QUAD 2-INPUT NAND SCHMIDT TRIGGERS

Description The HCC4000B series is composed of close to 80 monolithic types built with Metal Oxide Complementary technology. It provides Designers with high voltage noise tolerant complete Logic series. It radiation hardness and immunity to Heavy Ions make this series to be usable in the

Rad-hard, high voltage, CMOS logic series

Features • ESCC qualified • 18 V Absolute maximum ratings • 3 V to 15 V operating voltage • Hermetic packages • Rad-hard 100 krad (Si) TID • SEL immune up to 119 MeV.cm²/mg • SEU immune up to 119 MeV.cm²/mg • -55 °C to +125 °C temperature range • ESCC specification available on ESCC websi

抗辐照四路2输入与非门施密特触发器

RadHardened high voltage complementary MOS logic series

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Rad-hard, high voltage, CMOS logic series

Features • ESCC qualified • 18 V Absolute maximum ratings • 3 V to 15 V operating voltage • Hermetic packages • Rad-hard 100 krad (Si) TID • SEL immune up to 119 MeV.cm²/mg • SEU immune up to 119 MeV.cm²/mg • -55 °C to +125 °C temperature range • ESCC specification available on ESCC websi

Rad-hard, high voltage, CMOS logic series

Features • ESCC qualified • 18 V Absolute maximum ratings • 3 V to 15 V operating voltage • Hermetic packages • Rad-hard 100 krad (Si) TID • SEL immune up to 119 MeV.cm²/mg • SEU immune up to 119 MeV.cm²/mg • -55 °C to +125 °C temperature range • ESCC specification available on ESCC websi

QUAD 2-INPUT NAND SCHMIDT TRIGGERS

Description The HCC4000B series is composed of close to 80 monolithic types built with Metal Oxide Complementary technology. It provides Designers with high voltage noise tolerant complete Logic series. It radiation hardness and immunity to Heavy Ions make this series to be usable in the

Rad-hard, high voltage, CMOS logic series

Features • ESCC qualified • 18 V Absolute maximum ratings • 3 V to 15 V operating voltage • Hermetic packages • Rad-hard 100 krad (Si) TID • SEL immune up to 119 MeV.cm²/mg • SEU immune up to 119 MeV.cm²/mg • -55 °C to +125 °C temperature range • ESCC specification available on ESCC websi

Rad-hard, high voltage, CMOS logic series

Features • ESCC qualified • 18 V Absolute maximum ratings • 3 V to 15 V operating voltage • Hermetic packages • Rad-hard 100 krad (Si) TID • SEL immune up to 119 MeV.cm²/mg • SEU immune up to 119 MeV.cm²/mg • -55 °C to +125 °C temperature range • ESCC specification available on ESCC websi

Rad-hard, high voltage, CMOS logic series

Features • ESCC qualified • 18 V Absolute maximum ratings • 3 V to 15 V operating voltage • Hermetic packages • Rad-hard 100 krad (Si) TID • SEL immune up to 119 MeV.cm²/mg • SEU immune up to 119 MeV.cm²/mg • -55 °C to +125 °C temperature range • ESCC specification available on ESCC websi

Rad-hard high voltage CMOS logic series

文件：303.47 Kbytes Page：24 Pages

Rad-hard high voltage CMOS logic series

文件：303.47 Kbytes Page：24 Pages

Appliance Outlet F-Horizontal, Snap-in Mounting, Front Side, Solder or Quick-connect Terminal

Description - Panel Mount: Snap-in version, from front side - Connector, Pin temperature 70 °C, protection class I or II - Solder terminals or quick connect terminals

Quadruple 2-input NAND Schmitt trigger

DESCRIPTION The HEF4093B consists of four Schmitt-trigger circuits. Each circuit functions as a two-input NAND gate with Schmitt-trigger action on both inputs. The gate switches at different points for positive and negative-going signals. The difference between the positive voltage (VP) and the n

Quad 2-input NAND Schmitt trigger

Description BU4001B series ICs are 2-input positive logic NOR gates, each with four built-in circuits. A buffer achieved by an inverter added at the gate output improves the input / output propagation characteristics and minimizes variation in the propagation time caused by an increase in the loa

Quad 2-input NAND Schmitt trigger

Description BU4001B series ICs are 2-input positive logic NOR gates, each with four built-in circuits. A buffer achieved by an inverter added at the gate output improves the input / output propagation characteristics and minimizes variation in the propagation time caused by an increase in the loa

High Voltage CMOS Logic ICs >Gate>

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