1 Features

• Radiation hardness assured DAC39RFx10-SP:

– Single event upset (SEU) immune registers

– Single-event latch up (SEL): 120MeV-cm2/mg

– RLAT Total ionizing dose (TID): 300krad (Si)

• Radiation tolerant DAC39RFx10-SEP:

– Single event upset (SEU) immune registers

– Single-event latch up (SEL): 43MeV-cm2/mg

– RLAT Total ionizing dose (TID): 30krad (Si)

• 16-bit, 10.4 or 20.8GSPS, multi-Nyquist DAC Cores

• Maximum input data rate:

– 8-bit, Single channel, DES mode: 20.8GSPS

– 12-bit, Single channel, DES mode: 15.5GSPS

– 16-bit, Single channel: 10.4GSPS

– 8-bit, Dual channel, 10.4GSPS

– 12-bit, Dual channel: 7.75GSPS/ch

– 16-bit, Dual channel: 6.2GSPS/ch

• Output bandwidth (-3dB): 12GHz

• Performance at fOUT = 2.997GHz, DES2XL mode, DEM/Dither off

– Noise floor (small signal): –155dBFS/Hz

– SFDR (-0.1dBFS) : 60dBc

– IMD3 (-7dBFS each tone) : –62dBc

– Additive phase noise, 10kHz offset: -138dBc/Hz

• Four Integrated digital up-converters (DUC)

– Interpolation: 1x, 2x, 3x, 4x, 6x, 8x, 12x ... 256x

– Complex baseband DUC for I/Q output

– Complex to real up conversion for dual channel direct RF sampling

– 64-bit frequency resolution NCOs

• JESD204C Interface

– Up to 16 Lanes at up to 12.8Gbps

– Class C-S, subclass-1 Compatible

– Internal AC coupling capacitors

• SYSREF Windowing for automatic SYSREF timing calibration

• Space screening and assurance:

– Meets ASTM E595 outgassing specification

– One fabrication, assembly, and test site

– Wafer lot traceability

– Extended product life cycle

– Radiation lot acceptance test (RLAT)

– Production burn-in (DAC39RFx10-SP only)

• This device contains non-encapsulated chip-caps with tin (Sn) finish of >97% purity. See reliability report for more information

2 Applications

• Satellite communications (SATCOM)

• Wideband and highspeed data transmission

• RF synthesis for clocking or local oscillator (LO)

• Phased array antenna systems

• Synthetic aperture radar (SAR) exciter

• Spectroscopy

3 Description

The DAC39RF10-Sx and 'RFS10-Sx are a family of dual and single channel digital-to-analog converters (DAC) with 16-bit resolution. The devices can be used as non-interpolating or interpolating DACs for either direct RF sampling or complex baseband signal generation. The maximum input data rate is 20.8GSPS for a single channel or 10.4 GSPS for two channels. The devices can generate signals of up to 10, 7.5, and 5GHz signal bandwidth (8, 12, and 16-bit input resolution) at carrier frequencies exceeding 10GHz enabling direct sampling in X-band.

The high sampling rate, output frequency range, 64-bit NCO frequency resolution and any frequency hopping with phase coherence also makes the DAC39RF10-Sx and 'RFS10-Sx capable of arbitrary waveform generation (AWG) and direct digital synthesis (DDS).

A JESD204B and JESD204C compatible serial interface has 16 receiver pairs capable of up to 12.8Gbps. The interface is JESD204B and JESD204C subclass-1 compliant for deterministic latency and multi-device synchronization through the use of SYSREF.