FEATURES

• VDD=VDDQ=1.2V +/- 0.06V

• Fully differential clock inputs (CK, CK) operation

• Differential Data Strobe (DQS, DQS)

• On chip DLL align DQ, DQS and DQS transition with CK

transition

• DM masks write data-in at the both rising and falling

edges of the data strobe

• All addresses and control inputs except data, data

strobes and data masks latched on the rising edges of

the clock

• Programmable CAS latency 9, 11, 12, 13, 14, 15, 16,

17 and 18 supported

• Programmable additive latency 0, CL-1, and CL-2

supported

• Programmable CAS Write latency (CWL) = 9, 10, 11,

12, 14, 16

• Programmable burst length 4/8 with both nibble

sequential and interleave mode

• BL switch on the fly

• 16banks

• Average Refresh Cycle (Tcase of 0 oC~ 95 oC)

- 7.8 µs at 0oC ~ 85 oC

- 3.9 µs at 85oC ~ 95 oC

• JEDEC standard 78ball FBGA(x8)

• Driver strength selected by MRS

• Dynamic On Die Termination supported

• Two Termination States such as RTT_PARK and

RTT_NOM switchable by ODT pin

• Asynchronous RESET pin supported

• ZQ calibration supported

• TDQS (Termination Data Strobe) supported

• Write Levelization supported

• 8 bit pre-fetch

• This product in compliance with the RoHS directive.

• Internal Vref DQ level generation is available

• Write CRC is supported at all speed grades

• Maximum Power Saving Mode is supported

• TCAR(Temperature Controlled Auto Refresh) mode is

supported

• LP ASR(Low Power Auto Self Refresh) mode is supported

• Fine Granularity Refresh is supported

• Per DRAM Addressability is supported

• Geardown Mode(1/2 rate, 1/4 rate) is supported

• Programable Preamble for read and write is supported

• Self Refresh Abort is supported

• CA parity (Command/Address Parity) mode is supported

• Bank Grouping is applied, and CAS to CAS latency

(tCCD_L, tCCD_S) for the banks in the same or different

bank group accesses are available

• DBI(Data Bus Inversion) is supported