1 Features

• Pin-Compatible Family

– DS150DF1610: 12.5 - 15G

– DS125DF1610: 9.8 to 12.5G

– DS110DF1610: 8.5 – 11.3G

• 4x4 Analog Cross Point Switch for Each Quad

• Fully-Adaptive CTLE

• Self-Tuning DFE, With Optional Continuous

Adaption

• On-Chip, AC-coupling on Receive Inputs

• Adjustable Transmit VOD

• Adjustable 3-Tap Transmit FIR Filter

• Locks to Half/Quarter/Eighth Data Rates For

Legacy Support

• On-Chip Eye Monitor (EOM), PRBS Checker,

PRBS Pattern Generator

• Supports IEEE 1149.1 and 1149.6

• Programmable Output Polarity Inversion

• Input Signal Detection, CDR Lock Detection

• Single 2.5-V ±5% Power Supply

• SMBus-Based Register Configuration

• Optional EEPROM Configuration

• 15-mm × 15-mm, 196-Pin FCBGA Package

• Operating Temp Range : –10°C to +85°C

2 Description

The DS110DF1610 is a sixteen-channel multi-rate

retimer with integrated signal conditioning. The device

includes a full adaptive Continuous Time Linear

Equalizer (CTLE), Decision Feedback Equalizer

(DFE), clock and data recovery (CDR), and a transmit

FIR filter to enhance the reach and robustness over

long, lossy, crosstalk impaired high speed serial links

to achieve BER < 1×10-15.

Each channel of the DS110DF1610 independently

locks to serial data at 8.5 to 11.3 Gbps and any

supported sub-multiple. A simple external oscillator

(±100ppm) that is synchronous or asynchronous with

the incoming data stream can be used as a reference

clock to speed up the lock process. Integrated 4x4

cross point switches allow for full non-blocking routing

or broadcasting within each quad of the

DS110DF1610.

Programmable transmit FIR filter offers control of the

pre-cursor, main tap and post-cursor for transmit

equalization. The fully adaptive receive equalization

(CTLE and DFE) enables longer distance

transmission in lossy copper interconnects and

backplanes with multiple connectors.

A non-disruptive mission mode eye-monitor feature

allows link monitoring internal to the receiver. The

built-in PRBS generator and checker compliment the

internal diagnostic features to complete standalone

BERT measurements. Built-in JTAG enables

manufacturing tests.