型号 功能描述 生产厂家 企业 LOGO 操作
SN74BCT8245A

SCAN TEST DEVICES WITH OCTAL BUS TRANSCEIVERS

Members of the Texas Instruments SCOPE ™ Family of Testability Products Octal Test-Integrated Circuits Functionally Equivalent to ’F245 and BCT245 in the Normal- Function Mode Compatible With the IEEE Standard 1149.1-1990 (JTAG) Test Access Port and Boundary-Scan Architecture Test Operatio

TI

德州仪器

SN74BCT8245A

具有八路总线收发器的 IEEE 标准 1149.1 (JTAG) 边界扫描测试设备

TI

德州仪器

SN74BCT8245A

SCAN TEST DEVICES WITH OCTAL BUS TRANSCEIVERS

文件:309.38 Kbytes Page:22 Pages

TI

德州仪器

SN74BCT8245A

WITH OCTAL BUS TRANSCEIVERS

文件:1.01182 Mbytes Page:29 Pages

TI

德州仪器

SCAN TEST DEVICES WITH OCTAL BUS TRANSCEIVERS

Members of the Texas Instruments SCOPE ™ Family of Testability Products Octal Test-Integrated Circuits Functionally Equivalent to ’F245 and BCT245 in the Normal- Function Mode Compatible With the IEEE Standard 1149.1-1990 (JTAG) Test Access Port and Boundary-Scan Architecture Test Operatio

TI

德州仪器

SCAN TEST DEVICES WITH OCTAL BUS TRANSCEIVERS

Members of the Texas Instruments SCOPE ™ Family of Testability Products Octal Test-Integrated Circuits Functionally Equivalent to ’F245 and BCT245 in the Normal- Function Mode Compatible With the IEEE Standard 1149.1-1990 (JTAG) Test Access Port and Boundary-Scan Architecture Test Operatio

TI

德州仪器

SCAN TEST DEVICES WITH OCTAL BUS TRANSCEIVERS

Members of the Texas Instruments SCOPE ™ Family of Testability Products Octal Test-Integrated Circuits Functionally Equivalent to ’F245 and BCT245 in the Normal- Function Mode Compatible With the IEEE Standard 1149.1-1990 (JTAG) Test Access Port and Boundary-Scan Architecture Test Operatio

TI

德州仪器

WITH OCTAL BUS TRANSCEIVERS

文件:1.01182 Mbytes Page:29 Pages

TI

德州仪器

SCAN TEST DEVICES WITH OCTAL BUS TRANSCEIVERS

文件:658.92 Kbytes Page:29 Pages

TI

德州仪器

SCAN TEST DEVICES WITH OCTAL BUS TRANSCEIVERS

文件:309.38 Kbytes Page:22 Pages

TI

德州仪器

SCAN TEST DEVICES WITH OCTAL BUS TRANSCEIVERS

文件:658.92 Kbytes Page:29 Pages

TI

德州仪器

SCAN TEST DEVICES WITH OCTAL BUS TRANSCEIVERS

文件:309.38 Kbytes Page:22 Pages

TI

德州仪器

SCAN TEST DEVICES WITH OCTAL BUS TRANSCEIVERS

文件:658.92 Kbytes Page:29 Pages

TI

德州仪器

SCAN TEST DEVICES WITH OCTAL BUS TRANSCEIVERS

文件:309.38 Kbytes Page:22 Pages

TI

德州仪器

SCAN TEST DEVICES WITH OCTAL BUS TRANSCEIVERS

文件:658.92 Kbytes Page:29 Pages

TI

德州仪器

WITH OCTAL BUS TRANSCEIVERS

文件:1.01182 Mbytes Page:29 Pages

TI

德州仪器

封装/外壳:24-SOIC(0.295",7.50mm 宽) 包装:卷带(TR)剪切带(CT)Digi-Reel® 得捷定制卷带 描述:IC SCAN TEST DEVICE TXRX 24-SOIC 集成电路(IC) 专用逻辑器件

TI

德州仪器

SCAN TEST DEVICES WITH OCTAL BUS TRANSCEIVERS

文件:309.38 Kbytes Page:22 Pages

TI

德州仪器

SCAN TEST DEVICES WITH OCTAL BUS TRANSCEIVERS

文件:658.92 Kbytes Page:29 Pages

TI

德州仪器

SCAN TEST DEVICES WITH OCTAL BUS TRANSCEIVERS

文件:658.92 Kbytes Page:29 Pages

TI

德州仪器

SCAN TEST DEVICES WITH OCTAL BUS TRANSCEIVERS

文件:309.38 Kbytes Page:22 Pages

TI

德州仪器

SCAN TEST DEVICES WITH OCTAL BUS TRANSCEIVERS

文件:309.38 Kbytes Page:22 Pages

TI

德州仪器

SCAN TEST DEVICES WITH OCTAL BUS TRANSCEIVERS

文件:658.92 Kbytes Page:29 Pages

TI

德州仪器

封装/外壳:24-DIP(0.300",7.62mm) 包装:卷带(TR) 描述:IC SCAN TEST DEVICE TXRX 24-DIP 集成电路(IC) 专用逻辑器件

TI

德州仪器

SCAN TEST DEVICES WITH OCTAL BUS TRANSCEIVERS

文件:309.38 Kbytes Page:22 Pages

TI

德州仪器

SCAN TEST DEVICES WITH OCTAL BUS TRANSCEIVERS

文件:658.92 Kbytes Page:29 Pages

TI

德州仪器

SN74BCT8245A产品属性

  • 类型

    描述

  • 型号

    SN74BCT8245A

  • 功能描述

    特定功能逻辑 IEEE 1149.1

  • RoHS

  • 制造商

    Texas Instruments

  • 系列

    SN74ABTH18502A

  • 工作电源电压

    5 V

  • 封装/箱体

    LQFP-64

  • 封装

    Tube

更新时间:2025-11-3 23:00:00
IC供应商 芯片型号 品牌 批号 封装 库存 备注 价格
TI(德州仪器)
24+
SOP24300mil
2317
只做原装,提供一站式配单服务,代工代料。BOM配单
TI(德州仪器)
24+
SOP24300mil
2886
原装现货,免费供样,技术支持,原厂对接
TI
23+
NA
816
专做原装正品,假一罚百!
TI
23+
N/A
7560
原厂原装
TI
25+23+
SOP-24
18503
绝对原装正品全新进口深圳现货
TI
23+
SOP-24
5000
全新原装,支持实单,非诚勿扰
TI
25+
30
公司优势库存 热卖中!!
TI
23+
SOP-24
3200
正规渠道,只有原装!
TI
17+
SOP-24
6200
100%原装正品现货
TI
24+
DIP-24
65
本站现库存

SN74BCT8245A数据表相关新闻