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GE3425

包装:盒 描述:OSCOPE PROBE X100 100MHZ 100M 测试与计量 测试引线 - 示波器探头,探针

CALTEST

GE3425

包装:盒 描述:OSCOPE PROBE X100 100MHZ 100M 测试与计量 测试引线 - 示波器探头,探针

CALTEST

DUAL, CHOPPER-STABILIZED, ULTRA-SENSITIVE, BIPOLAR HALL-EFFECT SWITCH

FEATURES ■ Two Matched Hall Switches On A Single Substrate ■ 1 mm Sensor-to-Sensor Spacing ■ Superior Temperature Stability ■ Resistant to Physical Stress ■ Output Short-Circuit Protection ■ Operation From Unregulated Supply ■ Reverse Battery Protection ■ Solid-State Reliability ■ Integra

ALLEGRO

DUAL, CHOPPER-STABILIZED, ULTRA-SENSITIVE, BIPOLAR HALL-EFFECT SWITCH

FEATURES ■ Two Matched Hall Switches On A Single Substrate ■ 1 mm Sensor-to-Sensor Spacing ■ Superior Temperature Stability ■ Resistant to Physical Stress ■ Output Short-Circuit Protection ■ Operation From Unregulated Supply ■ Reverse Battery Protection ■ Solid-State Reliability ■ Integra

ALLEGRO

DUAL, CHOPPER-STABILIZED, ULTRA-SENSITIVE, BIPOLAR HALL-EFFECT SWITCH

FEATURES ■ Two Matched Hall Switches On A Single Substrate ■ 1 mm Sensor-to-Sensor Spacing ■ Superior Temperature Stability ■ Resistant to Physical Stress ■ Output Short-Circuit Protection ■ Operation From Unregulated Supply ■ Reverse Battery Protection ■ Solid-State Reliability ■ Integra

ALLEGRO

POWER SUPPLY SUPERVISORY/ OVER AND UNDERVOLTAGE PROTECTION CIRCUIT

Power Supply Supervisory/Over and Undervoltage Protection Circuit The MC3425 is a power supply supervisory circuit containing all the necessary functions required to monitor over and undervoltage fault conditions. These integrated circuits contain dedicated over and undervoltage sensing channels

ONSEMI

安森美半导体

.025 NPN Phototransistors

PRODUCT DESCRIPTION A small area high speed NPN silicon phototransistor in a 3 mm diameter, lensed plastic package. The package material transmits infrared and blocks visible light. These devices are spectrally and mechanically matched to the VTE33xxLA series of IREDs.

PERKINELMER

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