DABiC-IV, 20-BIT SERIAL-INPUT, LATCHED SOURCE DRIVER

DABiC-IV, 32-BIT SERIAL-INPUT, LATCHED SOURCE DRIVER The A6818– devices combine a 32-bit CMOS shift register, accompanying data latches and control circuitry with bipolar sourcing outputs and pnp active pull downs. Designed primarily to drive vacuum fluorescent displays, the 60 V and -40 mA outpu

封装/外壳：28-SOIC（0.295"，7.50mm 宽） 包装：卷带（TR） 描述：IC PWR DRVR BIPOLAR 1:20 28SOIC 集成电路（IC） 配电开关，负载驱动器

DABiC-IV, 20-BIT SERIAL-INPUT, LATCHED SOURCE DRIVER

DABiC-IV, 32-BIT SERIAL-INPUT, LATCHED SOURCE DRIVER The A6818– devices combine a 32-bit CMOS shift register, accompanying data latches and control circuitry with bipolar sourcing outputs and pnp active pull downs. Designed primarily to drive vacuum fluorescent displays, the 60 V and -40 mA outpu

封装/外壳：28-SOIC（0.295"，7.50mm 宽） 包装：卷带（TR） 描述：IC PWR DRVR BIPOLAR 1:20 28SOIC 集成电路（IC） 配电开关，负载驱动器

DABiC-IV, 20-BIT SERIAL-INPUT, LATCHED SOURCE DRIVER

DABiC-IV, 32-BIT SERIAL-INPUT, LATCHED SOURCE DRIVER The A6818– devices combine a 32-bit CMOS shift register, accompanying data latches and control circuitry with bipolar sourcing outputs and pnp active pull downs. Designed primarily to drive vacuum fluorescent displays, the 60 V and -40 mA outpu

DABiC-IV, 20-BIT SERIAL-INPUT, LATCHED SOURCE DRIVER

DABiC-IV, 32-BIT SERIAL-INPUT, LATCHED SOURCE DRIVER The A6818– devices combine a 32-bit CMOS shift register, accompanying data latches and control circuitry with bipolar sourcing outputs and pnp active pull downs. Designed primarily to drive vacuum fluorescent displays, the 60 V and -40 mA outpu

Customer Specification

Although Alpha Wire (“Alpha”) makes every reasonable effort to ensure there accuracy at the time of publication, information and specifications described herein are subject to errors or omissions and to changes without notice, and the listing of such information and specifications does not ensur

AC Power Source/Analyzers, 375-1750 VA An integrated AC power solution

Examples Dual Power Analyzer Applications –– Complete testing of uninterruptible power sources (UPS) –– Efficiency testing of DC power supplies –– Efficiency testing of AC power sources –– Efficiency testing of transformers –– Safety testing of transformers –– Line disturbance and brownout t