SCAN TEST DEVICES WITH OCTAL BUS TRANSCEIVERS AND REGISTERS

文件：682.32 Kbytes Page：33 Pages

封装/外壳：28-BSSOP（0.295"，7.50mm 宽） 包装：管件 描述：IC SCAN TEST DEVICE 28-SSOP 集成电路（IC） 专用逻辑器件

SCAN TEST DEVICES WITH OCTAL BUS TRANSCEIVERS AND REGISTERS

Members of the Texas Instruments SCOPE E Family of Testability Products Compatible With the IEEE Standard 1149.1-1990 (JTAG) Test Access Port and Boundary-Scan Architecture Functionally Equivalent to ’F652 and ABT652 in the Normal-Function Mode SCOPE E Instruction Set – IEEE Standard 1149.

SCAN TEST DEVICES WITH OCTAL BUS TRANSCEIVERS AND REGISTERS

文件：682.32 Kbytes Page：33 Pages

SCAN TEST DEVICES WITH OCTAL BUS TRANSCEIVERS AND REGISTERS

文件：520.799 Kbytes Page：31 Pages

SCAN TEST DEVICES WITH OCTAL BUS TRANSCEIVERS AND REGISTERS

文件：366.98 Kbytes Page：25 Pages

SCAN TEST DEVICES WITH OCTAL BUS TRANSCEIVERS AND REGISTERS

文件：682.32 Kbytes Page：33 Pages

封装/外壳：28-BSSOP（0.295"，7.50mm 宽） 包装：管件 描述：IC SCAN TEST DEVICE 28-SSOP 集成电路（IC） 专用逻辑器件

SCAN TEST DEVICES WITH OCTAL BUS TRANSCEIVERS AND REGISTERS

文件：366.98 Kbytes Page：25 Pages