位置:SN54HC273VTDG2 > SN54HC273VTDG2详情

SN54HC273VTDG2中文资料

厂家型号

SN54HC273VTDG2

文件大小

167.37Kbytes

页面数量

6

功能描述

RAD-TOLERANT SPACE GRADE DIE, QUADRUPLE 2-INPUT POSITIVE-AND GATES

IC OCT D FLIP-FLOP DIE

数据手册

原厂下载下载地址一下载地址二到原厂下载

生产厂商

TI2

SN54HC273VTDG2数据手册规格书PDF详情

FEATURES

• Wide Operating Voltage Range

• Outputs Can Drive Up To 10 LSTTL Loads

• Low Power Consumption

• Typical tpd = 12 ns

• Low Input Current

• Contain Eight Flip-Flops With Single-Rail Outputs

• Direct Clear Input

• Applications Include:

– Buffer/Storage Registers

– Shift Registers

– Pattern Generators

DESCRIPTION

Information at the data (D) inputs meeting the setup time requirements is transferred to the Q outputs on the

positive-going edge of the clock (CLK) pulse. Clock triggering occurs at a particular voltage level and is not

related directly to the transition time of the positive-going pulse. When CLK is at either the high or low level, the

D input has no effect at the output.

SN54HC273VTDG2产品属性

  • 类型

    描述

  • 型号

    SN54HC273VTDG2

  • 制造商

    Texas Instruments

  • 功能描述

    IC OCT D FLIP-FLOP DIE

  • 制造商

    Texas Instruments

  • 功能描述

    25degree C Sawn Tested Die 100pct probe

更新时间:2021-9-14 10:50:00
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