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LMG3526R030中文资料

厂家型号

LMG3526R030

文件大小

3325.67Kbytes

页面数量

51

功能描述

LMG3526R030 650-V 30-mΩ GaN FET With Integrated Driver, Protection, and Temperature Reporting

数据手册

下载地址一下载地址二到原厂下载

生产厂商

TI

LMG3526R030数据手册规格书PDF详情

1 Features

• 650-V GaN-on-Si FET with integrated gate driver

– Integrated high precision gate bias voltage

– 200-V/ns FET hold-off

– 2-MHz switching frequency

– 20-V/ns to 150-V/ns slew rate for optimization

of switching performance and EMI mitigation

– Operates from 7.5-V to 18-V supply

• Robust protection

– Cycle-by-cycle overcurrent and latched shortcircuit

protection with < 100-ns response

– Withstands 720-V surge while hard-switching

– Self-protection from internal overtemperature

and UVLO monitoring

• Advanced power management

– Digital temperature PWM output

• Top-side cooled 12-mm × 12-mm VQFN package

separates electrical and thermal paths for lowest

power loop inductance

• Zero voltage detection feature that facilitates softswitching

converters

2 Applications

• Switch-mode power converters

• Merchant network and server PSU

• Merchant telecom rectifiers

• Solar inverters and industrial motor drives

• Uninterruptable power supplies

3 Description

The LMG3526R030 GaN FET with integrated driver

and protections is targeting switch-mode power

converters and enables designers to achieve new

levels of power density and efficiency.

The LMG3526R030 integrates a silicon driver that

enables switching speed up to 150 V/ns. TI’s

integrated precision gate bias results in higher

switching SOA compared to discrete silicon gate

drivers. This integration, combined with TI's lowinductance

package, delivers clean switching and

minimal ringing in hard-switching power supply

topologies. Adjustable gate drive strength allows

control of the slew rate from 20 V/ns to 150 V/ns,

which can be used to actively control EMI and

optimize switching performance.

Advanced features include digital temperature

reporting, fault detection and zero voltage detection.

The temperature of the GaN FET is reported through

a variable duty cycle PWM output. Faults reported

include overtemperature, overcurrent, and UVLO

monitoring. Zero-voltage detection (ZVD) feature can

provide a pulse output from ZVD pin when zerovoltage

switching is realized.

更新时间:2025-12-16 15:15:00
供应商 型号 品牌 批号 封装 库存 备注 价格
TI/德州仪器
25+
VQFN-52
32360
TI/德州仪器全新特价LMG3526R030RQSR即刻询购立享优惠#长期有货
TI/德州仪器
25+
原厂封装
10280
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TI/德州仪器
25+
原厂封装
10280
TI/德州仪器
25+
原厂封装
9999
TI/德州仪器
25+
原厂封装
11000
TI/德州仪器
25+
原厂封装
10280
TI/德州仪器
2450+
VQFN52
9850
只做原厂原装正品现货或订货假一赔十!
TI
24+
con
35960
查现货到京北通宇商城
TI德州仪器
22+
24000
原装正品现货,实单可谈,量大价优
23+
NA
6800
原装正品,力挺实单