1 Features

• Vendor item drawing available, VID V62/23610

• Total ionizing dose (TID) characterized to

30 krad(Si)

– RLAT (radiation lot acceptance testing) to

20 krad(Si)

• Single-event effects (SEE) characterized

– Single-event latch-up (SEL), single-event

burnout (SEB), and single-event gate rupture

(SEGR) immune to linear energy transfer (LET)

of 43 MeV-cm2/mg

– Single-event transient (SET) and single-event

functional interrupt (SEFI) characterized to

effective linear energy transfer (LET) of

43 MeV-cm2/mg

• Quad-channel 160-mΩ eFuse with full diagnostics

and current-sense analog output

• Wide operating voltage 4.5 V to 32 V

• Ultra-low standby current < 500 nA

• High-accuracy current sense: ±15% when

ILOAD ≥ 25 mA

• Adjustable current limit with external resistor (RCL),

with accuracy of ±15% when ILOAD ≥ 500 mA

• Protection

– Short-to-GND protection by current limit

(internal or external)

– Thermal shutdown with latch off option and

thermal swing

– Inductive load negative voltage clamp with

optimized slew rate

– Loss-of-GND and loss-of-power protection

• Diagnostics

– Overcurrent and short-to-ground detection

– Open-load and short-to-power detection

– Global fault report for fast interrupt

• 28-pin thermally-enhanced PWP package

• Space Enhanced Plastic (SEP)

• Available in military (–55°C to 125°C) temp range

2 Applications

• Satellite electrical power systems (EPS)

• Space satellite power management and

distribution

• Radiation-tolerant power tree applications

• Enables switching power rails for controlled power

up and power down

• Solenoid driving

3 Description

The TPS7H2140-SEP device is a fully protected

quad-channel eFuse with four integrated 160-mΩ

NMOS power FETs.

Full diagnostics and high-accuracy current sense

enables intelligent control of the loads.

An external adjustable current limit improves the

reliability of whole system by limiting the inrush or

overload current.