1 Features

1• Available in the Texas Instruments

NanoFree™ Package

• Supports 5-V VCC Operation

• Inputs Accept Voltages to 5.5 V

• Supports Down Translation to VCC

• Maximum tpd of 4.2 ns at 3.3 V

• Low Power Consumption, 10-μA Maximum ICC

• ±24-mA Output Drive at 3.3 V

• Ioff Supports Live Insertion, Partial-Power-Down

Mode, and Back-Drive Protection

• Latch-Up Performance Exceeds 100 mA Per

JESD 78, Class II

• ESD Protection Exceeds JESD 22

– 2000-V Human-Body Model (A114-A)

– 200-V Machine Model (A115-A)

– 1000-V Charged-Device Model (C101)

2 Applications

• Test and Measurement

• Enterprise Switching

• Telecom Infrastructure

• Motor Drives

3 Description

This single positive-edge-triggered D-type flip-flop is

designed for 1.65-V to 5.5-V VCC operation.

When data at the data (D) input meets the setup time

requirement, the data is transferred to the Q output

on the positive-going edge of the clock pulse. Clock

triggering occurs at a voltage level and is not directly

related to the rise time of the clock pulse. Following

the hold-time interval, data at the D input can be

changed without affecting the level at the output.

NanoFree™ package technology is a major

breakthrough in IC packaging concepts, using the die

as the package.

This device is fully specified for partial-power-down

applications using Ioff. The Ioff circuitry disables the

outputs, preventing damaging current backflow

through the device when it is powered down.