LGA1150 Intel® Core™i7/i5/i3/Pentium® SHB DDR3/SATA 3.0/USB3.0/Dual GbE/ 3 Displays

Features ƒ Supports Intel® Core™ i7/i5/i3 LGA1150 processors with Q87 ƒ Dual Channel (Non-ECC) DDR3 1333/1600 up to 16 GB ƒ Supports PCIE 3.0, USB 3.0, SATA3.0, SW Raid 0, 1, 5, 10 ƒ Supports CRT and 2 x DP/DVI-D (optional) display ƒ Supports out-of-band remote management with AMT9.0 ƒ Suppo

LGA1150 Intel® Core™i7/i5/i3/Pentium® SHB DDR3/SATA 3.0/USB3.0/Dual GbE/ 3 Displays

Features ƒ Supports Intel® Core™ i7/i5/i3 LGA1150 processors with Q87 ƒ Dual Channel (Non-ECC) DDR3 1333/1600 up to 16 GB ƒ Supports PCIE 3.0, USB 3.0, SATA3.0, SW Raid 0, 1, 5, 10 ƒ Supports CRT and 2 x DP/DVI-D (optional) display ƒ Supports out-of-band remote management with AMT9.0 ƒ Suppo

LGA1150 Intel짰 Core?줶7/i5/i3/Pentium짰 SHB DDR3/SATA 3.0/USB3.0/Dual GbE/3 Displays

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EN60945 Compliant 4U System for Maritime Applications

文件：747.32 Kbytes Page：2 Pages

包装：散装 描述：LGA1155 4TH GEN GEN CORE I7/ I5/ 嵌入式计算机 单板计算机（SBC），模块化计算机（COM）

EN60945 Compliant 4U System for Maritime Applications

THRU HOLE MOUNT TEST POINTS - COLOR KEYED

• Color keyed for visibility and quick identification • Economical choice for PC test point terminations • Snap-fit mounting provides positive retention for wave soldering • Wire form loop for safe, non-slip testing • Space saving, ultra low and low profile designs • High profile design for d

(THM) THRU HOLE MOUNT TEST POINTS - COLOR KEYED

• Color keyed for visibility and quick identification • Economical choice for PC test point terminations • Snap-fit mounting provides positive retention for wave soldering • Wire form loop for safe, non-slip testing • Space saving, ultra low and low profile designs • High profile design for d

(THM) THRU HOLE MOUNT TEST POINTS - COLOR KEYED

• Color keyed for visibility and quick identification • Economical choice for PC test point terminations • Snap-fit mounting provides positive retention for wave soldering • Wire form loop for safe, non-slip testing • Space saving, ultra low and low profile designs • High profile design for d

THM TEST POINTS

(THM)THRU HOLE MOUNT TEST POINTS-COLOR KEYED •Color keyed for visibility and quick identification •Economical choice for PC test point terminations •Snap-fit mounting provides positive retention for wave soldering •Wire form loop for safe, non-sliptesting •Space saving, ultra low

SAW filter LTE

文件：94.25 Kbytes Page：8 Pages