Members of the Texas Instruments

SCOPE Family of Testability Products

Compatible With the IEEE Standard

1149.1-1990 (JTAG) Test Access Port and

Boundary-Scan Architecture

Functionally Equivalent to ’F646 and

’ABT646 in the Normal-Function Mode

SCOPE Instruction Set

− IEEE Standard 1149.1-1990 Required

Instructions, Optional INTEST, CLAMP,

and HIGHZ

− Parallel-Signature Analysis at Inputs

With Masking Option

− Pseudorandom Pattern Generation From

Outputs

− Sample Inputs/Toggle Outputs

− Binary Count From Outputs

− Even-Parity Opcodes

Two Boundary-Scan Cells Per I/O for

Greater Flexibility

State-of-the-Art EPIC-ΙΙB BiCMOS Design

Significantly Reduces Power Dissipation

Package Options Include Plastic

Small-Outline (DW) and Shrink

Small-Outline (DL) Packages, Ceramic Chip

Carriers (FK), and Standard Ceramic DIPs

(JT)

description

The ’ABT8646 and scan-test devices with octal

bus transceivers and registers are members of the

Texas Instruments SCOPE testability

integrated-circuit family. This family of devices

supports IEEE Standard 1149.1-1990 boundary

scan to facilitate testing of complex circuit-board

assemblies. Scan access to the test circuitry is

accomplished via the 4-wire test access port

(TAP) interface.

In the normal mode, these devices are functionally equivalent to the ’F646 and ’ABT646 octal bus transceivers

and registers. The test circuitry can be activated by the TAP to take snapshot samples of the data appearing

at the device pins or to perform a self-test on the boundary-test cells. Activating the TAP in normal mode does

not affect the functional operation of the SCOPE octal bus transceivers and registers.