1 to 10 Bus LVDS Deserializers with IEEE 1149.1 and At-Speed BIST 文件：1.25384 Mbytes Page：25 Pages | TI 德州仪器 | | ||
SCAN926260 Six 1 to 10 Bus LVDS Deserializers with IEEE 1149.1 and At-Speed BIST 文件：1.25384 Mbytes Page：25 Pages | TI 德州仪器 | |
SCAN926260产品属性
- 类型
描述
- 型号
SCAN926260
- 制造商
NSC
- 制造商全称
National Semiconductor
- 功能描述
Six 1 to 10 Bus LVDS Deserializers with IEEE 1149.1 and At-Speed BIST
| IC供应商 | 芯片型号 | 品牌 | 批号 | 封装 | 库存 | 备注 | 价格 |
|---|---|---|---|---|---|---|---|
TI |
25+ |
BGA |
6 |
百分百原装正品 真实公司现货库存 本公司只做原装 可 |
|||
TI(德州仪器) |
24+ |
LBGA-196 |
8498 |
支持大陆交货,美金交易。原装现货库存。 |
|||
NSC |
2016+ |
LBGA196 |
8800 |
只做原装,假一罚十,公司可开17%增值税发票! |
|||
NS |
24+ |
LBGA |
185 |
||||
NS |
2025+ |
BGA |
3000 |
原装进口价格优 请找坤融电子! |
|||
NS |
25+ |
BGA196 |
6524 |
⊙⊙新加坡大量现货库存,深圳常备现货!欢迎查询!⊙ |
|||
TI/德州仪器 |
2308+ |
LBGA196 |
6800 |
十年专业专注 优势渠道商正品保证公司现货 |
|||
国半 |
23+ |
BGA |
7100 |
绝对全新原装!现货!特价!请放心订购! |
|||
TI |
22+ |
196BGA (15x15) |
9000 |
原厂渠道,现货配单 |
|||
NS/国半 |
24+ |
BGA |
3000 |
全新原装现货 优势库存 |
SCAN926260规格书下载地址
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DdatasheetPDF页码索引
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