| 型号 | 功能描述 | 生产厂家 企业 | LOGO | 操作 |
|---|---|---|---|---|
丝印代码：BCT8374A；SCAN TEST DEVICES WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS Members of the Texas Instruments SCOPE Family of Testability Products Octal Test-Integrated Circuits Functionally Equivalent to ’F374 and ’BCT374 in the Normal-Function Mode Compatible With the IEEE Standard 1149.1-1990 (JTAG) Test Access Port and Boundary-Scan Architecture Test Operatio | TI 德州仪器 |   | ||
丝印代码：BCT8374A；SCAN TEST DEVICES WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS Members of the Texas Instruments SCOPE Family of Testability Products Octal Test-Integrated Circuits Functionally Equivalent to ’F374 and ’BCT374 in the Normal-Function Mode Compatible With the IEEE Standard 1149.1-1990 (JTAG) Test Access Port and Boundary-Scan Architecture Test Operatio | TI 德州仪器 | | ||
Wire-Thread-Inserts 文件：102.37 Kbytes Page：3 Pages | V-COIL | | ||
50V 500mA 1ch Source Driver for Automotive 文件：1.22369 Mbytes Page：29 Pages | ROHM 罗姆 | | ||
50V 500mA 1ch Source Driver for Automotive 文件：1.22369 Mbytes Page：29 Pages | ROHM 罗姆 | | ||
50V 500mA 1ch Source Driver for Automotive 文件：1.22369 Mbytes Page：29 Pages | ROHM 罗姆 | | ||
1ch Source Driver for Automotive 文件：2.37012 Mbytes Page：33 Pages | ROHM 罗姆 | |
| IC供应商 | 芯片型号 | 品牌 | 批号 | 封装 | 库存 | 备注 | 价格 |
|---|---|---|---|---|---|---|---|
TI(德州仪器) |
25+ |
SOP24300mil |
1493 |
原装现货,免费供样,技术支持,原厂对接 |
|||
TI |
25+ |
24-SOIC |
18746 |
样件支持,可原厂排单订货! |
|||
TI |
23+ |
N/A |
7560 |
原厂原装 |
|||
TI |
20+ |
24SOIC |
53650 |
TI原装主营-可开原型号增税票 |
|||
SN74BCT8374ADWR |
25+ |
1823 |
1823 |
||||
TI |
22+ |
24SOIC |
9000 |
原厂渠道,现货配单 |
|||
TI/德州仪器 |
22+ |
SOIC-24 |
20000 |
公司只有原装 品质保障 |
|||
Texas Instruments |
24+25+ |
16500 |
全新原厂原装现货!受权代理!可送样可提供技术支持! |
||||
Texas Instruments |
25+ |
24-SOIC(0.295 7.50mm 宽) |
9350 |
独立分销商 公司只做原装 诚心经营 免费试样正品保证 |
|||
24+ |
3000 |
自己现货 |
BCT8374A规格书下载地址
BCT8374A参数引脚图相关
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- BCT373
- BCT245
- BCT2245
- BCT05CV
- BCT013
- BCT-003
- BCT-002
- BCT-001
- BCS7600
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DdatasheetPDF页码索引
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