位置：首页 > IC中文资料第5696页 > SCAN926260
| 型号 | 功能描述 | 生产厂家 企业 | LOGO | 操作 |
|---|---|---|---|---|
SCAN926260 | SCAN926260 Six 1 to 10 Bus LVDS Deserializers with IEEE 1149.1 and At-Speed BIST 1FEATURES 2• Deserializes One to Six Bus LVDS Input Serial Data Streams with Embedded Clocks • IEEE 1149.1 (JTAG) Compliant and At-Speed BIST Test Modes • Parallel Clock Rate 16-66MHz • On Chip Filtering for PLL • High Impedance Inputs Upon Power Off (Vcc = 0V) • Single Power Supply at +3 | TI 德州仪器 |   | |
SCAN926260 | 具有 IEEE 1149.1 和全速度 BIST 的六个 1 至 10 总线 LVDS 解串器 | TI 德州仪器 | | |
SCAN926260 | Six 1 to 10 Bus LVDS Deserializers with IEEE 1149.1 and At-Speed BIST 文件：372.15 Kbytes Page：18 Pages | NSC 国半 | | |
SCAN926260 | Six 1 to 10 Bus LVDS Deserializers with IEEE 1149.1 and At-Speed BIST 文件：395.5 Kbytes Page：20 Pages | NSC 国半 | | |
SCAN926260 | SCAN926260 Six 1 to 10 Bus LVDS Deserializers with IEEE 1149.1 and At-Speed BIST 文件：1.25384 Mbytes Page：25 Pages | TI 德州仪器 | | |
SCAN926260 | Six 1 to 10 Bus LVDS Deserializers with IEEE 1149.1 and At-Speed BIST 文件：395.5 Kbytes Page：20 Pages | NSC 国半 | | |
SCAN926260 Six 1 to 10 Bus LVDS Deserializers with IEEE 1149.1 and At-Speed BIST 1FEATURES 2• Deserializes One to Six Bus LVDS Input Serial Data Streams with Embedded Clocks • IEEE 1149.1 (JTAG) Compliant and At-Speed BIST Test Modes • Parallel Clock Rate 16-66MHz • On Chip Filtering for PLL • High Impedance Inputs Upon Power Off (Vcc = 0V) • Single Power Supply at +3 | TI 德州仪器 | | ||
SCAN926260 Six 1 to 10 Bus LVDS Deserializers with IEEE 1149.1 and At-Speed BIST 1FEATURES 2• Deserializes One to Six Bus LVDS Input Serial Data Streams with Embedded Clocks • IEEE 1149.1 (JTAG) Compliant and At-Speed BIST Test Modes • Parallel Clock Rate 16-66MHz • On Chip Filtering for PLL • High Impedance Inputs Upon Power Off (Vcc = 0V) • Single Power Supply at +3 | TI 德州仪器 | | ||
SCAN926260 Six 1 to 10 Bus LVDS Deserializers with IEEE 1149.1 and At-Speed BIST 1FEATURES 2• Deserializes One to Six Bus LVDS Input Serial Data Streams with Embedded Clocks • IEEE 1149.1 (JTAG) Compliant and At-Speed BIST Test Modes • Parallel Clock Rate 16-66MHz • On Chip Filtering for PLL • High Impedance Inputs Upon Power Off (Vcc = 0V) • Single Power Supply at +3 | TI 德州仪器 | | ||
SCAN926260 Six 1 to 10 Bus LVDS Deserializers with IEEE 1149.1 and At-Speed BIST 1FEATURES 2• Deserializes One to Six Bus LVDS Input Serial Data Streams with Embedded Clocks • IEEE 1149.1 (JTAG) Compliant and At-Speed BIST Test Modes • Parallel Clock Rate 16-66MHz • On Chip Filtering for PLL • High Impedance Inputs Upon Power Off (Vcc = 0V) • Single Power Supply at +3 | TI 德州仪器 | | ||
SCAN926260 Six 1 to 10 Bus LVDS Deserializers with IEEE 1149.1 and At-Speed BIST 1FEATURES 2• Deserializes One to Six Bus LVDS Input Serial Data Streams with Embedded Clocks • IEEE 1149.1 (JTAG) Compliant and At-Speed BIST Test Modes • Parallel Clock Rate 16-66MHz • On Chip Filtering for PLL • High Impedance Inputs Upon Power Off (Vcc = 0V) • Single Power Supply at +3 | TI 德州仪器 | | ||
SCAN926260 Six 1 to 10 Bus LVDS Deserializers with IEEE 1149.1 and At-Speed BIST 1FEATURES 2• Deserializes One to Six Bus LVDS Input Serial Data Streams with Embedded Clocks • IEEE 1149.1 (JTAG) Compliant and At-Speed BIST Test Modes • Parallel Clock Rate 16-66MHz • On Chip Filtering for PLL • High Impedance Inputs Upon Power Off (Vcc = 0V) • Single Power Supply at +3 | TI 德州仪器 | | ||
SCAN926260 Six 1 to 10 Bus LVDS Deserializers with IEEE 1149.1 and At-Speed BIST 1FEATURES 2• Deserializes One to Six Bus LVDS Input Serial Data Streams with Embedded Clocks • IEEE 1149.1 (JTAG) Compliant and At-Speed BIST Test Modes • Parallel Clock Rate 16-66MHz • On Chip Filtering for PLL • High Impedance Inputs Upon Power Off (Vcc = 0V) • Single Power Supply at +3 | TI 德州仪器 | | ||
SCAN926260 Six 1 to 10 Bus LVDS Deserializers with IEEE 1149.1 and At-Speed BIST 1FEATURES 2• Deserializes One to Six Bus LVDS Input Serial Data Streams with Embedded Clocks • IEEE 1149.1 (JTAG) Compliant and At-Speed BIST Test Modes • Parallel Clock Rate 16-66MHz • On Chip Filtering for PLL • High Impedance Inputs Upon Power Off (Vcc = 0V) • Single Power Supply at +3 | TI 德州仪器 | | ||
Six 1 to 10 Bus LVDS Deserializers with IEEE 1149.1 and At-Speed BIST 文件：395.5 Kbytes Page：20 Pages | NSC 国半 | | ||
Six 1 to 10 Bus LVDS Deserializers with IEEE 1149.1 and At-Speed BIST 文件：395.5 Kbytes Page：20 Pages | NSC 国半 | | ||
SCAN926260 Six 1 to 10 Bus LVDS Deserializers with IEEE 1149.1 and At-Speed BIST 文件：1.25384 Mbytes Page：25 Pages | TI 德州仪器 | | ||
SCAN926260 Six 1 to 10 Bus LVDS Deserializers with IEEE 1149.1 and At-Speed BIST 文件：1.25384 Mbytes Page：25 Pages | TI 德州仪器 | | ||
Six 1 to 10 Bus LVDS Deserializers with IEEE 1149.1 and At-Speed BIST 文件：372.15 Kbytes Page：18 Pages | NSC 国半 | | ||
Six 1 to 10 Bus LVDS Deserializers with IEEE 1149.1 and At-Speed BIST 文件：395.5 Kbytes Page：20 Pages | NSC 国半 | | ||
Six 1 to 10 Bus LVDS Deserializers with IEEE 1149.1 and At-Speed BIST 文件：395.5 Kbytes Page：20 Pages | NSC 国半 | | ||
SCAN926260 Six 1 to 10 Bus LVDS Deserializers with IEEE 1149.1 and At-Speed BIST 文件：1.25384 Mbytes Page：25 Pages | TI 德州仪器 | | ||
封装/外壳：196-LBGA 功能：解串器 包装：托盘 描述：IC DESERIALIZER X6 1:10 196LBGA 集成电路（IC） 串行器，解串器 | TI 德州仪器 | | ||
SCAN926260 Six 1 to 10 Bus LVDS Deserializers with IEEE 1149.1 and At-Speed BIST 文件：1.25384 Mbytes Page：25 Pages | TI 德州仪器 | | ||
Six 1 to 10 Bus LVDS Deserializers with IEEE 1149.1 and At-Speed BIST 文件：395.5 Kbytes Page：20 Pages | NSC 国半 | | ||
SCAN926260 Six 1 to 10 Bus LVDS Deserializers with IEEE 1149.1 and At-Speed BIST 文件：1.25384 Mbytes Page：25 Pages | TI 德州仪器 | | ||
Six 1 to 10 Bus LVDS Deserializers with IEEE 1149.1 and At-Speed BIST 文件：395.5 Kbytes Page：20 Pages | NSC 国半 | | ||
Six 1 to 10 Bus LVDS Deserializers with IEEE 1149.1 and At-Speed BIST 文件：372.15 Kbytes Page：18 Pages | NSC 国半 | | ||
封装/外壳：196-LBGA 功能：解串器 包装：卷带（TR）剪切带（CT）Digi-Reel® 得捷定制卷带 描述：IC DESERIALIZER X6 1:10 196-LBGA 集成电路（IC） 串行器，解串器 | TI 德州仪器 | | ||
SCAN926260 Six 1 to 10 Bus LVDS Deserializers with IEEE 1149.1 and At-Speed BIST 文件：1.25384 Mbytes Page：25 Pages | TI 德州仪器 | | ||
SCAN926260 Six 1 to 10 Bus LVDS Deserializers with IEEE 1149.1 and At-Speed BIST 文件：1.25384 Mbytes Page：25 Pages | TI 德州仪器 | |
SCAN926260产品属性
- 类型
描述
- 型号
SCAN926260
- 制造商
NSC
- 制造商全称
National Semiconductor
- 功能描述
Six 1 to 10 Bus LVDS Deserializers with IEEE 1149.1 and At-Speed BIST
| IC供应商 | 芯片型号 | 品牌 | 批号 | 封装 | 库存 | 备注 | 价格 |
|---|---|---|---|---|---|---|---|
NSC/ROH |
23+ |
LBGA196 |
8650 |
受权代理!全新原装现货特价热卖! |
|||
TI/德州仪器 |
23+ |
LBGA196 |
50000 |
全新原装正品现货,支持订货 |
|||
NS |
25+ |
BGA |
880000 |
明嘉莱只做原装正品现货 |
|||
NSC/ROHS |
24+ |
NA/ |
5183 |
原厂直销,现货供应,账期支持! |
|||
NS |
23+ |
BGA |
20000 |
全新原装假一赔十 |
|||
TI/德州仪器 |
25+ |
196-NFBGA |
65248 |
百分百原装现货 实单必成 |
|||
TI(德州仪器) |
NFBGA-196(15x15) |
10000 |
|||||
TI |
22+ |
196BGA (15x15) |
9000 |
原厂渠道,现货配单 |
|||
NS |
24+ |
BGA |
20000 |
全新原厂原装，进口正品现货，正规渠道可含税！！ |
|||
NSC |
2138+ |
QFP |
8960 |
专营BGA,QFP原装现货,假一赔十 |
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SCAN926260规格书下载地址
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DdatasheetPDF页码索引
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