封装/外壳：40-WFQFN 裸露焊盘 包装：管件 描述：IC BATT CHG LI-ION 1CELL 40WQFN 集成电路（IC） 电池充电器

IC PMIC ROCKCHIP TABLET 40WQFN

THRU HOLE MOUNT TEST POINTS - COLOR KEYED

• Color keyed for visibility and quick identification • Economical choice for PC test point terminations • Snap-fit mounting provides positive retention for wave soldering • Wire form loop for safe, non-slip testing • Space saving, ultra low and low profile designs • High profile design for d

Dual 3 MHz, 800 mA Buck Regulators with Two 300 mA LDOs

GENERAL DESCRIPTION The ADP5037 combines two high performance buck regulators and two low dropout (LDO) regulators in a small, 24-lead 4 mm × 4 mm LFCSP to meet demanding performance and board space requirements. The high switching frequency of the buck regulators enables tiny multilayer externa

SMALL ALLIGATOR CLIP

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SMT TEST POINTS

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2.5V LVDS Output Oscillator ICs

文件：113.1 Kbytes Page：11 Pages