Input Offset Voltage Drift . . . Typically

0.1 μV/Month, Including the First 30 Days

Wide Range of Supply Voltages Over

Specified Temperature Range:

0°C to 70°C . . . 3 V to 16 V

−40°C to 85°C . . . 4 V to 16 V

−55°C to 125°C . . . 5 V to 16 V

Single-Supply Operation

Common-Mode Input Voltage Range

Extends Below the Negative Rail (C-Suffix

and I-Suffix Types)

Low Noise . . . 68 nV/√Hz Typically at

f = 1 kHz

Output Voltage Range Includes Negative

Rail

High Input Impedance . . . 1012 Ω Typ

ESD-Protection Circuitry

Small-Outline Package Option Also

Available in Tape and Reel

Designed-In Latch-Up Immunity

description

The TLC27L1 operational amplifier combines a wide range of input offset-voltage grades with low offset-voltage

drift and high input impedance. In addition, the TLC27L1 is a low-bias version of the TLC271 programmable

amplifier. These devices use the Texas Instruments silicon-gate LinCMOS technology, which provides

offset-voltage stability far exceeding the stability available with conventional metal-gate processes.

Three offset-voltage grades are available (C-suffix and I-suffix types), ranging from the low-cost TLC27L1

(10 mV) to the TLC27L1B (2 mV) low-offset version. The extremely high input impedance and low bias currents,

in conjunction with good common-mode rejection and supply voltage rejection, make these devices a good

choice for new state-of-the-art designs as well as for upgrading existing designs.

In general, many features associated with bipolar technology are available in LinCMOS operational amplifiers,

without the power penalties of bipolar technology. General applications such as transducer interfacing, analog

calculations, amplifier blocks, active filters, and signal buffering are all easily designed with the TLC27L1. The

devices also exhibit low-voltage single-supply operation, making them ideally suited for remote and

inaccessible battery-powered applications. The common-mode input-voltage range includes the negative rail.

The device inputs and output are designed to withstand −100-mA surge currents without sustaining latch-up.

The TLC27L1 incorporates internal electrostatic-discharge (ESD) protection circuits that prevent functional

failures at voltages up to 2000 V as tested under MIL-STD-883C, Method 3015.2; however, care should be

exercised in handling these devices as exposure to ESD may result in the degradation of the device parametric

performance.