1 Features

• Vendor item drawing available, VID

V62/25626-01XE

• Radiation - Total Ionizing Dose (TID):

– TID characterized up to 50krad(Si)

– TID performance assurance up to 30krad(Si)

– Radiation Lot Acceptance Testing (RLAT) for

every wafer lot up to 30krad(Si)

• Radiation - Single-Event Effects (SEE):

– Single Event Latch-Up (SEL) immune up to

50MeV-cm2/mg at 125°C

– Single Event Transient (SET) characterized up

to LET = 50MeV-cm2/mg

• Wide operating range of 1.2V to 5.5V

• Single-supply voltage translator:

– Up translation:

• 1.2V to 1.8V

• 1.5V to 2.5V

• 1.8V to 3.3V

• 3.3V to 5.0V

– Down translation:

• 5.0V, 3.3V, 2.5V to 1.8V

• 5.0V, 3.3V to 2.5V

• 5.0V to 3.3V

• 5.5V tolerant input pins

• Supports standard pinouts

• Up to 150Mbps with 5V or 3.3V VCC

• Latch-up performance exceeds 250mA per JESD

17

• Space enhanced plastic:

– Supports defense and aerospace applications

– Controlled baseline

– Au bondwire and NiPdAu lead finish

– Meets NASA ASTM E595 outgassing

specification

– One fabrication, assembly, and test site

– Extended product life cycle

– Product traceability

2 Applications

• Enable or disable a digital signal

• Controlling an indicator LED

• Translation between communication modules and

system controllers

3 Description

The SN54SC8T373-SEP device is an octal

transparent D-type latch with 3-State outputs.

The input is designed with a reduced threshold circuit

to support up translation when the supply voltage

is larger than the input voltage. Additionally, the 5V

tolerant input pins enable down translation when the

input voltage is larger than the supply voltage. The

output level is always referenced to the supply voltage

(VCC) and supports 1.8V, 2.5V, 3.3V, and 5V CMOS

levels.