SN74BCT8244ADW价格

参考价格:¥45.4781

型号:SN74BCT8244ADW 品牌:Texas 备注:这里有SN74BCT8244ADW多少钱,2026年最近7天走势,今日出价,今日竞价,SN74BCT8244ADW批发/采购报价,SN74BCT8244ADW行情走势销售排行榜,SN74BCT8244ADW报价。
型号 功能描述 生产厂家 企业 LOGO 操作
SN74BCT8244ADW

SCAN TEST DEVICES WITH OCTAL BUFFERS

Members of the Texas Instruments SCOPE™ Family of Testability Products Octal Test-Integrated Circuits Functionally Equivalent to ’F244 and ’BCT244 in the Normal-Function Mode Compatible With the IEEE Standard 1149.1-1990 (JTAG) Test Access Port and Boundary-Scan Architecture Test Operation

TI

德州仪器

SN74BCT8244ADW

封装/外壳:24-SOIC(0.295",7.50mm 宽) 包装:卷带(TR)剪切带(CT)Digi-Reel® 得捷定制卷带 描述:IC SCAN TEST DEVICE BUFF 24-SOIC 集成电路(IC) 专用逻辑器件

TI

德州仪器

SN74BCT8244ADW

SCAN TEST DEVICES WITH OCTAL BUFFERS

文件:472.15 Kbytes Page:26 Pages

TI

德州仪器

SN74BCT8244ADW

SCAN TEST DEVICES WITH OCTAL BUFFERS

文件:642.79 Kbytes Page:28 Pages

TI

德州仪器

SN74BCT8244ADW

SCAN TEST DEVICES WITH OCTAL BUFFERS

文件:612.97 Kbytes Page:28 Pages

TI

德州仪器

SCAN TEST DEVICES WITH OCTAL BUFFERS

Members of the Texas Instruments SCOPE™ Family of Testability Products Octal Test-Integrated Circuits Functionally Equivalent to ’F244 and ’BCT244 in the Normal-Function Mode Compatible With the IEEE Standard 1149.1-1990 (JTAG) Test Access Port and Boundary-Scan Architecture Test Operation

TI

德州仪器

SCAN TEST DEVICES WITH OCTAL BUFFERS

文件:642.79 Kbytes Page:28 Pages

TI

德州仪器

SCAN TEST DEVICES WITH OCTAL BUFFERS

文件:612.97 Kbytes Page:28 Pages

TI

德州仪器

SCAN TEST DEVICES WITH OCTAL BUFFERS

文件:472.15 Kbytes Page:26 Pages

TI

德州仪器

SCAN TEST DEVICES WITH OCTAL BUFFERS

文件:642.79 Kbytes Page:28 Pages

TI

德州仪器

SCAN TEST DEVICES WITH OCTAL BUFFERS

文件:612.97 Kbytes Page:28 Pages

TI

德州仪器

SCAN TEST DEVICES WITH OCTAL BUFFERS

文件:642.79 Kbytes Page:28 Pages

TI

德州仪器

SCAN TEST DEVICES WITH OCTAL BUFFERS

文件:472.15 Kbytes Page:26 Pages

TI

德州仪器

SCAN TEST DEVICES WITH OCTAL BUFFERS

文件:612.97 Kbytes Page:28 Pages

TI

德州仪器

封装/外壳:24-SOIC(0.295",7.50mm 宽) 包装:卷带(TR) 描述:IC SCAN TEST DEVICE BUFF 24-SOIC 集成电路(IC) 专用逻辑器件

TI

德州仪器

SCAN TEST DEVICES WITH OCTAL BUFFERS

文件:472.15 Kbytes Page:26 Pages

TI

德州仪器

SCAN TEST DEVICES WITH OCTAL BUFFERS

文件:642.79 Kbytes Page:28 Pages

TI

德州仪器

SCAN TEST DEVICES WITH OCTAL BUFFERS

文件:612.97 Kbytes Page:28 Pages

TI

德州仪器

SCAN TEST DEVICES WITH OCTAL BUFFERS

文件:612.97 Kbytes Page:28 Pages

TI

德州仪器

SCAN TEST DEVICES WITH OCTAL BUFFERS

文件:642.79 Kbytes Page:28 Pages

TI

德州仪器

SCAN TEST DEVICES WITH OCTAL BUFFERS

Members of the Texas Instruments SCOPE™ Family of Testability Products Octal Test-Integrated Circuits Functionally Equivalent to ’F244 and ’BCT244 in the Normal-Function Mode Compatible With the IEEE Standard 1149.1-1990 (JTAG) Test Access Port and Boundary-Scan Architecture Test Operation

TI

德州仪器

SCAN TEST DEVICES WITH OCTAL BUFFERS

文件:642.79 Kbytes Page:28 Pages

TI

德州仪器

SCAN TEST DEVICES WITH OCTAL BUFFERS

文件:472.15 Kbytes Page:26 Pages

TI

德州仪器

SCAN TEST DEVICES WITH OCTAL BUFFERS

文件:612.97 Kbytes Page:28 Pages

TI

德州仪器

SN74BCT8244ADW产品属性

  • 类型

    描述

  • 型号

    SN74BCT8244ADW

  • 功能描述

    特定功能逻辑 Device w/Octal Buffers

  • RoHS

  • 制造商

    Texas Instruments

  • 系列

    SN74ABTH18502A

  • 工作电源电压

    5 V

  • 封装/箱体

    LQFP-64

  • 封装

    Tube

更新时间:2026-1-6 8:54:00
IC供应商 芯片型号 品牌 批号 封装 库存 备注 价格
TI
24+/25+
5500
原装正品现货库存价优
ADI
23+
SOP24-7.2MM
7000
TI/德州仪器
24+
SOP24-7.2MM
4155
只供应原装正品 欢迎询价
TI(德州仪器)
2021+
SOIC-24
512
TI/德州仪器
23+
SOIC-24
12700
买原装认准中赛美
TI
23+
SOP24-7.2MM
5000
全新原装,支持实单,非诚勿扰
TI
23+
NA
20000
TI
25+
24-SOIC
22412
原装正品现货,原厂订货,可支持含税原型号开票。
TI
25+
SOIC-24-300mil
11491
样件支持,可原厂排单订货!
TI/德州仪器
2022+
SOIC-24
7600
原厂原装,假一罚十

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