丝印代码：BCT8244A；SCAN TEST DEVICES WITH OCTAL BUFFERS

Members of the Texas Instruments SCOPE™ Family of Testability Products Octal Test-Integrated Circuits Functionally Equivalent to ’F244 and ’BCT244 in the Normal-Function Mode Compatible With the IEEE Standard 1149.1-1990 (JTAG) Test Access Port and Boundary-Scan Architecture Test Operation

丝印代码：BCT8244A；SCAN TEST DEVICES WITH OCTAL BUFFERS

Members of the Texas Instruments SCOPE™ Family of Testability Products Octal Test-Integrated Circuits Functionally Equivalent to ’F244 and ’BCT244 in the Normal-Function Mode Compatible With the IEEE Standard 1149.1-1990 (JTAG) Test Access Port and Boundary-Scan Architecture Test Operation

Single-Supply, Low Power, Precision FET Input Quad Buffer

FEATURES Low power 250 μA maximum supply current per amplifier FET input 2 pA maximum input bias current at 25°C Extremely high input impedance Low noise 13 nV/√Hz voltage noise at 1 kHz 0.4 μV p-p voltage noise (0.1 Hz to 10 Hz) 0.8 fA/√Hz current noise at 1 kHz High dc precision 3 μV/

Single-Supply, Low Power, Precision FET Input Quad Buffer

GENERAL DESCRIPTION The AD8244 is a precision, low power, FET input, quad unity-gain buffer that is designed to isolate very large source impedances from the rest of the signal chain. The 2 pA maximum bias current, near zero current noise, and 10 TΩ input impedance introduce almost no error, ev

Single-Supply, Low Power, Precision FET Input Quad Buffer

GENERAL DESCRIPTION The AD8244 is a precision, low power, FET input, quad unity-gain buffer that is designed to isolate very large source impedances from the rest of the signal chain. The 2 pA maximum bias current, near zero current noise, and 10 TΩ input impedance introduce almost no error, ev

LAN 10/100 BASE-T Single Port Transformer Modules

文件：198.95 Kbytes Page：1 Pages

10/100 BASE-T Single Port Transformer Module

文件：659.81 Kbytes Page：1 Pages