DABiC-IV, 20-BIT SERIAL-INPUT, LATCHED SOURCE DRIVER

DABiC-IV, 32-BIT SERIAL-INPUT, LATCHED SOURCE DRIVER The A6818– devices combine a 32-bit CMOS shift register, accompanying data latches and control circuitry with bipolar sourcing outputs and pnp active pull downs. Designed primarily to drive vacuum fluorescent displays, the 60 V and -40 mA outpu

DABiC -IV 20位串行输入，锁存源极驱动器 (DABiC-IV, 20-BIT SERIAL-INPUT, LATCHED SOURCE DRIVER)

DABiC-IV, 20-BIT SERIAL-INPUT, LATCHED SOURCE DRIVER

DABiC-IV, 32-BIT SERIAL-INPUT, LATCHED SOURCE DRIVER The A6818– devices combine a 32-bit CMOS shift register, accompanying data latches and control circuitry with bipolar sourcing outputs and pnp active pull downs. Designed primarily to drive vacuum fluorescent displays, the 60 V and -40 mA outpu

DABiC-IV, 20-BIT SERIAL-INPUT, LATCHED SOURCE DRIVER

DABiC-IV, 32-BIT SERIAL-INPUT, LATCHED SOURCE DRIVER The A6818– devices combine a 32-bit CMOS shift register, accompanying data latches and control circuitry with bipolar sourcing outputs and pnp active pull downs. Designed primarily to drive vacuum fluorescent displays, the 60 V and -40 mA outpu

DABiC-IV 20-Bit Serial-Input Latched Source Driver

Description The A6812 device combines a 20-bit CMOS shift register, ac com pa ny ing data latches and control cir cuit ry with bipolar sourcing out puts ,and PNP active pull-downs. De signed pri mar ily to drive vacuum-flu o res cent displays, the 60 V and -40 mA output ratings also allow these d

DABiC-IV, 20-BIT SERIAL-INPUT, LATCHED SOURCE DRIVER

DABiC-IV, 32-BIT SERIAL-INPUT, LATCHED SOURCE DRIVER The A6818– devices combine a 32-bit CMOS shift register, accompanying data latches and control circuitry with bipolar sourcing outputs and pnp active pull downs. Designed primarily to drive vacuum fluorescent displays, the 60 V and -40 mA outpu

DABiC-IV, 20-BIT SERIAL-INPUT, LATCHED SOURCE DRIVER

DABiC-IV, 32-BIT SERIAL-INPUT, LATCHED SOURCE DRIVER The A6818– devices combine a 32-bit CMOS shift register, accompanying data latches and control circuitry with bipolar sourcing outputs and pnp active pull downs. Designed primarily to drive vacuum fluorescent displays, the 60 V and -40 mA outpu

DABiC-IV, 20-BIT SERIAL-INPUT, LATCHED SOURCE DRIVER

DABiC-IV, 32-BIT SERIAL-INPUT, LATCHED SOURCE DRIVER The A6818– devices combine a 32-bit CMOS shift register, accompanying data latches and control circuitry with bipolar sourcing outputs and pnp active pull downs. Designed primarily to drive vacuum fluorescent displays, the 60 V and -40 mA outpu

DABiC-IV, 20-BIT SERIAL-INPUT, LATCHED SOURCE DRIVER

DABiC-IV, 32-BIT SERIAL-INPUT, LATCHED SOURCE DRIVER The A6818– devices combine a 32-bit CMOS shift register, accompanying data latches and control circuitry with bipolar sourcing outputs and pnp active pull downs. Designed primarily to drive vacuum fluorescent displays, the 60 V and -40 mA outpu

Axial Leaded Multilayer Ceramic Capacitors for General Purpose Class 1, Class 2 and Class 3, 50 VDC, 100 VDC, 200 VDC, 500 VDC

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封装/外壳：28-LCC（J 形引线） 包装：卷带（TR） 描述：IC PWR DRVR BIPOLAR 1:20 28PLCC 集成电路（IC） 配电开关，负载驱动器

封装/外壳：28-LCC（J 形引线） 包装：卷带（TR） 描述：IC PWR DRVR BIPOLAR 1:20 28PLCC 集成电路（IC） 配电开关，负载驱动器

Customer Specification

Although Alpha Wire (“Alpha”) makes every reasonable effort to ensure there accuracy at the time of publication, information and specifications described herein are subject to errors or omissions and to changes without notice, and the listing of such information and specifications does not ensur

DABiC-IV, 20-BIT SERIAL-INPUT, LATCHED SOURCE DRIVER

DABiC-IV, 32-BIT SERIAL-INPUT, LATCHED SOURCE DRIVER The A6818– devices combine a 32-bit CMOS shift register, accompanying data latches and control circuitry with bipolar sourcing outputs and pnp active pull downs. Designed primarily to drive vacuum fluorescent displays, the 60 V and -40 mA outpu

AC Power Source/Analyzers, 375-1750 VA An integrated AC power solution

Examples Dual Power Analyzer Applications –– Complete testing of uninterruptible power sources (UPS) –– Efficiency testing of DC power supplies –– Efficiency testing of AC power sources –– Efficiency testing of transformers –– Safety testing of transformers –– Line disturbance and brownout t