SN74BCT8244ADW价格

参考价格:¥45.4781

型号:SN74BCT8244ADW 品牌:Texas 备注:这里有SN74BCT8244ADW多少钱,2025年最近7天走势,今日出价,今日竞价,SN74BCT8244ADW批发/采购报价,SN74BCT8244ADW行情走势销售排行榜,SN74BCT8244ADW报价。
型号 功能描述 生产厂家 企业 LOGO 操作
SN74BCT8244ADW

SCAN TEST DEVICES WITH OCTAL BUFFERS

Members of the Texas Instruments SCOPE™ Family of Testability Products Octal Test-Integrated Circuits Functionally Equivalent to ’F244 and ’BCT244 in the Normal-Function Mode Compatible With the IEEE Standard 1149.1-1990 (JTAG) Test Access Port and Boundary-Scan Architecture Test Operation

TI

德州仪器

SN74BCT8244ADW

封装/外壳:24-SOIC(0.295",7.50mm 宽) 包装:卷带(TR)剪切带(CT)Digi-Reel® 得捷定制卷带 描述:IC SCAN TEST DEVICE BUFF 24-SOIC 集成电路(IC) 专用逻辑器件

TI

德州仪器

SN74BCT8244ADW

SCAN TEST DEVICES WITH OCTAL BUFFERS

文件:472.15 Kbytes Page:26 Pages

TI

德州仪器

SN74BCT8244ADW

SCAN TEST DEVICES WITH OCTAL BUFFERS

文件:642.79 Kbytes Page:28 Pages

TI

德州仪器

SN74BCT8244ADW

SCAN TEST DEVICES WITH OCTAL BUFFERS

文件:612.97 Kbytes Page:28 Pages

TI

德州仪器

SCAN TEST DEVICES WITH OCTAL BUFFERS

Members of the Texas Instruments SCOPE™ Family of Testability Products Octal Test-Integrated Circuits Functionally Equivalent to ’F244 and ’BCT244 in the Normal-Function Mode Compatible With the IEEE Standard 1149.1-1990 (JTAG) Test Access Port and Boundary-Scan Architecture Test Operation

TI

德州仪器

SCAN TEST DEVICES WITH OCTAL BUFFERS

文件:642.79 Kbytes Page:28 Pages

TI

德州仪器

SCAN TEST DEVICES WITH OCTAL BUFFERS

文件:612.97 Kbytes Page:28 Pages

TI

德州仪器

SCAN TEST DEVICES WITH OCTAL BUFFERS

文件:472.15 Kbytes Page:26 Pages

TI

德州仪器

SCAN TEST DEVICES WITH OCTAL BUFFERS

文件:642.79 Kbytes Page:28 Pages

TI

德州仪器

SCAN TEST DEVICES WITH OCTAL BUFFERS

文件:612.97 Kbytes Page:28 Pages

TI

德州仪器

SCAN TEST DEVICES WITH OCTAL BUFFERS

文件:642.79 Kbytes Page:28 Pages

TI

德州仪器

SCAN TEST DEVICES WITH OCTAL BUFFERS

文件:472.15 Kbytes Page:26 Pages

TI

德州仪器

SCAN TEST DEVICES WITH OCTAL BUFFERS

文件:612.97 Kbytes Page:28 Pages

TI

德州仪器

封装/外壳:24-SOIC(0.295",7.50mm 宽) 包装:卷带(TR) 描述:IC SCAN TEST DEVICE BUFF 24-SOIC 集成电路(IC) 专用逻辑器件

TI

德州仪器

SCAN TEST DEVICES WITH OCTAL BUFFERS

文件:472.15 Kbytes Page:26 Pages

TI

德州仪器

SCAN TEST DEVICES WITH OCTAL BUFFERS

文件:642.79 Kbytes Page:28 Pages

TI

德州仪器

SCAN TEST DEVICES WITH OCTAL BUFFERS

文件:612.97 Kbytes Page:28 Pages

TI

德州仪器

SCAN TEST DEVICES WITH OCTAL BUFFERS

文件:612.97 Kbytes Page:28 Pages

TI

德州仪器

SCAN TEST DEVICES WITH OCTAL BUFFERS

文件:642.79 Kbytes Page:28 Pages

TI

德州仪器

SCAN TEST DEVICES WITH OCTAL BUFFERS

Members of the Texas Instruments SCOPE™ Family of Testability Products Octal Test-Integrated Circuits Functionally Equivalent to ’F244 and ’BCT244 in the Normal-Function Mode Compatible With the IEEE Standard 1149.1-1990 (JTAG) Test Access Port and Boundary-Scan Architecture Test Operation

TI

德州仪器

SCAN TEST DEVICES WITH OCTAL BUFFERS

文件:642.79 Kbytes Page:28 Pages

TI

德州仪器

SCAN TEST DEVICES WITH OCTAL BUFFERS

文件:472.15 Kbytes Page:26 Pages

TI

德州仪器

SCAN TEST DEVICES WITH OCTAL BUFFERS

文件:612.97 Kbytes Page:28 Pages

TI

德州仪器

SN74BCT8244ADW产品属性

  • 类型

    描述

  • 型号

    SN74BCT8244ADW

  • 功能描述

    特定功能逻辑 Device w/Octal Buffers

  • RoHS

  • 制造商

    Texas Instruments

  • 系列

    SN74ABTH18502A

  • 工作电源电压

    5 V

  • 封装/箱体

    LQFP-64

  • 封装

    Tube

更新时间:2025-11-3 23:00:00
IC供应商 芯片型号 品牌 批号 封装 库存 备注 价格
TI(德州仪器)
24+
SOP24300mil
924
只做原装,提供一站式配单服务,代工代料。BOM配单
TI(德州仪器)
24+
SOP24300mil
1493
原装现货,免费供样,技术支持,原厂对接
TI/德州仪器
23+
SOIC-24
12700
买原装认准中赛美
TI/德州仪器
22+
SOIC-24
500000
原装现货支持实单价优/含税
TI/德州仪器
22+
SOP24
12245
现货,原厂原装假一罚十!
TI/德州仪器
23+
SOIC-24
8080
正规渠道,只有原装!
TexasInstruments
18+
ICSCANTESTDEVICEBUFF24-S
6800
公司原装现货/欢迎来电咨询!
SN74BCT8244ADW
25+
2461
2461
TI
23+
SOP24-7.2MM
30000
代理全新原装现货,价格优势
24+
QFP
6000
美国德州仪器TEXASINSTRUMENTS原厂代理辉华拓展内地现

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