1、SM4391NSKPC product basic information
2、Reliability test item
3、Reliability test purpose
4、Reliability test result
5、Conclusion
6、Test data
1. Product basic information
Product Name：N-Channel Enhancement Mode MOSFET
Part No：SM4391NSKPC
Package Type ：DFN5X6-8
2. Reliability test item
■ Precondition for SMD
■ Power cycling test (HPCT)
■ Temperature cycling test (TCT)
■ Pressure cooking test (PCT)
■ Temperature Humidity Test(THT)
■ Solder-ability
■ High temperature storage test (HTST)
■ High Temperature Gate Bias (HTGB)
■ High Temperature Reverse Bias (HTRB)
■ Electrostatic discharge test (ESD)
3. Reliability test purpose
■ New product evaluation
□ New process / material evaluation
□ Reliability monitor test
□ Other
4. Test result
No. Test Item Product Name /
Package Type Duration S.S Failed
# Conclusion
1 HPCT SM4391NSKPC 10000 cycles 45 0 PASS
2 TCT DFN5X6-8 500 cycles 77 0 PASS
3 PCT DFN5X6-8 168 hrs 77 0 PASS
4 THT DFN5X6-8 500 hrs 80 0 PASS
5 Solder-ability DFN5X6-8 5±0.5 sec 5 0 PASS
6 HTST DFN5X6-8 500 hrs 77 0 PASS
7 HTGB SM4391NSKPC 1000 hrs 45 0 PASS
8 HTRB SM4391NSKPC 1000 hrs 45 0 PASS
9 ESD SM4391NSKPC 0.5 sec 12 0 PASS
6-4 Pressure cooking test (PCT)
a. Test equipment: HIRAYAMA PC-242III
b. Standard: JESD22-A102-C
c. Test condition: 121 ， 1 ℃ 00%RH， 2 ATM， 168hrs
d. Test result: All electrical test result after 0，168 hours were pass the spec.
6-5 Temp/Humidity Storage Test(THT)
a. Test equipment: KSON THS-G
b. Standard:JESD22-A101
c. Test condition:85±2℃/ 85±3%_RH， 500 hours
d. Test result: All electrical test result after 0， 168， 500 hours were pass the spec.
6-6 Solder-ability
a. Test equipment:WJ40RB
b. Standard: JESD22-B102D
c. Test condition:
C.1 Steam Ageing:93±3℃/ 6hrs±15min
C.2 Sn :Ag:Cu=96.5:3.0:0.5 / 245±5℃ / 5±0.5s
d. Test result: All Soldering area of up to 95%_were pass the spec.
6-7 High Temperature storage test (HTST)
a. Test equipment: TABAI PH-201
b. Standard: Per JESD22-A103C
c. Test condition: 150℃
d. Test result:
All electrical test result after 0， 168， 500 hours were pass. the spec.
6-8 High Temperature Gate Bias (HTGB)
a. Test equipment: YU-LONG DN-C Oven
b. Standard: JESD22-A108C
c. Test condition: Gate Bias= 20 V， 150℃， 1000hrs
d. Data summary:
