SN54SC8T595-SEP Radiation Tolerant 8-Bit Shift Registers With 3-State Output And Logic Level Shifter

1 Features • VID TBD • Radiation Tolerant: – Single Event Latch-Up (SEL) immune up to 43 MeV-cm2/mg at 125°C – Total Ionizing Does (TID) Radiation Lot Acceptance Testing (RLAT) for every wafer lot up to 30 krad(Si) – Single Event Transient (SET) characterized up to LET = 43 MeV-cm2/mg •

SN54SC8T595-SEP Radiation Tolerant 8-Bit Shift Registers With 3-State Output And Logic Level Shifter

1 Features • Vendor item drawing available, VID V62/25621-01XE • Radiation - Total Ionizing Dose (TID): – TID characterized up to 50krad(Si) – TID performance assurance up to 30krad(Si) – Radiation Lot Acceptance Testing (RLAT) for every wafer lot up to 30krad(Si) • Radiation - Single-Even

SN54SC8T595-SEP Radiation Tolerant 8-Bit Shift Registers With 3-State Output And Logic Level Shifter

1 Features • Vendor item drawing available, VID V62/25621-01XE • Radiation - Total Ionizing Dose (TID): – TID characterized up to 50krad(Si) – TID performance assurance up to 30krad(Si) – Radiation Lot Acceptance Testing (RLAT) for every wafer lot up to 30krad(Si) • Radiation - Single-Even

SN54SC8T595-SEP Radiation Tolerant 8-Bit Shift Registers With 3-State Output And Logic Level Shifter

1 Features • Vendor item drawing available, VID V62/25621-01XE • Radiation - Total Ionizing Dose (TID): – TID characterized up to 50krad(Si) – TID performance assurance up to 30krad(Si) – Radiation Lot Acceptance Testing (RLAT) for every wafer lot up to 30krad(Si) • Radiation - Single-Even

SN54SC8T595-SEP Radiation Tolerant 8-Bit Shift Registers With 3-State Output And Logic Level Shifter

1 Features • VID TBD • Radiation Tolerant: – Single Event Latch-Up (SEL) immune up to 43 MeV-cm2/mg at 125°C – Total Ionizing Does (TID) Radiation Lot Acceptance Testing (RLAT) for every wafer lot up to 30 krad(Si) – Single Event Transient (SET) characterized up to LET = 43 MeV-cm2/mg •